Seung-Hyun Kim

Cellulose polymorphism study with sum-frequency-generation (SFG) vibration spectroscopy: identification of exocyclic CH2OH conformation and chain orientation

Cellulose, 20(3), 991–1000.

Thickness dependence of submicron thick Pb(Zr0.3Ti0.7)O-3 films on piezoelectric properties

CERAMICS INTERNATIONAL, 34(8), 1909–1915.

Characterization of remote inductively coupled CH4-N-2 plasma for carbon nitride thin-film deposition

Journal of Applied Physics, 98(4).

Large negative magnetoresistance of the rare-earth transition-metal intermetallic compound PrMnSi2

CHEMISTRY OF MATERIALS, 17(25), 6338–6341.

Ca- and Sr-doped (Pb1-xLax)(ZryTi1-y)(1-x/4)O-3 thin films for low-voltage operation

Thin Solid Films, 394(1-2), 131–135.

Effect of hydrogen on true leakage current characteristics of (Pb,La)(Zr,Ti)O-3 thin-film capacitors with Pt- or Ir-based top electrodes

JOURNAL OF MATERIALS RESEARCH, 16(4), 1185–1189.

Electrical properties of Pb1-xLax(ZryTi1-y)(1-x/4)O-3 thin films with various iridium-based top electrodes

Integrated Ferroelectrics, 33(1-4), 155–164.

Lead zirconate titanate thin films on base-metal foils: an approach for embedded high-permittivity passive components

Journal of the American Ceramic Society, 84(10), 2436–2438.

The low-voltage-switching behavior of sol-gel-derived Pb(Zr,Ti)O-3 thin film capacitors

Integrated Ferroelectrics, 39(1-4), 963–972.

Thickness effects on imprint in chemical-solution-derived (Pb, La)(Zr, Ti)O-3 thin films

APPLIED PHYSICS LETTERS, 78(19), 2885–2887.

Influence of Pt heterostructure bottom electrodes on SrBi2Ta2O9 thin film properties

APPLIED PHYSICS LETTERS, 76(4), 496–498.

Optical properties of AlxGa1-xP (0 <= x <= 0.52) alloys

JOURNAL OF APPLIED PHYSICS, 87(3), 1287–1290.

Relaxation and leakage current characteristics of Pb1-xLax(ZryTi1-y)(1-x/4)O3 thin films with various Ir-based top electrodes

JOURNAL OF APPLIED PHYSICS, 88(11), 6690–6695.

Spatial variation of ferroelectric properties in Pb(Zr-0.3, Ti-0.7)O-3 thin films studied by atomic force microscopy

JOURNAL OF APPLIED PHYSICS, 87(11), 8031–8034.

Thermally induced voltage offsets in Pb(Zr,Ti)O-3 thin films

APPLIED PHYSICS LETTERS, 77(19), 3036–3038.

An optimized process for fabrication of SrBi2Ta2O9 thin films using a novel chemical solution deposition technique

JOURNAL OF MATERIALS RESEARCH, 14(11), 4395–4401.

Ferroelectric properties of new chemical solution derived SBT thin films for non-volatile memory devices

JOURNAL OF SOL-GEL SCIENCE AND TECHNOLOGY, 16(1-2), 57–63.

Impact of changes in the Pt heterostructure bottom electrodes on the ferroelectric properties of SBT thin films

Integrated Ferroelectrics, 26(1-4), 955–970.

Influences on imprint failure of SrBi2Ta2O9 thin film capacitors

Integrated Ferroelectrics, 25(1-4), 691–701.

Measurement and calculation of PZT thin film longitudinal piezoelectric coefficients

INTEGRATED FERROELECTRICS, Vol. 24, pp. 139–146.

Measurement of piezoelectric displacements of Pb(Zr, Ti)O-3 thin films using a double-beam interferometer

Maiwa, H., Christman, J. A., Kim, S. H., Kim, D. J., Maria, J. P., Chen, B., … Kingon, A. I. (1999, September). JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, Vol. 38, pp. 5402–5405.