Works (23)

Updated: July 5th, 2023 16:04

2001 journal article

Elimination of endpoint-discontinuity artifacts in the analysis of spectra in reciprocal space

JOURNAL OF APPLIED PHYSICS, 89(12), 8183–8192.

By: S. Yoo n & D. Aspnes n

co-author countries: United States of America 🇺🇸
Sources: Web Of Science, ORCID
Added: August 6, 2018

2000 journal article

Dielectric function of epitaxial ZnSe films

APPLIED PHYSICS LETTERS, 77(21), 3364–3366.

By: M. Koo*, T. Kim*, M. Lee*, M. Oh*, Y. Kim*, S. Yoo n, D. Aspnes n, B. Jonker*

co-author countries: Korea (Republic of) 🇰🇷 United States of America 🇺🇸
Sources: Web Of Science, ORCID
Added: August 6, 2018

2000 journal article

Effect of Ar+ ion beam in the process of plasma surface modification of PET films

JOURNAL OF APPLIED POLYMER SCIENCE, 77(8), 1679–1683.

By: J. Hyun n, P. Barletta n, K. Koh n, S. Yoo n, J. Oh n, D. Aspnes n, J. Cuomo n

co-author countries: United States of America 🇺🇸
author keywords: polymer; plasma; ion beam; crosslinking; hydrophilic
Sources: Web Of Science, ORCID
Added: August 6, 2018

2000 article

High-resolution spectroscopy with reciprocal-space analysis: Application to isotopically pure Si

Yoo, S. D., Aspnes, D. E., Lastras-Martinez, L. F., Ruf, T., Konuma, M., & Cardona, M. (2000, July). PHYSICA STATUS SOLIDI B-BASIC SOLID STATE PHYSICS, Vol. 220, pp. 117–125.

By: S. Yoo n, D. Aspnes n, L. Lastras-Martinez*, T. Ruf*, M. Konuma* & M. Cardona*

co-author countries: Germany 🇩🇪 United States of America 🇺🇸
Sources: Web Of Science, ORCID
Added: August 6, 2018

2000 article

In situ monitoring of MOVPE growth by combined spectroscopic ellipsometry and reflectance-difference spectroscopy

Ebert, M., Bell, K. A., Yoo, S. D., Flock, K., & Aspnes, D. E. (2000, March 27). THIN SOLID FILMS, Vol. 364, pp. 22–27.

By: M. Ebert n, K. Bell n, S. Yoo n, K. Flock n & D. Aspnes n

co-author countries: United States of America 🇺🇸
author keywords: real-time monitoring; metalorganic vapor phase epitaxy; growth control; spectroscopic ellipsometry; reflectance-difference spectroscopy; silicon (Si); gallium phosphide (GaP)
Sources: Web Of Science, ORCID
Added: August 6, 2018

2000 article

Optical characterization of wide bandgap semiconductors

Edwards, N. V., Bremser, M. D., Batchelor, A. D., Buyanova, I. A., Madsen, L. D., Yoo, S. D., … Monemar, B. (2000, March 27). THIN SOLID FILMS, Vol. 364, pp. 98–106.

By: N. Edwards*, M. Bremser n, A. Batchelor n, I. Buyanova*, L. Madsen*, S. Yoo n, T. Welhkamp, K. Wilmers* ...

co-author countries: Germany 🇩🇪 Sweden 🇸🇪 United States of America 🇺🇸
author keywords: GaN; strain; valence bands; reflectance; excitons; reciprocal space analysis; spectroscopic ellipsometry
Sources: Web Of Science, ORCID
Added: August 6, 2018

2000 journal article

Optical properties of AlxGa1-xP (0 <= x <= 0.52) alloys

JOURNAL OF APPLIED PHYSICS, 87(3), 1287–1290.

By: S. Choi*, Y. Kim*, S. Yoo n, D. Aspnes n, D. Woo* & S. Kim*

co-author countries: Korea (Republic of) 🇰🇷 United States of America 🇺🇸
Sources: Web Of Science, ORCID
Added: August 6, 2018

2000 article

Real-time optical characterization of heteroepitaxy by organometallic chemical vapor deposition

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A, Vol. 18, pp. 1184–1189.

By: K. Bell n, M. Ebert n, S. Yoo n, K. Flock n & D. Aspnes n

co-author countries: United States of America 🇺🇸
Sources: Web Of Science, ORCID
Added: August 6, 2018

2000 article

Real-time optical techniques and QMS to characterize growth in a modified commercial OMVPE reactor

Bell, K. A., Ebert, M., Yoo, S. D., Flock, K., & Aspnes, D. E. (2000, January). JOURNAL OF ELECTRONIC MATERIALS, Vol. 29, pp. 106–111.

By: K. Bell n, M. Ebert n, S. Yoo n, K. Flock n & D. Aspnes n

co-author countries: United States of America 🇺🇸
author keywords: real-time monitoring; organometallic vapor phase epitaxy; quadrupole mass spectrometry; spectroscopic ellipsometry; reflectance-difference spectroscopy; silicon (Si); gallium phosphide (GaP)
Sources: Web Of Science, ORCID
Added: August 6, 2018

1999 journal article

Dielectric function of Cd0.57Mg0.43Te alloy film studied by ellipsometry

Journal of the Korean Physical Society, 34(1999 June), S496–498.

By: T. Kim, Y. Kim, S. Yoo, D. Aspnes & J. Kossut

Source: NC State University Libraries
Added: August 6, 2018

1999 article

High-resolution spectroscopy with reciprocal-space analysis

Aspnes, D. E., & Yoo, S. D. (1999, September). PHYSICA STATUS SOLIDI B-BASIC RESEARCH, Vol. 215, pp. 715–723.

By: D. Aspnes* & S. Yoo n

co-author countries: United States of America 🇺🇸
Sources: Web Of Science, ORCID
Added: August 6, 2018

1998 article

Analysis of optical spectra by Fourier methods

Yoo, S. D., Edwards, N. V., & Aspnes, D. E. (1998, February). THIN SOLID FILMS, Vol. 313, pp. 143–148.

By: S. Yoo n, N. Edwards n & D. Aspnes n

co-author countries: United States of America 🇺🇸
author keywords: Fourier analysis; critical points; spectroscopic ellipsometry; reflectance; filtering
Sources: Web Of Science, ORCID
Added: August 6, 2018

1998 article

Optical characterization of GaAs/AlAs short period superlattices

Woo, D. H., Han, I. K., Choi, W. J., Lee, S., Kim, H. J., Lee, J. I., … Woo, J. C. (1998, August). MICROELECTRONIC ENGINEERING, Vol. 43-4, pp. 265–270.

By: D. Woo*, I. Han*, W. Choi*, S. Lee*, H. Kim*, J. Lee*, S. Kim*, K. Kang* ...

co-author countries: Korea (Republic of) 🇰🇷 United States of America 🇺🇸
Sources: Web Of Science, ORCID
Added: August 6, 2018

1998 article

Spectroscopic ellipsometry and low-temperature reflectance: complementary analysis of GaN thin films

Edwards, N. V., Yoo, S. D., Bremser, M. D., Horton, M. N., Perkins, N. R., Weeks, T. W., … Aspnes, D. E. (1998, February). THIN SOLID FILMS, Vol. 313, pp. 187–192.

By: N. Edwards*, S. Yoo*, M. Bremser*, M. Horton, N. Perkins, T. Weeks*, H. Liu, R. Stall ...

author keywords: GaN; spectroscopic ellipsometry; reflectance; valence bands; excitons; reciprocal space analysis
Sources: Web Of Science, ORCID
Added: August 6, 2018

1998 journal article

Trends in residual stress for GaN/AlN/6H-SiC heterostructures

APPLIED PHYSICS LETTERS, 73(19), 2808–2810.

By: N. Edwards n, M. Bremser n, R. Davis n, A. Batchelor n, S. Yoo n, C. Karan n, D. Aspnes n

co-author countries: United States of America 🇺🇸
Sources: Web Of Science, ORCID
Added: August 6, 2018

1997 journal article

Above bandgap dielectric function of epitaxial ZnSe layers

Journal of the Korean Physical Society, 31(4), L553–555.

By: Y. Kim, Y. Ko, S. Choi, S. Yoo, D. Aspnes & B. Jonker

Source: NC State University Libraries
Added: August 6, 2018

1997 journal article

Ellipsometric studies of Cd1-xMgxTe (0<=x<=0.5) alloys

APPLIED PHYSICS LETTERS, 71(2), 249–251.

By: S. Choi*, Y. Kim*, S. Yoo n, A. Duk, D. Miotkowski*, I., A. Ramdas*

co-author countries: Korea (Republic of) 🇰🇷 United States of America 🇺🇸
Sources: Web Of Science, ORCID
Added: August 6, 2018

1997 journal article

Spectral analysis of above-, below-, and near-bandedge phenomena in GaN thin films

MATERIALS SCIENCE AND ENGINEERING B-SOLID STATE MATERIALS FOR ADVANCED TECHNOLOGY, 50(1-3), 134–141.

By: N. Edwards n, S. Yoo n, M. Bremser n, T. Zheleva n, M. Horton*, N. Perkins*, T. Weeks n, H. Liu* ...

co-author countries: United States of America 🇺🇸
author keywords: GaN thin films; spectroscopic ellipsometry; bandedge phenomena
Sources: Web Of Science, ORCID
Added: August 6, 2018

1997 journal article

Spectroscopic ellipsometric characterization of undoped ZnTe films grown on GaAs

APPLIED PHYSICS LETTERS, 70(5), 610–612.

By: Y. Kim*, S. Choi*, M. Klein*, S. Yoo n, D. Aspnes n, S. Xin*, J. Furdyna*

co-author countries: Korea (Republic of) 🇰🇷 United States of America 🇺🇸
Sources: Web Of Science, ORCID
Added: August 6, 2018

1997 journal article

Spectroscopic ellipsometric study of Zn(1-x)Mn(x)Te films grown on GaAs

Journal of the Korean Physical Society, 31(1), 202–205.

By: S. Choi, Y. Kim, M. Klein, S. Yoo, D. Aspnes, S. Xin, J. Furdyna

Source: NC State University Libraries
Added: August 6, 2018

1997 journal article

Spectroscopic ellipsometry study of GaAs/AlAs superlattices and Al(0.5)Ga(0.5)As alloy

Journal of the Korean Physical Society, 30(suppl.), 108–112.

By: S. Choi, Y. Kim, S. Yoo, D. Aspnes, S. Rhee, J. Woo, D. Woo, S. Kim, K. Kang

Source: NC State University Libraries
Added: August 6, 2018

1997 journal article

Variation of GaN valence bands with biaxial stress and quantification of residual stress

APPLIED PHYSICS LETTERS, 70(15), 2001–2003.

By: N. Edwards n, S. Yoo n, M. Bremser n, T. Weeks n, O. Nam n, R. Davis n, H. Liu, R. Stall ...

co-author countries: United States of America 🇺🇸
Sources: Web Of Science, ORCID
Added: August 6, 2018

1997 conference paper

Variation of GaN valence bands with biaxial stress: quantification of residual stress and impact on fundamental band parameters

III-V nitrides: symposium held December 2-6, 1996, Boston, Massachusetts, U.S.A. (Materials Research Society symposia proceedings ; v. 449), 781–786.

By: N. Edwards n, S. Yoo n, M. Bremser n, M. Horton*, N. Perkins*, T. Weeks n, H. Liu*, R. Stall* ...

co-author countries: United States of America 🇺🇸
Sources: NC State University Libraries, ORCID
Added: August 6, 2018

Citation Index includes data from a number of different sources. If you have questions about the sources of data in the Citation Index or need a set of data which is free to re-distribute, please contact us.

Certain data included herein are derived from the Web of Science© and InCites© (2024) of Clarivate Analytics. All rights reserved. You may not copy or re-distribute this material in whole or in part without the prior written consent of Clarivate Analytics.