Works (4)

Updated: July 5th, 2023 16:04

1999 journal article

Process sensing and metrology in gate oxide growth by rapid thermal chemical vapor deposition from SiH4 and N2O

Journal of Vacuum Science & Technology. B, Microelectronics and Nanometer Structures, 17(4), 1417–1423.

By: G. Lu, L. Tedder & G. Rubloff

Source: NC State University Libraries
Added: August 6, 2018

1998 journal article

Integrated dynamic simulation of rapid thermal chemical vapor deposition of polysilicon

IEEE TRANSACTIONS ON SEMICONDUCTOR MANUFACTURING, 11(1), 63–74.

By: G. Lu n, M. Bora n, L. Tedder n & G. Rubloff n

author keywords: CVD; semiconductor process modeling; simulation
Source: Web Of Science
Added: August 6, 2018

1997 journal article

Contamination control for gas delivery from a liquid source in semiconductor manufacturing

IEEE TRANSACTIONS ON SEMICONDUCTOR MANUFACTURING, 10(4), 425–432.

By: G. Lu n, G. Rubloff n & J. Durham*

author keywords: CVD; environmental factors; etching; semiconductor manufacturing; simulation
Source: Web Of Science
Added: August 6, 2018

1997 journal article

Polysilicon RTCVD process optimization for environmentally-conscious manufacturing

IEEE TRANSACTIONS ON SEMICONDUCTOR MANUFACTURING, 10(3), 390–398.

By: G. Lu*, M. Bora n & G. Rubloff*

author keywords: CVD; environmental factors; semiconductor process modeling; simulation
Source: Web Of Science
Added: August 6, 2018

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