@inproceedings{dhawan_muth_leonard_gerhold_gleeson_vo-dinh_russell_2008, title={Focused in beam fabrication of metallic nanostructures on end faces of optical fibers for chemical sensing applications}, volume={26}, DOI={10.1116/1.3013329}, number={6}, booktitle={Journal of Vacuum Science & Technology. B, Microelectronics and Nanometer Structures}, author={Dhawan, A. and Muth, J. F. and Leonard, D. N. and Gerhold, M. D. and Gleeson, J. and Vo-Dinh, T. and Russell, P. E.}, year={2008}, pages={2168–2173} }
 @article{parish_russell_2007, title={Scanning cathodoluminescence microscopy}, volume={147}, journal={Advances in imaging and electron physics, vol 147}, author={Parish, C. M. and Russell, P. E.}, year={2007}, pages={1–135} }
 @article{parish_russell_2006, title={On the use of Monte Carlo modeling in the mathematical analysis of scanning electron microscopy-electron beam induced current data}, volume={89}, number={19}, journal={Applied Physics Letters}, author={Parish, C. M. and Russell, P. E.}, year={2006} }
 @article{bunker_garcia_russell_2005, title={Scanning electron microscopy cathodoluminescence studies of piezoelectric fields in an InGaN/GaN quantum-well light-emitting diode}, volume={86}, DOI={10.1063/1.1868886}, number={8}, journal={Applied Physics Letters}, author={Bunker, K. L. and Garcia, R. and Russell, P. E.}, year={2005} }
 @article{mosselveld_makarov_lundquist_griffis_russell_2004, title={Circuit editing of copper and low-k dielectrics in nanotechnology devices}, volume={214}, DOI={10.1111/j.0022-2720.2004.01337.x}, number={2004 Jun}, journal={Journal of Microscopy}, author={Mosselveld, F. and Makarov, V. V. and Lundquist, T. R. and Griffis, D. P. and Russell, P. E.}, year={2004}, pages={246–251} }
 @article{edmond_abare_bergman_bharathan_bunker_emerson_haberern_ibbetson_leung_russell_et al._2004, title={High efficiency GaN-based LEDs and lasers on SiC}, volume={272}, number={04-Jan}, journal={Journal of Crystal Growth}, author={Edmond, J. and Abare, A. and Bergman, M. and Bharathan, J. and Bunker, K. L. and Emerson, D. and Haberern, K. and Ibbetson, J. and Leung, M. and Russell, P. and et al.}, year={2004}, pages={242–250} }
 @misc{russell_griffis_gonzales perez_2003, title={Chemically enhanced focused ion beam micro-machining of copper}, volume={6,645,872}, number={2003 Nov. 11}, publisher={Washington, DC: U.S. Patent and Trademark Office}, author={Russell, P. E. and Griffis, D. P. and Gonzales Perez, J. C.}, year={2003} }
 @article{bender_salmon_russell_2003, title={Combined atomic force microscopy and scanning tunneling microscopy imaging of cross-sectioned GaN light-emitting diodes}, volume={25}, number={1}, journal={Scanning}, author={Bender, J. W. and Salmon, M. E. and Russell, P. E.}, year={2003}, pages={45–51} }
 @article{da silva_gonzalez_russell_2003, title={Cross-sectional Scanning Probe Microscopy of GaN-based p-n heterostructures}, volume={34}, DOI={10.1016/S0026-2692(03)00051-X}, number={5-8}, journal={Microelectronics Journal}, author={Da Silva, M. I. N. and Gonzalez, J. C. and Russell, P. E.}, year={2003}, pages={571–573} }
 @article{gonzalez_da silva_bunker_batchelor_russell_2003, title={Electrical characterization of InGaN quantum well p-n heterostructures}, volume={34}, DOI={10.1016/S0026-2692(03)00072-7}, number={5-8}, journal={Microelectronics Journal}, author={Gonzalez, J. C. and Da Silva, M. I. N. and Bunker, K. L. and Batchelor, A. D. and Russell, P. E.}, year={2003}, pages={455–457} }
 @article{wang_griffis_garcia_russell_2003, title={Etching characteristics of chromium thin films by an electron beam induced surface reaction}, volume={18}, DOI={10.1088/0268-1242/18/4/302}, number={4}, journal={Semiconductor Science and Technology}, author={Wang, J. H. and Griffis, D. P. and Garcia, R. and Russell, P. E.}, year={2003}, pages={199–205} }
 @article{gonzalez_da silva_griffis_russell_2002, title={Improvements in focused ion beam micromachining of interconnect materials}, volume={20}, DOI={10.1116/1.1515310}, number={6}, journal={Journal of Vacuum Science & Technology. B, Microelectronics and Nanometer Structures}, author={Gonzalez, J. C. and Da Silva, M. I. N. and Griffis, D. P. and Russell, P. E.}, year={2002}, pages={2700–2704} }
 @article{leonard_russell_smith_spontak_2002, title={Multiscale dewetting of low-molecular-weight block copolymer ultrathin films}, volume={23}, DOI={10.1002/1521-3927(20020201)23:3<205::AID-MARC205>3.0.CO;2-X}, number={3}, journal={Macromolecular Rapid Communications}, author={Leonard, D. N. and Russell, P. E. and Smith, S. D. and Spontak, R. J.}, year={2002}, pages={205–209} }
 @article{leonard_spontak_smith_russell_2002, title={Topological coarsening of low-molecular-weight block copolymer ultrathin films by environmental AFM}, volume={43}, DOI={10.1016/S0032-3861(02)00640-7}, number={25}, journal={Polymer}, author={Leonard, D. N. and Spontak, R. J. and Smith, S. D. and Russell, P. E.}, year={2002}, pages={6719–6726} }
 @article{gonzalez_griffis_miau_russell_2001, title={Chemically enhanced focused ion beam micromachining of copper}, volume={19}, DOI={10.1116/1.1418406}, number={6}, journal={Journal of Vacuum Science & Technology. B, Microelectronics and Nanometer Structures}, author={Gonzalez, J. C. and Griffis, D. P. and Miau, T. T. and Russell, P. E.}, year={2001}, pages={2539–2542} }
 @article{gonzalez_bunker_russell_2001, title={Minority-carrier diffusion length in a GaN-based light-emitting diode}, volume={79}, DOI={10.1063/1.1400075}, number={10}, journal={Applied Physics Letters}, author={Gonzalez, J. C. and Bunker, K. L. and Russell, P. E.}, year={2001}, pages={1567–1569} }
 @article{neves_salmon_troughton_russell_2001, title={Self-healing on OPA self-assembled monolayers}, volume={12}, DOI={10.1088/0957-4484/12/3/315}, number={3}, journal={Nanotechnology}, author={Neves, B. R. A. and Salmon, M. E. and Troughton, E. B. and Russell, P. E.}, year={2001}, pages={285–289} }
 @article{neves_salmon_russell_troughton_2001, title={Spread coating of OPA on mica: From multilayers to self- assembled monolayers}, volume={17}, DOI={10.1021/la010909a}, number={26}, journal={Langmuir}, author={Neves, B. R. A. and Salmon, M. E. and Russell, P. E. and Troughton, E. B.}, year={2001}, pages={8193–8198} }
 @article{phillips_griffis_russell_2000, title={Channeling effects during focused-ion-beam micromachining of copper}, volume={18}, DOI={10.1116/1.582300}, number={4}, journal={Journal of Vacuum Science & Technology. A, Vacuum, Surfaces, and Films}, author={Phillips, J. R. and Griffis, D. P. and Russell, P. E.}, year={2000}, pages={1061–1065} }
 @article{jarausch_kiely_houston_russell_2000, title={Defect-dependent elasticity: Nanoindentation as a probe of stress state}, volume={15}, DOI={10.1557/JMR.2000.0244}, number={8}, journal={Journal of Materials Research}, author={Jarausch, K. F. and Kiely, J. D. and Houston, J. E. and Russell, P. E.}, year={2000}, pages={1693–1701} }
 @inbook{leonard_spontak_russell_2000, title={Environmental atomic force microscopy: Probing diblock polymer thin films and self-assembling molecules at various temperatures and pressures}, volume={165}, ISBN={0750306858}, number={2000}, booktitle={Microbeam Analysis 2000: proceedings of the Second Conference of the International Union of Microbeam Analysis Societies held in Kailua-Kona, Hawaii, 9-14 July 2000}, publisher={Bristol: Institute of Physics Publishing}, author={Leonard, D. N. and Spontak, R. J. and Russell, P. E.}, editor={Williams, D. B. and Shimizu, R.Editors}, year={2000}, pages={389–390} }
 @misc{russell_griffis_shedd_stark_vitarelli_2000, title={Method for water vapor enhanced charged-particle-beam machining}, volume={6,140,655}, number={2000 Oct. 31}, publisher={Washington, DC: U.S. Patent and Trademark Office}, author={Russell, P. E. and Griffis, D. P. and Shedd, G. M. and Stark, T. J. and Vitarelli, J.}, year={2000} }
 @inbook{neves_salmon_leonard_troughton_russell_2000, title={Scratching and healing investigations on self-assembled monolayers using Atomic Force Microscopy}, volume={165}, ISBN={0750306858}, number={2000}, booktitle={Microbeam Analysis 2000: proceedings of the Second Conference of the International Union of Microbeam Analysis Societies held in Kailua-Kona, Hawaii, 9-14 July 2000}, publisher={Bristol: Institute of Physics Publishing}, author={Neves, B. R. A. and Salmon, M. E. and Leonard, D. N. and Troughton, E. B. and Russell, P. E.}, editor={Williams, D. B. and Shimizu, R.Editors}, year={2000}, pages={367–368} }
 @misc{neves_salmon_russell_troughton_2000, title={Thermal stability study of self-assembled monolayers on mica}, volume={16}, number={6}, journal={Langmuir}, author={Neves, B. R. A. and Salmon, M. E. and Russell, P. E. and Troughton, E. B.}, year={2000}, pages={2409–2412} }
 @article{neves_salmon_russell_troughton_1999, title={Comparative study of field emission-scanning electron microscopy and atomic force microscopy to assess self-assembled monolayer coverage on any type of substrate}, volume={5}, DOI={10.1017/S1431927699990475}, number={6}, journal={Microscopy and Microanalysis}, author={Neves, B. R. A. and Salmon, M. E. and Russell, P. E. and Troughton, E. B.}, year={1999}, pages={413–419} }
 @article{neves_vilela_russell_reis_andrade_1999, title={Imaging micro-cracks in gold films: a comparative study of scanning tunneling and atomic force microscopies}, volume={76}, DOI={10.1016/S0304-3991(98)00071-0}, number={1-2}, journal={Ultramicroscopy}, author={Neves, B. R. A. and Vilela, J. M. C. and Russell, P. E. and Reis, A. C. C. and Andrade, M. S.}, year={1999}, pages={61–67} }
 @article{kiely_jarausch_houston_russell_1999, title={Initial stages of yield in nanoindentation}, volume={14}, DOI={10.1557/JMR.1999.0298}, number={6}, journal={Journal of Materials Research}, author={Kiely, J. D. and Jarausch, K. F. and Houston, J. E. and Russell, P. E.}, year={1999}, pages={2219–2227} }
 @misc{russell_griffis_shedd_stark_vitarelli_1999, title={Method for water vapor enhanced charged-particle-beam machining}, volume={5,958,799}, number={1999 Sept. 28}, publisher={Washington, DC: U.S. Patent and Trademark Office}, author={Russell, P. E. and Griffis, D. P. and Shedd, G. M. and Stark, T. J. and Vitarelli, J.}, year={1999} }
 @article{neves_leonard_salmon_russell_troughton_1999, title={Observation of topography inversion in atomic force microscopy of self-assembled monolayers}, volume={10}, DOI={10.1088/0957-4484/10/4/307}, number={4}, journal={Nanotechnology}, author={Neves, B. R. A. and Leonard, D. N. and Salmon, M. E. and Russell, P. E. and Troughton, E. B.}, year={1999}, pages={399–404} }
 @article{russell_stark_griffis_phillips_jarausch_1998, title={Chemically and geometrically enhanced focused ion beam micromachining}, volume={16}, DOI={10.1116/1.590197}, number={4}, journal={Journal of Vacuum Science & Technology. B, Microelectronics and Nanometer Structures}, author={Russell, P. E. and Stark, T. J. and Griffis, D. P. and Phillips, J. R. and Jarausch, K. F.}, year={1998}, pages={2494–2498} }
 @misc{musselman_russell_1992, title={Method of fabricating scanning tunneling microscope tips}, volume={5085746}, publisher={Washington, DC: U.S. Patent and Trademark Office}, author={Musselman, I. H. and Russell, P. E.}, year={1992} }
 @misc{musselman_russell_1992, title={Scanning tunneling microscope tips}, volume={5164595}, publisher={Washington, DC: U.S. Patent and Trademark Office}, author={Musselman, I. H. and Russell, P. E.}, year={1992} }