2Deep: Enhancing Side-Channel Attacks on Lattice-Based Key-Exchange via 2-D Deep Learning
IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS, 40(6), 1217–1229.
author keywords: Resistance; Performance evaluation; Deep learning; Protocols; Power measurement; Side-channel attacks; NIST; Cross-device; data-augmentation; deep learning (DL); lattice-based key-exchange protocols; power side channels
Source: Web Of Science
Added: June 10, 2021
