Analytical Instrumentation Facility

College of Engineering

Works Published in 2008

copy embed code
Copy Embed Code Experiment

You can embed this resource into your own website. To do so, either use the code generated by us, or use the link and tweak the rest to your preferences. Copy the respective code or link below.

Displaying all 3 works

Sorted by most recent date added to the index first, which may not be the same as publication date order.

2023 2022 2021 2020 2019 2018 2017

2008 journal article

Quantification in dynamic SIMS: Current status and future needs

APPLIED SURFACE SCIENCE, 255(4), 1364–1367.

By: F. Stevie n & D. Griffis n

author keywords: Quantification; Ion implantation; Complementary methods; Focused ion beam (FIB)
Source: Web Of Science
Added: August 6, 2018

2008 journal article

Sublimation growth of an in-situ-deposited layer in SiC chemical vapor deposition on 4H-SiC(1 1 (2)over-bar 0)

JOURNAL OF CRYSTAL GROWTH, 311(1), 72–78.

By: S. Bishop n, C. Reynolds n, Z. Liliental-Weber*, Y. Uprety*, C. Ebert*, F. Stevie n, J. Park n, R. Davis*

author keywords: Characterization; Chemical vapor deposition processes; Hot-wall epitaxy; Silicon carbide; Semiconducting materials
Source: Web Of Science
Added: August 6, 2018

2008 journal article

Model study of electron beam charge compensation for positive secondary ion mass spectrometry using a positive primary ion beam

Applied Surface Science, 254(9), 2708–2711.

By: Z. Zhu*, F. Stevie* & D. Griffis*

Source: NC State University Libraries
Added: August 6, 2018