Works (12)

Updated: July 5th, 2023 16:04

2008 patent

Gallium nitride based high-electron mobility devices

Washington, DC: U.S. Patent and Trademark Office.

By: C. Harris, T. Gehrke, T. Weeks & C. Basceri

Source: NC State University Libraries
Added: August 6, 2018

2008 patent

Method of manufacturing gallium nitride based high-electron mobility devices

Washington, DC: U.S. Patent and Trademark Office.

By: C. Harris, T. Gehrke, T. Weeks & C. Basceri

Source: NC State University Libraries
Added: August 6, 2018

2007 patent

Gallium nitride material devices and methods of forming the same

Washington, DC: U.S. Patent and Trademark Office.

By: T. Weeks & K. Linthicum

Source: NC State University Libraries
Added: August 6, 2018

2005 patent

Gallium nitride materials including thermally conductive regions

Washington, DC: U.S. Patent and Trademark Office.

By: R. Borges, K. Linthicum, T. Weeks & T. Gehrke

Source: NC State University Libraries
Added: August 6, 2018

2003 patent

Gallium nitride material devices and methods including backside vias

Washington, DC: U.S. Patent and Trademark Office.

By: T. Weeks, E. Piner, R. Borges & K. Linthicum

Source: NC State University Libraries
Added: August 6, 2018

2003 patent

Gallium nitride materials and methods

Washington, DC: U.S. Patent and Trademark Office.

By: T. Weeks, E. Piner, T. Gehrke & K. Linthicum

Source: NC State University Libraries
Added: August 6, 2018

1998 article

Spectroscopic ellipsometry and low-temperature reflectance: complementary analysis of GaN thin films

Edwards, N. V., Yoo, S. D., Bremser, M. D., Horton, M. N., Perkins, N. R., Weeks, T. W., … Aspnes, D. E. (1998, February). THIN SOLID FILMS, Vol. 313, pp. 187–192.

By: N. Edwards*, S. Yoo*, M. Bremser*, M. Horton, N. Perkins, T. Weeks*, H. Liu, R. Stall ...

author keywords: GaN; spectroscopic ellipsometry; reflectance; valence bands; excitons; reciprocal space analysis
Sources: Web Of Science, ORCID
Added: August 6, 2018

1997 article

Growth of AlN and GaN thin films via OMVPE and gas source MBE and their characterization

Davis, R. F., Weeks, T. W., Bremser, M. D., Tanaka, S., Kern, R. S., Sitar, Z., … Wang, C. (1997, February). SOLID-STATE ELECTRONICS, Vol. 41, pp. 129–134.

By: R. Davis n, T. Weeks n, M. Bremser n, S. Tanaka n, R. Kern n, Z. Sitar n, K. Ailey n, W. Perry n, C. Wang n

co-author countries: United States of America 🇺🇸
Source: Web Of Science
Added: August 6, 2018

1997 journal article

Pulsed operation lasing in a cleaved-facet InGaN/GaN MQW SCH laser grown on 6H-SiC

ELECTRONICS LETTERS, 33(18), 1556–1557.

By: G. Bulman*, K. Doverspike*, S. Sheppard*, T. Weeks*, H. Kong*, H. Dieringer*, J. Edmond*, J. Brown n, J. Swindell n, J. Schetzina n

co-author countries: United States of America 🇺🇸
author keywords: semiconductor junction lasers; silicon carbide; semiconductor quantum wells
Source: Web Of Science
Added: August 6, 2018

1997 journal article

Spectral analysis of above-, below-, and near-bandedge phenomena in GaN thin films

MATERIALS SCIENCE AND ENGINEERING B-SOLID STATE MATERIALS FOR ADVANCED TECHNOLOGY, 50(1-3), 134–141.

By: N. Edwards n, S. Yoo n, M. Bremser n, T. Zheleva n, M. Horton*, N. Perkins*, T. Weeks n, H. Liu* ...

co-author countries: United States of America 🇺🇸
author keywords: GaN thin films; spectroscopic ellipsometry; bandedge phenomena
Sources: Web Of Science, ORCID
Added: August 6, 2018

1997 journal article

Variation of GaN valence bands with biaxial stress and quantification of residual stress

APPLIED PHYSICS LETTERS, 70(15), 2001–2003.

By: N. Edwards n, S. Yoo n, M. Bremser n, T. Weeks n, O. Nam n, R. Davis n, H. Liu, R. Stall ...

co-author countries: United States of America 🇺🇸
Sources: Web Of Science, ORCID
Added: August 6, 2018

1997 conference paper

Variation of GaN valence bands with biaxial stress: quantification of residual stress and impact on fundamental band parameters

III-V nitrides: symposium held December 2-6, 1996, Boston, Massachusetts, U.S.A. (Materials Research Society symposia proceedings ; v. 449), 781–786.

By: N. Edwards n, S. Yoo n, M. Bremser n, M. Horton*, N. Perkins*, T. Weeks n, H. Liu*, R. Stall* ...

co-author countries: United States of America 🇺🇸
Sources: NC State University Libraries, ORCID
Added: August 6, 2018

Citation Index includes data from a number of different sources. If you have questions about the sources of data in the Citation Index or need a set of data which is free to re-distribute, please contact us.

Certain data included herein are derived from the Web of Science© and InCites© (2024) of Clarivate Analytics. All rights reserved. You may not copy or re-distribute this material in whole or in part without the prior written consent of Clarivate Analytics.