2000 journal article
Ensemble Monte Carlo study of channel quantization in a 25-nm n-MOSFET
IEEE Transactions on Electron Devices, 47(10), 1864–1872.
1999 journal article
Analysis of hot-electron reliability and device performance in 80-nm double-gate SOI n-MOSFET's
IEEE Transactions on Electron Devices, 46(8), 1760–1767.
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