2000 journal article

Design and integration considerations for end-of-the roadmap ultrashallow junctions

Journal of Vacuum Science & Technology. B, Microelectronics and Nanometer Structures, 18(1), 338–345.

Source: NC State University Libraries
Added: August 6, 2018

2000 journal article

Impact of gate workfunction on device performance at the 50 nm technology node

Solid-State Electronics, 44(6), 1077–1080.

By: I. De, D. Johri, A. Srivastava & C. Osburn

Source: NC State University Libraries
Added: August 6, 2018

2000 journal article

Limitations of the modified shift-and-ratio technique for extraction of the bias dependence of L-eff and R-sd of LDD MOSFET's

IEEE Transactions on Electron Devices, 47(4), 891–895.

Source: NC State University Libraries
Added: August 6, 2018

1999 journal article

Impact of super-steep-retrograde channel doping profiles on the performance of scaled devices

IEEE Transactions on Electron Devices, 46(8), 1711–1717.

By: I. De & C. Osburn

Source: NC State University Libraries
Added: August 6, 2018