Stewart C. Williams

Williams, S. C., Kim, K. W., & Holton, W. C. (2000). Ensemble Monte Carlo study of channel quantization in a 25-nm n-MOSFET. IEEE Transactions on Electron Devices, 47(10), 1864–1872. https://doi.org/10.1109/16.870564

Williams, S. C., Kim, K. W., Littlejohn, M. A., & Holton, W. C. (1999). Analysis of hot-electron reliability and device performance in 80-nm double-gate SOI n-MOSFET's. IEEE Transactions on Electron Devices, 46(8), 1760–1767. https://doi.org/10.1109/16.777167