Eric James Ayars

Hallen, H. D., Ayars, E. J., & Jahncke, C. L. (2003). The effects of probe boundary conditions and propagation on nano-Raman spectroscopy. JOURNAL OF MICROSCOPY-OXFORD, 210(3), 252–254. https://doi.org/10.1046/j.1365-2818.2003.01138.x

Ayars, E. J., Jahncke, C. L., Paesler, M. A., & Hallen, H. D. (2001, April). Fundamental differences between micro- and nano-Raman spectroscopy. JOURNAL OF MICROSCOPY-OXFORD, Vol. 202, pp. 142–147. https://doi.org/10.1046/j.1365-2818.2001.00878.x

Ayars, E. J., Hallen, H. D., & Jahncke, C. L. (2000). Electric field gradient effects in Raman spectroscopy. PHYSICAL REVIEW LETTERS, 85(19), 4180–4183. https://doi.org/10.1103/PhysRevLett.85.4180

Ayars, E. J., Paesler, M. A., & Hallen, H. D. (2000). Near-field Raman spectroscopy: electric field gradient effects. In D. B. Williams & R. Shimizu (Eds.), Microbeam Analysis 2000: proceedings of the Second Conference of the International Union of Microbeam Analysis Societies held in Kailua-Kona, Hawaii, 9-14 July 2000 (Vol. 165, pp. 115–116). Bristol: Institute of Physics Publishing.

Ayars, E. J., & Hallen, H. D. (2000). Surface enhancement in near-field Raman spectroscopy. APPLIED PHYSICS LETTERS, 76(26), 3911–3913. https://doi.org/10.1063/1.126818

Ayars, E., Aspnes, D. E., Moyer, P., & Paesler, M. A. (1999). Proximal electromagnetic shear forces. Journal of Microscopy, 196(1), 59–60. https://doi.org/10.1046/j.1365-2818.1999.00596.x