2000 journal article

Ensemble Monte Carlo study of channel quantization in a 25-Nm N-Mosfet

IEEE Transactions on Electron Devices, 47(10), 1864–1872.

By: S. Williams, K. Kim & W. Holton

Source: NC State University Libraries
Added: August 6, 2018

1999 journal article

Analysis of hot-electron reliability and device performance in 80-nm double-gate SOI n-MOSFET's

IEEE Transactions on Electron Devices, 46(8), 1760–1767.

By: S. Williams, K. Kim, M. Littlejohn & W. Holton

Source: NC State University Libraries
Added: August 6, 2018