Electrical & Computer Engineering

Decision Support Applications for Electric Power Distribution Facility Design and Management

Second Symposium on Expert Systems Application to Power Systems Conference Proceedings, 303–309. Seattle, Washington.

Neural Network Applications for Data Interpretation and Diagnostic Analysis

Proceedings of the 1989 American Power Conference. Presented at the 1989 American Power Conference, Chicago, IL.

Submicron scaling of AlGaAs/GaAs self-aligned thin emitter heterojunction bipolar transistors (SATE-HBT) with current gain independent of emitter area

Electronics Letters, 25(17), 1175–1177.

Quantum Functional Devices: Resonant-Tunneling Transistors, Circuits with Reduced Complexity, and Multiple-Valued Logic

IEEE Transactions on Electron Devices, 36(10), 2065–2082.

Microwave Multiple-State Resonant-Tunneling Bipolar Transistors

IEEE Electron Device Letters, 10(5), 219–221.

Implant-induced high-resistivity regions in InP and InGaAs

Journal of Applied Physics, 66(2), 656–662.

AIGaAs/GaAs Heterojunction Bipolar Transistor Decision Circuit

Electronics Letters, 25(2), 118–119.

Diffusion and drift of Si dopants in δ-doped n-type Al xGa1-xAs

Applied Physics Letters, 54(25), 2592–2594.

Applications of knowledge-based programming to power engineering problems

IEEE Transactions on Power Systems, 4(1), 345–352.

Modeling interconnect yield in reconfigurable circuits

Electronics Letters, 25(18), 1225–1226.

Comparison of Reconfiguration Schemes for Defect Tolerant Mesh Arrays

Proceedings of the 1989 Workshop on Defect Tolerance. Presented at the Tampa, Florida.

Testing Features for Medical Electronics

Proceedings of the 1989 IEEE Region 10 Colloquium. Presented at the The 1989 IEEE Region 10 Colloquium.

Multicast Communication in Multiprocessor Systems

18th International Conference on Parallel Processing, I, 196–200.

Fundamental interconnection issues

In Electronic Materials Handbook: Vol. 1: Packaging (pp. 1–11). ASM International.

Transient simulation of AlGaAs/GaAs/AlGaAs and AlGaAs/InGaAs/AlGaAs hot-electron transistors

IEEE Transactions on Electron Devices, 36(1), 118–123.

Monte Carlo simulation of Si and GaAs avalanche electron emitting diodes

Journal of Applied Physics, 65(3), 1384–1386.

Microprocessor testability

IEEE Transactions on Industrial Electronics, 36(2), 151–163.

Statistical fault sampling

IEEE Transactions on Industrial Electronics, 36(2), 141–150.

Design for testability and built-in self test: a review

IEEE Transactions on Industrial Electronics, 36(2), 129–140.

Fundamentals of testability-a tutorial

IEEE Transactions on Industrial Electronics, 36(2), 117–128.