2003 journal article
Combined atomic force microscopy and scanning tunneling microscopy imaging of cross-sectioned GaN light-emitting diodes
Scanning, 25(1), 45–51.
Scratching and healing investigations on self-assembled monolayers using Atomic Force Microscopy
In D. B. Williams & R. Shimizu (Eds.), Microbeam Analysis 2000: proceedings of the Second Conference of the International Union of Microbeam Analysis Societies held in Kailua-Kona, Hawaii, 9-14 July 2000 (Vol. 165, pp. 367–368). Bristol: Institute of Physics Publishing.
Ed(s): D. Williams & R. Shimizu
2000 personal communication
Thermal stability study of self-assembled monolayers on mica
1999 journal article
Comparative study of field emission-scanning electron microscopy and atomic force microscopy to assess self-assembled monolayer coverage on any type of substrate
Microscopy and Microanalysis, 5(6), 413–419.