Works (4)
1999 article
Evolution of deep-level centers in p-type silicon following ion implantation at 85 K
Cho, C. R., Yarykin, N., Brown, R. A., Kononchuk, O., Rozgonyi, G. A., & Zuhr, R. A. (1999, March 1). Applied Physics Letters.
1999 journal article
In-situ photoexcitation-induced perturbations of defect complex concentration and distribution in silicon implanted with light and heavy ions
Diffusion and Defect Data. [Pt. B], Solid State Phenomena, 70(1999), 397–402.
1999 journal article
In-situ studies of point-defect complexes in silicon implanted with heavy MeV ions
Physica. B, Condensed Matter, 274(1999 Dec.), 485–488.
1999 article
The impact ofin situphotoexcitation on the formation of vacancy-type complexes in silicon implanted at 85 and 295 K
Yarykin, N., Cho, C. R., Rozgonyi, G. A., & Zuhr, R. A. (1999, July 12). Applied Physics Letters.