1999 journal article
Modeling the trends in valence-band electron tunneling in NMOSFETs with ultrathin SiO2 and SiO2/Ta2O5 dielectrics with oxide scaling
Microelectronic Engineering, 48(1-4), 295–298.
1999 journal article
The effects of Ge content in poly-Si1-xGex gate material on the tunneling barrier in PMOS devices
Microelectronic Engineering, 48(1-4), 39–42.
1998 journal article
Heterointerface dipoles: Applications to (a) Si-SiO2, (b) nitrided Si-N-SiO2, and (c) SiC-SiO2 interfaces
Journal of Vacuum Science & Technology. B, Microelectronics and Nanometer Structures, 16(4), 2191–2198.
