1999 journal article
Chemical vapor cleaning of 6H-SiC surfaces
JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 146(9), 3448–3454.
1998 journal article
Aluminum nitride-silicon carbide solid solutions grown by plasma-assisted, gas-source molecular beam epitaxy
JOURNAL OF MATERIALS RESEARCH, 13(7), 1816–1822.
1998 article
Growth of highly (0001)-oriented aluminum nitride thin films with smooth surfaces on silicon carbide by gas-source molecular beam epitaxy
Jarrendahl, K., Smith, S. A., Zheleva, T., Kern, R. S., & Davis, R. F. (1998, March). VACUUM, Vol. 49, pp. 189–191.
1998 journal article
Reaction kinetics of silicon carbide deposition by gas-source molecular-beam epitaxy
Journal of Crystal Growth, 183(4), 581–593.
1997 journal article
Deposition and doping of silicon carbide by gas-source molecular beam epitaxy
APPLIED PHYSICS LETTERS, 71(10), 1356–1358.
1997 journal article
Gas-source molecular beam epitaxy of III-V nitrides
JOURNAL OF CRYSTAL GROWTH, 178(1-2), 87–101.
1997 article
Growth and doping via gas-source molecular beam epitaxy of SiC and SiC/AlN heterostructures and their microstructural and electrical characterization
Kern, R. S., Jarrendahl, K., Tanaka, S., & Davis, R. F. (1997, August). DIAMOND AND RELATED MATERIALS, Vol. 6, pp. 1282–1288.
1997 article
Growth of AlN and GaN thin films via OMVPE and gas source MBE and their characterization
Davis, R. F., Weeks, T. W., Bremser, M. D., Tanaka, S., Kern, R. S., Sitar, Z., … Wang, C. (1997, February). SOLID-STATE ELECTRONICS, Vol. 41, pp. 129–134.
1997 journal article
Homoepitaxial SiC growth by molecular beam epitaxy
Physica Status Solidi. B, Basic Solid State Physics, 202(1), 379–404.
1997 journal article
Silicon carbide for high-temperature microelectronics: recent advances in material growth via gas source MBE and device research
Materials Science & Engineering. B, Solid-State Materials for Advanced Technology, 46(1-3), 240–247.
1996 conference paper
In-plane optical anisotropies of Al(x)Ga(1-x)N films in their regions of transparency
III-V nitrides: symposium held December 2-6, 1996, Boston, Massachusetts, U.S.A. (Materials Research Society symposia proceedings ; v. 449), 835–840.
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