Sang-Duk Yoo

Yoo, S. D., & Aspnes, D. E. (2001). Elimination of endpoint-discontinuity artifacts in the analysis of spectra in reciprocal space. JOURNAL OF APPLIED PHYSICS, 89(12), 8183–8192. https://doi.org/10.1063/1.1368391

Koo, M. S., Kim, T. J., Lee, M. S., Oh, M. S., Kim, Y. D., Yoo, S. D., … Jonker, B. T. (2000). Dielectric function of epitaxial ZnSe films. APPLIED PHYSICS LETTERS, 77(21), 3364–3366. https://doi.org/10.1063/1.1328098

Hyun, J., Barletta, P., Koh, K., Yoo, S., Oh, J., Aspnes, D. E., & Cuomo, J. J. (2000). Effect of Ar+ ion beam in the process of plasma surface modification of PET films. JOURNAL OF APPLIED POLYMER SCIENCE, 77(8), 1679–1683. https://doi.org/10.1002/1097-4628(20000822)77:8<1679::AID-APP4>3.0.CO;2-F

Yoo, S. D., Aspnes, D. E., Lastras-Martinez, L. F., Ruf, T., Konuma, M., & Cardona, M. (2000, July). High-resolution spectroscopy with reciprocal-space analysis: Application to isotopically pure Si. PHYSICA STATUS SOLIDI B-BASIC SOLID STATE PHYSICS, Vol. 220, pp. 117–125. https://doi.org/10.1002/1521-3951(200007)220:1<117::aid-pssb117>3.0.co;2-4

Ebert, M., Bell, K. A., Yoo, S. D., Flock, K., & Aspnes, D. E. (2000, March 27). In situ monitoring of MOVPE growth by combined spectroscopic ellipsometry and reflectance-difference spectroscopy. THIN SOLID FILMS, Vol. 364, pp. 22–27. https://doi.org/10.1016/S0040-6090(99)00920-7

Edwards, N. V., Bremser, M. D., Batchelor, A. D., Buyanova, I. A., Madsen, L. D., Yoo, S. D., … Monemar, B. (2000, March 27). Optical characterization of wide bandgap semiconductors. THIN SOLID FILMS, Vol. 364, pp. 98–106. https://doi.org/10.1016/S0040-6090(99)00903-7

Choi, S. G., Kim, Y. D., Yoo, S. D., Aspnes, D. E., Woo, D. H., & Kim, S. H. (2000). Optical properties of AlxGa1-xP (0 <= x <= 0.52) alloys. JOURNAL OF APPLIED PHYSICS, 87(3), 1287–1290. https://doi.org/10.1063/1.372011

Bell, K. A., Ebert, M., Yoo, S. D., Flock, K., & Aspnes, D. E. (2000). Real-time optical characterization of heteroepitaxy by organometallic chemical vapor deposition. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A, Vol. 18, pp. 1184–1189. https://doi.org/10.1116/1.582323

Bell, K. A., Ebert, M., Yoo, S. D., Flock, K., & Aspnes, D. E. (2000, January). Real-time optical techniques and QMS to characterize growth in a modified commercial OMVPE reactor. JOURNAL OF ELECTRONIC MATERIALS, Vol. 29, pp. 106–111. https://doi.org/10.1007/s11664-000-0104-6

Kim, T. J., Kim, Y. D., Yoo, S. D., Aspnes, D. E., & Kossut, J. (1999). Dielectric function of Cd0.57Mg0.43Te alloy film studied by ellipsometry. Journal of the Korean Physical Society, 34(1999 June), S496–498.

Aspnes, D. E., & Yoo, S. D. (1999, September). High-resolution spectroscopy with reciprocal-space analysis. PHYSICA STATUS SOLIDI B-BASIC RESEARCH, Vol. 215, pp. 715–723. https://doi.org/10.1002/(sici)1521-3951(199909)215:1<715::aid-pssb715>3.0.co;2-g

Yoo, S. D., Edwards, N. V., & Aspnes, D. E. (1998, February). Analysis of optical spectra by Fourier methods. THIN SOLID FILMS, Vol. 313, pp. 143–148. https://doi.org/10.1016/S0040-6090(97)00801-8

Woo, D. H., Han, I. K., Choi, W. J., Lee, S., Kim, H. J., Lee, J. I., … Woo, J. C. (1998, August). Optical characterization of GaAs/AlAs short period superlattices. MICROELECTRONIC ENGINEERING, Vol. 43-4, pp. 265–270. https://doi.org/10.1016/S0167-9317(98)00173-7

Edwards, N. V., Yoo, S. D., Bremser, M. D., Horton, M. N., Perkins, N. R., Weeks, T. W., … Aspnes, D. E. (1998, February). Spectroscopic ellipsometry and low-temperature reflectance: complementary analysis of GaN thin films. THIN SOLID FILMS, Vol. 313, pp. 187–192. https://doi.org/10.1016/S0040-6090(97)00815-8

Edwards, N. V., Bremser, M. D., Davis, R. F., Batchelor, A. D., Yoo, S. D., Karan, C. F., & Aspnes, D. E. (1998). Trends in residual stress for GaN/AlN/6H-SiC heterostructures. APPLIED PHYSICS LETTERS, 73(19), 2808–2810. https://doi.org/10.1063/1.122597

Kim, Y. D., Ko, Y. D., Choi, S. G., Yoo, S. D., Aspnes, D. E., & Jonker, B. T. (1997). Above bandgap dielectric function of epitaxial ZnSe layers. Journal of the Korean Physical Society, 31(4), L553–555.

Choi, S. G., Kim, Y. D., Yoo, S., Duk, A., Miotkowski, D. E., I., & Ramdas, A. K. (1997). Ellipsometric studies of Cd1-xMgxTe (0<=x<=0.5) alloys. APPLIED PHYSICS LETTERS, 71(2), 249–251. https://doi.org/10.1063/1.119511

Edwards, N. V., Yoo, S. D., Bremser, M. D., Zheleva, T., Horton, M. N., Perkins, N. R., … Aspnes, D. E. (1997). Spectral analysis of above-, below-, and near-bandedge phenomena in GaN thin films. MATERIALS SCIENCE AND ENGINEERING B-SOLID STATE MATERIALS FOR ADVANCED TECHNOLOGY, 50(1-3), 134–141. https://doi.org/10.1016/s0921-5107(97)00151-7

Kim, Y. D., Choi, S. G., Klein, M. V., Yoo, S. D., Aspnes, D. E., Xin, S. H., & Furdyna, J. K. (1997). Spectroscopic ellipsometric characterization of undoped ZnTe films grown on GaAs. APPLIED PHYSICS LETTERS, 70(5), 610–612. https://doi.org/10.1063/1.118289

Choi, S. G., Kim, Y. D., Klein, M. V., Yoo, S. D., Aspnes, D. E., Xin, S. H., & Furdyna, J. K. (1997). Spectroscopic ellipsometric study of Zn(1-x)Mn(x)Te films grown on GaAs. Journal of the Korean Physical Society, 31(1), 202–205.

Choi, S. G., Kim, Y. D., Yoo, S. D., Aspnes, D. E., Rhee, S. J., Woo, J. C., … Kang, K. N. (1997). Spectroscopic ellipsometry study of GaAs/AlAs superlattices and Al(0.5)Ga(0.5)As alloy. Journal of the Korean Physical Society, 30(suppl.), 108–112.

Edwards, N. V., Yoo, S. D., Bremser, M. D., Weeks, T. W., Nam, O. H., Davis, R. F., … Aspnes, D. E. (1997). Variation of GaN valence bands with biaxial stress and quantification of residual stress. APPLIED PHYSICS LETTERS, 70(15), 2001–2003. https://doi.org/10.1063/1.119089

Edwards, N. V., Yoo, S. D., Bremser, M. D., Horton, M. N., Perkins, N. R., Weeks, T. W., … Aspnes, D. E. (1997). Variation of GaN valence bands with biaxial stress: quantification of residual stress and impact on fundamental band parameters. III-V nitrides: symposium held December 2-6, 1996, Boston, Massachusetts, U.S.A.  (Materials Research Society symposia proceedings ; v. 449), 781–786. https://doi.org/10.1557/proc-449-781