2012 journal article

Comparing through-silicon-via (TSV) void/pinhole defect self-test methods

Journal of Electronic Testing : Theory and Applications, 28(1), 27–38.

By: Y. Lou, Z. Yan, F. Zhang & P. Franzon

Source: NC State University Libraries
Added: August 6, 2018

2010 journal article

Fabrication of nanoshell arrays using directed assembly of nanospheres

IEEE Sensors Journal, 10(3), 617–620.

By: Y. Lou, L. Lunardi & J. Muth

Source: NC State University Libraries
Added: August 6, 2018

2009 journal article

Patterned hybrid nanohole array surfaces for cell adhesion and migration

Langmuir, 25(19), 11236–11238.

By: N. Westcott, Y. Lou, J. Muth & M. Yousaf

Source: NC State University Libraries
Added: August 6, 2018