@article{bergman_alexson_nemanich_dutta_stroscio_balkas_davis_1999, title={Phonon dynamics and lifetimes of AlN and GaN crystallites}, volume={4S1}, DOI={10.1557/s1092578300003422}, abstractNote={The quasi-LO and quasi-TO modes of AlN crystallite were investigated. The analysis indicates that the Raman mode behavior concurs with Loudons’ model of mode-mixing in wurtzite (WZ) structure crystals which is due to the long-range electrostatic field. Phononlifetimes of GaN and AlN crystallites were studied via Raman lineshape. It was found that the low energy E2 mode lifetime is about an order of magnitude longer than that of the other modes, and that impurities impact significantly the phonon-lifetimes.}, number={G6.65}, journal={MRS Internet Journal of Nitride Semiconductor Research}, author={Bergman, L. and Alexson, D. and Nemanich, R. J. and Dutta, M. and Stroscio, M. A. and Balkas, C. and Davis, R. F.}, year={1999} } @article{bergman_alexson_murphy_nemanich_dutta_stroscio_balkas_shin_davis_1999, title={Raman analysis of phonon lifetimes in AlN and GaN of wurtzite structure}, volume={59}, ISSN={["1550-235X"]}, DOI={10.1103/physrevb.59.12977}, abstractNote={Raman analyses of the lifetimes of phonons in GaN and AlN crystallites of wurtzite structure are presented. In order to ensure the accuracy of the measurement of the phonon lifetimes, an experimental procedure to eliminate the broadening due to the finite slit width was performed. The lifetime analyses indicate that the phonon lifetimes in AlN as well as in GaN fall into two main time regimes: a relatively long time of the ${E}_{2}^{1}$ mode and much shorter times of the ${E}_{2}^{2},$ $E1(\mathrm{TO}),$ and $A1(\mathrm{TO})$ modes. The lifetimes of the ${E}_{2}^{1},$ ${E}_{2}^{2},$ $E1(\mathrm{TO}),$ $A1(\mathrm{TO}),$ and $A1(\mathrm{LO})$ modes of an high-quality AlN crystallite are 4.4, 0.83, 0.91, 0.76, and 0.45 ps, respectively. Moreover, the lifetime of the $A1(\mathrm{LO})$ mode found in this study is consistent with the current phonon-decay model of that mode in wurtzite structure materials. The lifetimes of ${E}_{2}^{1},$ ${E}_{2}^{2},$ $E1(\mathrm{TO}),$ and $A1(\mathrm{TO})$ of a GaN crystallite were found to be 10.1, 1.4, 0.95, and 0.46 ps, respectively. The $A1(\mathrm{LO})$ mode in the GaN was not observed and its absence is attributed to plasmon damping. The lifetime shortening due to impurities was also studied: the lifetimes of the Raman modes of an AlN crystallite, which contains about two orders of magnitude more Si and C impurities relative to the concentration of the high-quality crystallite were found to be 50% shorter.}, number={20}, journal={PHYSICAL REVIEW B}, author={Bergman, L and Alexson, D and Murphy, PL and Nemanich, RJ and Dutta, M and Stroscio, MA and Balkas, C and Shin, H and Davis, RF}, year={1999}, month={May}, pages={12977–12982} } @article{bergman_dutta_balkas_davis_christman_alexson_nemanich_1999, title={Raman analysis of the E1 and A1 quasi-longitudinal optical and quasi-transverse optical modes in wurtzite AlN}, volume={85}, ISSN={["0021-8979"]}, DOI={10.1063/1.369712}, abstractNote={This article presents a study of the quasi-longitudinal optical and quasi-transverse optical modes in wurtzite AlN which originate from the interaction of phonons belonging to the A1 and E1 symmetry groups. In order to analyze the allowed quasi as well as pure Raman modes, the modes were observed in a rotating crystallographic coordinate system, and the Raman tensors of the wurtzite crystal structure were calculated as a function of the crystallographic rotation. The frequencies of the quasimodes of wurtzite AlN were also analyzed in terms of the interaction of the polar phonons with the long range electrostatic field model. The experimental values of the Raman frequencies of the quasiphonons concur with these expected from the model, implying that the long range electrostatic field dominates the short range forces for polar phonons in AlN.}, number={7}, journal={JOURNAL OF APPLIED PHYSICS}, author={Bergman, L and Dutta, M and Balkas, C and Davis, RF and Christman, JA and Alexson, D and Nemanich, RJ}, year={1999}, month={Apr}, pages={3535–3539} } @article{nipko_loong_balkas_davis_1998, title={Phonon density of states of bulk gallium nitride}, volume={73}, ISSN={["0003-6951"]}, DOI={10.1063/1.121714}, abstractNote={We report the measured phonon density of states of a bulk GaN powder by time-of-flight neutron spectroscopy. The observed one-phonon excitation spectrum consists of two broad bands centered at about 23 and 39 meV corresponding to the acoustic and the first group of optical phonons; two sharp bands of upper optic modes at about 75 and 86 meV; and a gap of 45–65 meV. The phonon dispersion curves, lattice specific heat, and Debye temperature are calculated from fitting the data with a rigid-ion model.}, number={1}, journal={APPLIED PHYSICS LETTERS}, author={Nipko, JC and Loong, CK and Balkas, CM and Davis, RF}, year={1998}, month={Jul}, pages={34–36} } @article{shmagin_muth_lee_kolbas_balkas_sitar_davis_1997, title={Optical metastability in bulk GaN single crystals}, volume={71}, ISSN={["0003-6951"]}, DOI={10.1063/1.119577}, abstractNote={Bulk GaN single crystals were grown from cold pressed GaN powder by sublimation in flowing ammonia. Optical transmission measurements indicated that the absorption coefficient for the transparent samples is 50 cm−1 in the wavelength region from 650 to 400 nm. Optical metastability in bulk GaN crystals was studied through time dependent photoluminescence both at room and liquid–nitrogen temperatures. The observation included decreasing output intensity of the ultraviolet emission attributed to the band edge and increasing output intensity of a new emission band centered at 378 nm at room temperature. At liquid–nitrogen temperature, the photoinduced emission band consisted of at least one LO-phonon replica of the zero-phonon line centered at 378 nm. The ratio of output intensities of the photoinduced band to the band edge increased by a factor of 10 during 27 min of exposure time. The photoinduced effect is attributed to the metastable nature of traps in bulk GaN.}, number={4}, journal={APPLIED PHYSICS LETTERS}, author={Shmagin, IK and Muth, JF and Lee, JH and Kolbas, RM and Balkas, CM and Sitar, Z and Davis, RF}, year={1997}, month={Jul}, pages={455–457} } @article{balkas_sitar_zheleva_bergman_nemanich_davis_1997, title={Sublimation growth and characterization of bulk aluminum nitride single crystals}, volume={179}, ISSN={["0022-0248"]}, DOI={10.1016/S0022-0248(97)00160-7}, abstractNote={Single crystalline platelets of aluminum nitride (AlN) ⩽ 1 mm thick have been grown within the temperature range of 1950–2250°C on 10 × 10 mm2 α(6H)-silicon carbide (SiC) substrates via sublimation-recondensation in a resistively heated graphite furnace. The source material was sintered AlN. A maximum growth rate of 500 μm/h was achieved at 2150°C and a source-to-seed separation of 4 mm. Growth rates below 2000°C were approximately one order of magnitude lower. Crystals grown at high temperatures ranged in color from blue to green due to the incorporation of Si and C from the SiC substrates; those grown at lower temperatures were colorless and transparent. Secondary-ion mass spectroscopy (SIMS) results showed almost a two order of magnitude decrease in the concentrations of these two impurities in the transparent crystals. Plan view transmission electron microscopy (TEM) of these crystals showed no line or planar defects. Raman spectroscopy and X-ray diffraction (XRD) studies indicated a strain free material.}, number={3-4}, journal={JOURNAL OF CRYSTAL GROWTH}, author={Balkas, CM and Sitar, Z and Zheleva, T and Bergman, L and Nemanich, R and Davis, RF}, year={1997}, month={Aug}, pages={363–370} } @inproceedings{balkas_sitar_zheleva_bergman_shmagin_muth_kolbas_nemanich_davis_1996, title={Growth of bulk AIN and GaN single crystals by sublimation}, booktitle={III-V nitrides: symposium held December 2-6, 1996, Boston, Massachusetts, U.S.A. (Materials Research Society symposia proceedings ; v. 449)}, publisher={Pittsburgh, Pa.: Materials Research Society}, author={Balkas, C. M. and Sitar, Z. and Zheleva, T. and Bergman, L. and Shmagin, I. K. and Muth, J. F. and Kolbas, R. M. and Nemanich, R. and Davis, R. F.}, year={1996}, pages={41–46} }