Works (23)

2001 journal article

Elimination of endpoint-discontinuity artifacts in the analysis of spectra in reciprocal space

Journal of Applied Physics, 89(12), 8183–8192.

By: S. Yoo & D. Aspnes

Source: NC State University Libraries
Added: August 6, 2018

2000 journal article

Dielectric function of epitaxial ZnSe films

Applied Physics Letters, 77(21), 3364–3366.

By: M. Koo, T. Kim, M. Lee, M. Oh, Y. Kim, S. Yoo, D. Aspnes, B. Jonker

Source: NC State University Libraries
Added: August 6, 2018

2000 journal article

Effect of Ar+ ion beam in the process of plasma surface modification of PET films

Journal of Applied Polymer Science, 77(8), 1679–1683.

Source: NC State University Libraries
Added: August 6, 2018

2000 journal article

High-resolution spectroscopy with reciprocal-space analysis: Application to isotopically pure Si

Physica Status Solidi. B, Basic Solid State Physics, 220(1), 117–125.

By: S. Yoo, D. Aspnes, L. Lastras-Martinez, T. Ruf, M. Konuma & M. Cardona

Source: NC State University Libraries
Added: August 6, 2018

2000 journal article

In situ monitoring of MOVPE growth by combined spectroscopic ellipsometry and reflectance-difference spectroscopy

Thin Solid Films, 364(1-2), 22–27.

By: M. Ebert, K. Bell, S. Yoo, K. Flock & D. Aspnes

Source: NC State University Libraries
Added: August 6, 2018

2000 journal article

Optical characterization of wide bandgap semiconductors

Thin Solid Films, 364(1-2), 98–106.

By: N. Edwards, M. Bremser, A. Batchelor, I. Buyanova, L. Madsen, S. Yoo, T. Welhkamp, K. Wilmers ...

Source: NC State University Libraries
Added: August 6, 2018

2000 journal article

Optical properties of AlxGa1-xP (0 <= x <= 0.52) alloys

Journal of Applied Physics, 87(3), 1287–1290.

By: S. Choi, Y. Kim, S. Yoo, D. Aspnes, D. Woo & S. Kim

Source: NC State University Libraries
Added: August 6, 2018

2000 journal article

Real-time optical characterization of heteroepitaxy by organometallic chemical vapor deposition

Journal of Vacuum Science & Technology. A, Vacuum, Surfaces, and Films, 18(4), 1184–1189.

By: K. Bell, M. Ebert, S. Yoo, K. Flock & D. Aspnes

Source: NC State University Libraries
Added: August 6, 2018

2000 journal article

Real-time optical techniques and QMS to characterize growth in a modified commercial OMVPE reactor

Journal of Electronic Materials, 29(1), 106–111.

By: K. Bell, M. Ebert, S. Yoo, K. Flock & D. Aspnes

Source: NC State University Libraries
Added: August 6, 2018

1999 journal article

Dielectric function of Cd0.57Mg0.43Te alloy film studied by ellipsometry

Journal of the Korean Physical Society, 34(1999 June), S496–498.

By: T. Kim, Y. Kim, S. Yoo, D. Aspnes & J. Kossut

Source: NC State University Libraries
Added: August 6, 2018

1999 journal article

High-resolution spectroscopy with reciprocal-space analysis

Physica Status Solidi. B, Basic Solid State Physics, 215(1), 715–723.

By: D. Aspnes & S. Yoo

Source: NC State University Libraries
Added: August 6, 2018

1998 journal article

Analysis of optical spectra by Fourier methods

Thin Solid Films, 313(1998 Feb.), 143–148.

By: S. Yoo, N. Edwards & D. Aspnes

Source: NC State University Libraries
Added: August 6, 2018

1998 journal article

Optical characterization of GaAs/AlAs short period superlattices

Microelectronic Engineering, 43-4(1998 Aug.), 265–270.

By: D. Woo, I. Han, W. Choi, S. Lee, H. Kim, J. Lee, S. Kim, K. Kang ...

Source: NC State University Libraries
Added: August 6, 2018

1998 journal article

Spectroscopic ellipsometry and low-temperature reflectance: complementary analysis of GaN thin films

Thin Solid Films, 313(1998 Feb.), 187–192.

By: N. Edwards, S. Yoo, M. Bremser, M. Horton, N. Perkins, T. Weeks, H. Liu, R. Stall ...

Source: NC State University Libraries
Added: August 6, 2018

1998 journal article

Trends in residual stress for GaN/AlN/6H-SiC heterostructures

Applied Physics Letters, 73(19), 2808–2810.

Source: NC State University Libraries
Added: August 6, 2018

1997 journal article

Above bandgap dielectric function of epitaxial ZnSe layers

Journal of the Korean Physical Society, 31(4), L553–555.

By: Y. Kim, Y. Ko, S. Choi, S. Yoo, D. Aspnes & B. Jonker

Source: NC State University Libraries
Added: August 6, 2018

1997 journal article

Ellipsometric studies of Cd(1-x)Mg(x)Te (0 less than or equal to x less than or equal to 0.5) alloys

Applied Physics Letters, 71(2), 249–251.

By: S. Choi, Y. Kim, S. Yoo, A. Duk, M. David E., . I., A. Ramdas

Source: NC State University Libraries
Added: August 6, 2018

1997 journal article

Spectral analysis of above-, below-, and near-bandedge phenomena in GaN thin films

Materials Science & Engineering. B, Solid-State Materials for Advanced Technology, 50(1-3), 134–141.

By: N. Edwards, S. Yoo, M. Bremser, T. Zheleva, M. Horton, N. Perkins, T. Weeks, H. Liu ...

Source: NC State University Libraries
Added: August 6, 2018

1997 journal article

Spectroscopic ellipsometric characterization of undoped ZnTe films grown on GaAs

Applied Physics Letters, 70(5), 610–612.

By: Y. Kim, S. Choi, M. Klein, S. Yoo, D. Aspnes, S. Xin, J. Furdyna

Source: NC State University Libraries
Added: August 6, 2018

1997 journal article

Spectroscopic ellipsometric study of Zn(1-x)Mn(x)Te films grown on GaAs

Journal of the Korean Physical Society, 31(1), 202–205.

By: S. Choi, Y. Kim, M. Klein, S. Yoo, D. Aspnes, S. Xin, J. Furdyna

Source: NC State University Libraries
Added: August 6, 2018

1997 journal article

Spectroscopic ellipsometry study of GaAs/AlAs superlattices and Al(0.5)Ga(0.5)As alloy

Journal of the Korean Physical Society, 30(suppl.), 108–112.

By: S. Choi, Y. Kim, S. Yoo, D. Aspnes, S. Rhee, J. Woo, D. Woo, S. Kim, K. Kang

Source: NC State University Libraries
Added: August 6, 2018

1997 journal article

Variation of GaN valence bands with biaxial stress and quantification of residual stress

Applied Physics Letters, 70(1997), 2001.

By: N. Edwards, M. Bremser, T. Weeks, O. Nam, R. Davis, H. Liu, R. Stall, M. Horton ...

Source: NC State University Libraries
Added: August 6, 2018

1997 conference paper

Variation of GaN valence bands with biaxial stress: quantification of residual stress and impact on fundamental band parameters

III-V nitrides: symposium held December 2-6, 1996, Boston, Massachusetts, U.S.A. (Materials Research Society symposia proceedings ; v. 449), 781–786.

By: N. Edwards, S. Yoo, M. Bremser, M. Horton, N. Perkins, T. Weeks, H. Liu, R. Stall ...

Source: NC State University Libraries
Added: August 6, 2018