Karthik Krish

Works (1)

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2010 journal article

Global registration of overlapping images using accumulative image features

Pattern Recognition Letters, 31(2), 112–118.

By: K. Krish, S. Heinrich, W. Snyder, H. Cakir & S. Khorram

author keywords: Image registration; Feature matching; Accumulator-based methods; Feature correspondence; Evidence accumulation
Sources: Web Of Science, Crossref
Added: August 6, 2018