Works (7)

Updated: July 5th, 2023 16:02

2003 journal article

Combined atomic force microscopy and scanning tunneling microscopy imaging of cross-sectioned GaN light-emitting diodes

Scanning, 25(1), 45–51.

By: J. Bender, M. Salmon & P. Russell

Source: NC State University Libraries
Added: August 6, 2018

2001 article

Self-healing on OPA self-assembled monolayers

Neves, B. R. A., Salmon, M. E., Troughton, E. B., & Russell, P. E. (2001, September). NANOTECHNOLOGY, Vol. 12, pp. 285–289.

By: B. Neves n, M. Salmon n, E. Troughton* & P. Russell n

co-author countries: Brazil 🇧🇷 United States of America 🇺🇸
Source: Web Of Science
Added: August 6, 2018

2001 journal article

Spread coating of OPA on mica: From multilayers to self-assembled monolayers

LANGMUIR, 17(26), 8193–8198.

By: B. Neves n, M. Salmon n, P. Russell n & E. Troughton n

co-author countries: United States of America 🇺🇸
Source: Web Of Science
Added: August 6, 2018

2000 chapter

Scratching and healing investigations on self-assembled monolayers using Atomic Force Microscopy

In D. B. Williams & R. Shimizu (Eds.), Microbeam Analysis 2000: proceedings of the Second Conference of the International Union of Microbeam Analysis Societies held in Kailua-Kona, Hawaii, 9-14 July 2000 (Vol. 165, pp. 367–368). Bristol: Institute of Physics Publishing.

By: B. Neves, M. Salmon, D. Leonard, E. Troughton & P. Russell

Ed(s): D. Williams & R. Shimizu

Source: NC State University Libraries
Added: August 6, 2018

2000 personal communication

Thermal stability study of self-assembled monolayers on mica

By: B. Neves, M. Salmon, P. Russell & E. Troughton

Source: NC State University Libraries
Added: August 6, 2018

1999 journal article

Comparative study of field emission-scanning electron microscopy and atomic force microscopy to assess self-assembled monolayer coverage on any type of substrate

MICROSCOPY AND MICROANALYSIS, 5(6), 413–419.

By: B. Neves n, M. Salmon n, P. Russell n & E. Troughton*

co-author countries: United States of America 🇺🇸
author keywords: field emission-scanning electron microscopy; atomic force microscopy; scanning probe microscopy; self-assembled monolayers; octadecylphosphonic acid
Source: Web Of Science
Added: August 6, 2018

1999 journal article

Observation of topography inversion in atomic force microscopy of self-assembled monolayers

NANOTECHNOLOGY, 10(4), 399–404.

By: B. Neves n, D. Leonard n, M. Salmon n, P. Russell n & E. Troughton*

co-author countries: United States of America 🇺🇸
Source: Web Of Science
Added: August 6, 2018

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