Works (9)
2000 article
Ab initiophonon dispersions of wurtzite AlN, GaN, and InN
Bungaro, C., Rapcewicz, K., & Bernholc, J. (2000, March 1). Physical Review. B, Condensed Matter, Vol. 61, pp. 6720–6725.
2000 article
Large-Scale Applications of Real-Space Multigrid Methods to Surfaces, Nanotubes, and Quantum Transport
Bernholc, J., Briggs, E. L., Bungaro, C., Nardelli, M. B., Fattebert, J.-L., Rapcewicz, K., … Zhao, Q. (2000, January 1). Physica Status Solidi (b), Vol. 217, pp. 685–701.
2000 article
Surface segregation and interface stability of AlN/GaN, GaN/InN, and AlN/InN {0001} epitaxial systems
Bogusławski, P., Rapcewicz, K., & Bernholc, J. J. (2000, April 15). Physical Review. B, Condensed Matter, Vol. 61, pp. 10820–10826.
1999 article
Surface sensitivity of impurity incorporation: Mg at GaN (0001) surfaces
Bungaro, C., Rapcewicz, K., & Bernholc, J. (1999, April 15). Physical Review. B, Condensed Matter, Vol. 59, pp. 9771–9774.
1998 article
Consistent methodology for calculating surface and interface energies
Rapcewicz, K., Chen, B., Yakobson, B., & Bernholc, J. (1998, March 15). Physical Review. B, Condensed Matter, Vol. 57, pp. 7281–7291.
1997 article
Polarization field effects on the electron-hole recombination dynamics in In0.2Ga0.8N/In1−xGaxN multiple quantum wells
Nardelli, M. B., Rapcewicz, K., & Bernholc, J. (1997, November 24). Applied Physics Letters, Vol. 71, pp. 3135–3137.
1997 article
Real-space multigrid methods for large-scale electronic structure problems
Bernholc, J., Briggs, E. L., Sullivan, D. J., Brabec, C. J., Nardelli, M. B., Rapcewicz, K., … Wensell, M. (1997, January 1). International Journal of Quantum Chemistry, Vol. 65, pp. 531–543.
1997 article
Strain effects on the interface properties of nitride semiconductors
Nardelli, M. B., Rapcewicz, K., & Bernholc, J. (1997, March 15). Physical Review. B, Condensed Matter, Vol. 55, pp. R7323–7326.
1997 article
Theory of interfaces and surfaces in wide-gap nitrides
Nardelli, M. B., Rapcewicz, K., & Bernholc, J. (1997, July 1). Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena, Vol. 15, pp. 1144–1147.