Works (16)

2001 journal article

Ordinary and extraordinary dielectric functions of 4H-and 6H-SiC from 3.5 to 9.0 eV

APPLIED PHYSICS LETTERS, 78(18), 2715–2717.

By: O. Lindquist, K. Jarrendahl, S. Peters, J. Zettler, C. Cobet, N. Esser, D. Aspnes, A. Henry, N. Edwards

Sources: Web Of Science, ORCID
Added: August 6, 2018

2001 journal article

Time-resolved photoluminescence in strained GaN layers

Physica Status Solidi. A, Applications and Materials Science, 183(1), 151–155.

By: G. Pozina, N. Edwards, J. Bergman, B. Monemar, M. Bremser & R. Davis

Source: NC State University Libraries
Added: August 6, 2018

2001 journal article

Time-resolved spectroscopy of strained GaN/AlN/6H-SiC heterostructures grown by metalorganic chemical vapor deposition

APPLIED PHYSICS LETTERS, 78(8), 1062–1064.

By: G. Pozina, N. Edwards, J. Bergman, T. Paskova, B. Monemar, M. Bremser, R. Davis

Source: Web Of Science
Added: August 6, 2018

2000 article

Optical characterization of wide bandgap semiconductors

Edwards, N. V., Bremser, M. D., Batchelor, A. D., Buyanova, I. A., Madsen, L. D., Yoo, S. D., … Monemar, B. (2000, March 27). THIN SOLID FILMS, Vol. 364, pp. 98–106.

By: N. Edwards, M. Bremser, A. Batchelor, I. Buyanova*, L. Madsen*, S. Yoo, T. Welhkamp, K. Wilmers* ...

author keywords: GaN; strain; valence bands; reflectance; excitons; reciprocal space analysis; spectroscopic ellipsometry
Sources: Web Of Science, ORCID
Added: August 6, 2018

2000 article

Real-time assessment of overlayer removal on 4H-SiC surfaces: Techniques and relevance to contact formation

SILICON CARBIDE AND RELATED MATERIALS - 1999 PTS, 1 & 2, Vol. 338-3, pp. 1033–1036.

By: N. Edwards, L. Madsen*, K. Robbie*, G. Powell, K. Jarrendahl, C. Cobet*, N. Esser*, W. Richter*, D. Aspnes

author keywords: cleaning; contact; spectroscopic ellipsometry; surface preparation; synchrotron
Sources: Web Of Science, ORCID
Added: August 6, 2018

2000 journal article

Real-time assessment of selected surface preparation regimens for 4H-SiC surfaces using spectroscopic ellipsometry

SURFACE SCIENCE, 464(1), L703–L707.

By: N. Edwards, K. Jarrendahl, D. Aspnes, K. Robbie*, G. Powell n, C. Cobet*, N. Esser*, W. Richter*, L. Madsen*

author keywords: contact; ellipsometry; etching; semiconducting surfaces; silicon carbide; vicinal single crystal surfaces
Sources: Web Of Science, ORCID
Added: August 6, 2018

1999 journal article

Electronic structure of the 0.88-eV luminescence center in electron-irradiated gallium nitride

Physical Review. B, Condensed Matter and Materials Physics, 60(3), 1746–1751.

By: I. Buyanova, M. Wagner, W. Chen, N. Edwards, B. Monemar, J. Lindstrom, M. Bremser, R. Davis, H. Amano, I. Akasaki

Source: NC State University Libraries
Added: August 6, 2018

1999 journal article

Relaxation phenomena in GaN/ AlN/ 6H-SiC heterostructures

MRS Internet Journal of Nitride Semiconductor Research, 4S1(G3.78).

Sources: NC State University Libraries, ORCID
Added: August 6, 2018

1998 article

Analysis of optical spectra by Fourier methods

Yoo, S. D., Edwards, N. V., & Aspnes, D. E. (1998, February). THIN SOLID FILMS, Vol. 313, pp. 143–148.

By: S. Yoo, N. Edwards & D. Aspnes

author keywords: Fourier analysis; critical points; spectroscopic ellipsometry; reflectance; filtering
Sources: Web Of Science, ORCID
Added: August 6, 2018

1998 article

Spectroscopic ellipsometry and low-temperature reflectance: complementary analysis of GaN thin films

Edwards, N. V., Yoo, S. D., Bremser, M. D., Horton, M. N., Perkins, N. R., Weeks, T. W., … Aspnes, D. E. (1998, February). THIN SOLID FILMS, Vol. 313, pp. 187–192.

By: N. Edwards, S. Yoo, M. Bremser, M. Horton*, N. Perkins*, T. Weeks, H. Liu*, R. Stall* ...

author keywords: GaN; spectroscopic ellipsometry; reflectance; valence bands; excitons; reciprocal space analysis
Sources: Web Of Science, ORCID
Added: August 6, 2018

1998 journal article

Trends in residual stress for GaN/AlN/6H-SiC heterostructures

APPLIED PHYSICS LETTERS, 73(19), 2808–2810.

By: N. Edwards, M. Bremser, R. Davis, A. Batchelor, S. Yoo, C. Karan, D. Aspnes

Sources: Web Of Science, ORCID
Added: August 6, 2018

1997 article

Growth, doping and characterization of AlxGa1-xN thin film alloys on 6H-SiC(0001) substrates

Bremser, M. D., Perry, W. G., Zheleva, T., Edwards, N. V., Nam, O. H., Parikh, N., … Davis, R. F. (1997, March). DIAMOND AND RELATED MATERIALS, Vol. 6, pp. 196–201.

By: M. Bremser, W. Perry, T. Zheleva n, N. Edwards, O. Nam, N. Parikh*, D. Aspnes, R. Davis

author keywords: GaN; alloy; AlGaN epitaxy; SiC substrates
Sources: Web Of Science, ORCID
Added: August 6, 2018

1997 conference paper

In-plane optical anisotropies of Al(x)Ga(1-x)N films in their regions of transparency

III-V nitrides: symposium held December 2-6, 1996, Boston, Massachusetts, U.S.A. (Materials Research Society symposia proceedings ; v. 449), 835–840.

By: U. Rossow n, N. Edwards, M. Bremser, R. Kern, H. Liu*, R. Davis, D. Aspnes

Sources: NC State University Libraries, ORCID
Added: August 6, 2018

1997 journal article

Spectral analysis of above-, below-, and near-bandedge phenomena in GaN thin films

MATERIALS SCIENCE AND ENGINEERING B-SOLID STATE MATERIALS FOR ADVANCED TECHNOLOGY, 50(1-3), 134–141.

By: N. Edwards, S. Yoo, M. Bremser, T. Zheleva n, M. Horton*, N. Perkins*, T. Weeks, H. Liu* ...

author keywords: GaN thin films; spectroscopic ellipsometry; bandedge phenomena
Sources: Web Of Science, ORCID
Added: August 6, 2018

1997 journal article

Variation of GaN valence bands with biaxial stress and quantification of residual stress

APPLIED PHYSICS LETTERS, 70(15), 2001–2003.

By: N. Edwards, S. Yoo, M. Bremser, T. Weeks, O. Nam, R. Davis, H. Liu, R. Stall ...

Sources: Web Of Science, ORCID
Added: August 6, 2018

1997 conference paper

Variation of GaN valence bands with biaxial stress: quantification of residual stress and impact on fundamental band parameters

III-V nitrides: symposium held December 2-6, 1996, Boston, Massachusetts, U.S.A. (Materials Research Society symposia proceedings ; v. 449), 781–786.

By: N. Edwards, S. Yoo, M. Bremser, M. Horton*, N. Perkins*, T. Weeks, H. Liu*, R. Stall* ...

Sources: NC State University Libraries, ORCID
Added: August 6, 2018