Analytical Instrumentation Facility

Works Published in 2008

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2008 journal article

Quantification in dynamic SIMS: Current status and future needs

APPLIED SURFACE SCIENCE, 255(4), 1364–1367.

By: F. Stevie n & D. Griffis n

author keywords: Quantification; Ion implantation; Complementary methods; Focused ion beam (FIB)
Source: Web Of Science
Added: August 6, 2018

2008 journal article

Sublimation growth of an in-situ-deposited layer in SiC chemical vapor deposition on 4H-SiC(1 1 (2)over-bar 0)


By: S. Bishop n, C. Reynolds n, Z. Liliental-Weber*, Y. Uprety*, C. Ebert*, F. Stevie n, J. Park n, R. Davis*

author keywords: Characterization; Chemical vapor deposition processes; Hot-wall epitaxy; Silicon carbide; Semiconducting materials
UN Sustainable Development Goal Categories
Source: Web Of Science
Added: August 6, 2018

2008 journal article

Model study of electron beam charge compensation for positive secondary ion mass spectrometry using a positive primary ion beam

Applied Surface Science, 254(9), 2708–2711.

Source: NC State University Libraries
Added: August 6, 2018

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