2000 journal article

Ensemble Monte Carlo study of channel quantization in a 25-nm n-MOSFET

IEEE Transactions on Electron Devices, 47(10), 1864–1872.

By: S. Williams n, K. Kim n & W. Holton n

author keywords: MOSFETs; simulation; quantization
UN Sustainable Development Goal Categories
7. Affordable and Clean Energy (OpenAlex)
Sources: Web Of Science, Crossref
Added: August 6, 2018

1999 journal article

Analysis of hot-electron reliability and device performance in 80-nm double-gate SOI n-MOSFET's

IEEE Transactions on Electron Devices, 46(8), 1760–1767.

By: S. Williams n, K. Kim n, M. Littlejohn n & W. Holton n

Sources: Web Of Science, Crossref
Added: August 6, 2018

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