Works (6)
2003 article
The effects of probe boundary conditions and propagation on nano‐Raman spectroscopy
Hallen, H. D., Ayars, E. J., & Jahncke, C. L. (2003, June 1). Journal of Microscopy, Vol. 210, pp. 252–254.
2001 article
Fundamental differences between micro‐ and nano‐Raman spectroscopy
Ayars, E. J., Jahncke, C. L., Paesler, M. A., & Hallen, H. D. (2001, April 1). Journal of Microscopy, Vol. 202, pp. 142–147.
2000 article
Electric Field Gradient Effects in Raman Spectroscopy
Ayars, E. J., Hallen, H. D., & Jahncke, C. L. (2000, November 6). Physical Review Letters, Vol. 85, pp. 4180–4183.
2000 chapter
Near-field Raman spectroscopy: electric field gradient effects
In D. B. Williams & R. Shimizu (Eds.), Microbeam Analysis 2000: proceedings of the Second Conference of the International Union of Microbeam Analysis Societies held in Kailua-Kona, Hawaii, 9-14 July 2000 (Vol. 165, pp. 115–116). Bristol: Institute of Physics Publishing.
Ed(s): D. Williams & R. Shimizu
2000 article
Surface enhancement in near-field Raman spectroscopy
Ayars, E. J., & Hallen, H. D. (2000, June 26). Applied Physics Letters, Vol. 76, pp. 3911–3913.
1999 article
Proximal electromagnetic shear forces
Ayars, Aspnes, Moyer, & Paesler. (1999, October 1). Journal of Microscopy, Vol. 196, pp. 59–60.