Electrical and Computer Engineering

Works Published in 1998

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Displaying works 41 - 60 of 171 in total

Sorted by most recent date added to the index first, which may not be the same as publication date order.

1998 journal article

Differentiation Between Electric Breakdowns and Dielectric Breakdown in Thin Silicon Oxides

Journal of The Electrochemical Society, 145(3), 1033.

By: J. Jackson*, T. Robinson*, Ö. Oralkan*, D. Dumin* & G. Brown*

co-author countries: United States of America 🇺🇸
Sources: Crossref, ORCID
Added: April 15, 2019

1998 conference paper

Tuned amplifiers fabricated in a 0.1-um CMOS technology on bulk, SOI, and SOS substrates

Government Microcircuit Applications Conference Digital Papers, 175–178.

By: K. O, K. Kim, B. Floyd, Y. Ho, C. Hung, C. Wann, Y. Taur, I. Lagnado

Source: NC State University Libraries
Added: April 11, 2019

1998 chapter

M-STAR: A Device for Continuously Monitoring the Physiological and Biological Properties of Tumors

In Connectivity EXPO’98 Abstract Book (p. 45). Wake Forest University.

By: K. Wheeler, H. Nagle & C. Scarantino

Source: NC State University Libraries
Added: March 24, 2019

1998 conference paper

Applications of Electronic Nose in Clinical Analysis

Proceedings of The Pittsburgh Conference on Analytical Chemistry and Applied Spectroscopy. Presented at the Pittcon’98.

By: S. Schiffman & H. Nagle

Event: Pittcon’98

Source: NC State University Libraries
Added: March 24, 2019

1998 book

IEEE Electronic Services Workshop Web Proceedings

H Nagle

Ed(s): H. Nagle

Source: NC State University Libraries
Added: March 20, 2019

1998 journal article

4- and 13-GHz tuned amplifiers implemented in a 0.1-μm CMOS technology on SOI, SOS, and bulk substrates

IEEE Journal of Solid-State Circuits, 33(12), 2066–2073.

By: Y. Ho*, K. Kim*, B. Floyd*, C. Wann*, Y. Taur*, I. Lagnado*, K. O

co-author countries: United States of America 🇺🇸

Contributors: Y. Ho*, K. Kim*, B. Floyd*, C. Wann*, Y. Taur*, I. Lagnado*, K. Ok.K.

author keywords: bulk; cascode amplifier; CMOS; low-noise amplifier; tuned amplifier; SOI; SOS
Sources: Crossref, ORCID
Added: March 18, 2019

1998 journal article

The Search for Cathode and Anode Traps in High-Voltage Stressed Silicon Oxides

Journal of The Electrochemical Society, 145(4), 1292.

By: L. Chen*

co-author countries: Italy 🇮🇹 United States of America 🇺🇸
Sources: Crossref, ORCID
Added: March 18, 2019

1998 article

Evaluation of Communication Mechanisms in Invalidate-based Shared Memory Multiprocessors

Parallel Computer Routing and Communication, Vol. 1417, pp. 159–170.

By: G. Byrd* & M. Flynn*

co-author countries: United States of America 🇺🇸

Contributors: G. Byrd* & M. Flynn*

Source: ORCID
Added: February 23, 2019

1998 journal article

Ferroelectrics as a versatile solid state platform for integrated optics

Integrated Ferroelectrics, 22(1-4), 465–471.

By: V. Gopalan*, T. Mitchell*, Q. Jia*, J. Robinson*, M. Kawas*, T. Schlesinger*, D. Stancil*

co-author countries: United States of America 🇺🇸

Contributors: V. Gopalan*, T. Mitchell*, Q. Jia*, J. Robinson*, M. Kawas*, T. Schlesinger*, D. Stancil*

Source: ORCID
Added: February 11, 2019

1998 journal article

Auto-oscillation thresholds at the main resonance in ferrimagnetic films

Physical Review B - Condensed Matter and Materials Physics, 57(18), 11483–11491. http://www.scopus.com/inward/record.url?eid=2-s2.0-0542369957&partnerID=MN8TOARS

By: A. Prabhakar & D. Stancil

Contributors: A. Prabhakar & D. Stancil

Source: ORCID
Added: February 11, 2019

1998 journal article

A fast algorithm for detecting die extrusion defects in IC packages

MACHINE VISION AND APPLICATIONS, 11(1), 37–41.

By: H. Zhou*, A. Kassim & S. Ranganath

co-author countries: Singapore 🇸🇬
author keywords: IC package inspection; die extrusion defects; linear feature extraction; feature enhancement
Sources: Web Of Science, ORCID
Added: August 6, 2018

1998 patent

Field controlled current modulators based on tunable barrier strengths

Washington, DC: U.S. Patent and Trademark Office.

Source: NC State University Libraries
Added: August 6, 2018

1998 patent

Semiconductor device

Washington, DC: U.S. Patent and Trademark Office.

By: S. Ekkaneth-Madathil, Q. Huang, G. Amaratunga & N. Kumagai

Source: NC State University Libraries
Added: August 6, 2018

1998 book

Visual communications and image processing '98: 28-30 January 1998, San Jose, California

Bellingham, Wash., USA: SPIE.

Sarah Rajala

Source: NC State University Libraries
Added: August 6, 2018

1998 journal article

Effect of collector structure on the FBSOA of the dielectrically-isolated LIGBT

IEEE TRANSACTIONS ON ELECTRON DEVICES, 45(5), 1155–1161.

By: V. Nagapudi n, R. Sunkavalli n & B. Baliga n

co-author countries: United States of America 🇺🇸
author keywords: dielectric isolation; lateral IGBT; power IC's
Source: Web Of Science
Added: August 6, 2018

1998 journal article

Editor's preface

IEEE Transactions on Microwave Theory and Techniques, 46(3), 205.

By: J. Mink

Source: NC State University Libraries
Added: August 6, 2018

1998 journal article

Call admission control schemes and ATM network topological design

EUROPEAN JOURNAL OF OPERATIONAL RESEARCH, 111(2), 393–404.

By: S. Lo n, B. Makrucki n, G. Bilbro n & S. Elmaghraby n

co-author countries: United States of America 🇺🇸
author keywords: ATM network topological design; call admission control; integer programming; mixed integer programming
Source: Web Of Science
Added: August 6, 2018

1998 journal article

Parasitic resistance considerations of using elevated source/drain technology for deep submicron metal oxide semiconductor field effect transistors

JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 145(6), 2131–2137.

By: J. Sun n, R. Bartholomew n, K. Bellur n, A. Srivastava n, C. Osburn n, N. Masnari n, R. Westhoff n

co-author countries: United States of America 🇺🇸
Source: Web Of Science
Added: August 6, 2018

1998 article

Evaluation of 2.0 nm grown and deposited dielectrics in 0.1 mu m PMOSFETs

RAPID THERMAL AND INTEGRATED PROCESSING VII, Vol. 525, pp. 163–170.

co-author countries: United States of America 🇺🇸
Source: Web Of Science
Added: August 6, 2018

1998 conference paper

Evaluation and comparison of 3.0 nm gate-stack dielectrics for tenth-micron technology NMOSFETs

Rapid thermal and integrated processing VII: Symposium held April 13-15, 1998, San Francisco, California, U.S.A. (Materials Research Society symposium proceedings ; v.525), 157–162. Warrendale, Pennsylvania: Materials Research Society.

Nino A. Masnari; Kam Fu Yee

Source: NC State University Libraries
Added: August 6, 2018

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