Michael E. Salmon

Works (7)

Updated: July 5th, 2023 16:02

2003 journal article

Combined atomic force microscopy and scanning tunneling microscopy imaging of cross-sectioned GaN light-emitting diodes

Scanning, 25(1), 45–51.

By: J. Bender, M. Salmon & P. Russell

Source: NC State University Libraries
Added: August 6, 2018

2001 article

Self-healing on OPA self-assembled monolayers

Neves, B. R. A., Salmon, M. E., Troughton, E. B., & Russell, P. E. (2001, August 23). Nanotechnology.

By: B. Neves n, M. Salmon n, E. Troughton* & P. Russell n

topics (OpenAlex): Molecular Junctions and Nanostructures; Polymer Surface Interaction Studies; Force Microscopy Techniques and Applications
Source: Web Of Science
Added: August 6, 2018

2001 article

Spread Coating of OPA on Mica:  From Multilayers to Self-Assembled Monolayers

Neves, B. R. A., Salmon, M. E., Russell, P. E., & Troughton, E. B. (2001, November 28). Langmuir.

By: B. Neves n, M. Salmon n, P. Russell n & E. Troughton n

topics (OpenAlex): Molecular Junctions and Nanostructures; Polymer Surface Interaction Studies; Force Microscopy Techniques and Applications
Source: Web Of Science
Added: August 6, 2018

2000 chapter

Scratching and healing investigations on self-assembled monolayers using Atomic Force Microscopy

In D. B. Williams & R. Shimizu (Eds.), Microbeam Analysis 2000: proceedings of the Second Conference of the International Union of Microbeam Analysis Societies held in Kailua-Kona, Hawaii, 9-14 July 2000 (Vol. 165, pp. 367–368). Bristol: Institute of Physics Publishing.

By: B. Neves, M. Salmon, D. Leonard, E. Troughton & P. Russell

Ed(s): D. Williams & R. Shimizu

Source: NC State University Libraries
Added: August 6, 2018

2000 personal communication

Thermal stability study of self-assembled monolayers on mica

By: B. Neves, M. Salmon, P. Russell & E. Troughton

Source: NC State University Libraries
Added: August 6, 2018

1999 article

Comparative Study of Field Emission-Scanning Electron Microscopy and Atomic Force Microscopy to Assess Self-assembled Monolayer Coverage on Any Type of Substrate

Neves, B. R. A., Salmon, M. E., Russell, P. E., & Troughton, E. B. (1999, November 1). Microscopy and Microanalysis.

By: B. Neves n, M. Salmon n, P. Russell n & E. Troughton*

author keywords: field emission-scanning electron microscopy; atomic force microscopy; scanning probe microscopy; self-assembled monolayers; octadecylphosphonic acid
topics (OpenAlex): Molecular Junctions and Nanostructures; Surface and Thin Film Phenomena; Force Microscopy Techniques and Applications
TL;DR: It is shown how field emission-scanning electron microscopy (FE-SEM) can be a useful tool for the study of self-assembled monolayer systems and is capable of unambiguously identifyingSAMs on any type of substrate, whereas AFM has significant difficulties in identifying SAMs on rough surfaces. (via Semantic Scholar)
Source: Web Of Science
Added: August 6, 2018

1999 article

Observation of topography inversion in atomic force microscopy of self-assembled monolayers

Neves, B. R. A., Leonard, D. N., Salmon, M. E., Russell, P. E., & Troughton, E. B. (1999, December 1). Nanotechnology.

By: B. Neves n, D. Leonard n, M. Salmon n, P. Russell n & E. Troughton*

topics (OpenAlex): Force Microscopy Techniques and Applications; Molecular Junctions and Nanostructures; Mechanical and Optical Resonators
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Source: Web Of Science
Added: August 6, 2018

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