Analytical Instrumentation Facility

College of Engineering

Works Published in 2010

copy embed code
Copy Embed Code Experiment

You can embed this resource into your own website. To do so, either use the code generated by us, or use the link and tweak the rest to your preferences. Copy the respective code or link below.

Displaying all 4 works

Sorted by most recent date added to the index first, which may not be the same as publication date order.

2010 journal article

Secondary ion mass spectrometry characterization of anomalous behavior for low dose ion implanted phosphorus in silicon

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 28(3), 511–516.

By: C. Penley n, F. Stevie n, D. Griffis n, S. Siebel*, L. Kulig* & J. Lee*

author keywords: amorphisation; annealing; doping profiles; elemental semiconductors; ion implantation; phosphorus; secondary ion mass spectra; silicon
Source: Web Of Science
Added: August 6, 2018

2010 journal article

Diamond tool wear measurement by electron-beam-induced deposition

PRECISION ENGINEERING-JOURNAL OF THE INTERNATIONAL SOCIETIES FOR PRECISION ENGINEERING AND NANOTECHNOLOGY, 34(4), 718–721.

By: M. Shi n, B. Lane n, C. Mooney n, T. Dow n & R. Scattergood n

author keywords: Diamond turning; Diamond tool wear; EBID; Edge radius; Wear land
Source: Web Of Science
Added: August 6, 2018

2010 journal article

Focused Ion Beam Characterization of Bicomponent Polymer Fibers

MICROSCOPY AND MICROANALYSIS, 16(3), 282–290.

author keywords: bicomponent polymer fiber; characterization; focused ion beam; differential sputtering; ion-induced secondary electron imaging; biaxial cross section
Source: Web Of Science
Added: August 6, 2018

2010 journal article

High field Q slope and the baking effect: Review of recent experimental results and new data on Nb heat treatments

PHYSICAL REVIEW SPECIAL TOPICS-ACCELERATORS AND BEAMS, 13(2).

By: G. Ciovati*, G. Myneni*, F. Stevie n, P. Maheshwari n & D. Griffis n

Source: Web Of Science
Added: August 6, 2018