Works (6)

Updated: July 5th, 2023 16:01

2003 journal article

The effects of probe boundary conditions and propagation on nano-Raman spectroscopy

JOURNAL OF MICROSCOPY-OXFORD, 210(3), 252–254.

By: H. Hallen n, E. Ayars* & C. Jahncke*

co-author countries: United States of America 🇺🇸

Event: at UK

author keywords: boundary conditions near a metal; electric field enhancement; gradient-field Raman; KTP; light propagation in the near-field; nano-Raman; near-field Raman spectroscopy; near-field scanning optical microscopy; resolution
Sources: Web Of Science, ORCID
Added: August 6, 2018

2001 article

Fundamental differences between micro- and nano-Raman spectroscopy

Ayars, E. J., Jahncke, C. L., Paesler, M. A., & Hallen, H. D. (2001, April). JOURNAL OF MICROSCOPY-OXFORD, Vol. 202, pp. 142–147.

By: E. Ayars n, C. Jahncke*, M. Paesler n & H. Hallen n

co-author countries: United States of America 🇺🇸

Event: at UK

author keywords: infrared spectroscopy; near-field optical microscopy; Raman spectroscopy
Sources: Web Of Science, ORCID
Added: August 6, 2018

2000 journal article

Electric field gradient effects in Raman spectroscopy

PHYSICAL REVIEW LETTERS, 85(19), 4180–4183.

By: E. Ayars n, H. Hallen n & C. Jahncke*

co-author countries: United States of America 🇺🇸
Sources: Web Of Science, ORCID
Added: August 6, 2018

2000 chapter

Near-field Raman spectroscopy: electric field gradient effects

In D. B. Williams & R. Shimizu (Eds.), Microbeam Analysis 2000: proceedings of the Second Conference of the International Union of Microbeam Analysis Societies held in Kailua-Kona, Hawaii, 9-14 July 2000 (Vol. 165, pp. 115–116). Bristol: Institute of Physics Publishing.

By: E. Ayars, M. Paesler & H. Hallen

Ed(s): D. Williams & R. Shimizu

Source: NC State University Libraries
Added: August 6, 2018

2000 journal article

Surface enhancement in near-field Raman spectroscopy

APPLIED PHYSICS LETTERS, 76(26), 3911–3913.

By: E. Ayars n & H. Hallen n

co-author countries: United States of America 🇺🇸
Sources: Web Of Science, ORCID
Added: August 6, 2018

1999 journal article

Proximal electromagnetic shear forces

Journal of Microscopy, 196(1), 59–60.

By: E. Ayars n, D. Aspnes n, P. Moyer* & M. Paesler n

co-author countries: United States of America 🇺🇸
Sources: NC State University Libraries, ORCID
Added: August 6, 2018