2003 journal article
Combined atomic force microscopy and scanning tunneling microscopy imaging of cross-sectioned GaN light-emitting diodes
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Self-healing on OPA self-assembled monolayers
Neves, B. R. A., Salmon, M. E., Troughton, E. B., & Russell, P. E. (2001, September). NANOTECHNOLOGY, Vol. 12, pp. 285–289.
Scratching and healing investigations on self-assembled monolayers using Atomic Force Microscopy
In D. B. Williams & R. Shimizu (Eds.), Microbeam Analysis 2000: proceedings of the Second Conference of the International Union of Microbeam Analysis Societies held in Kailua-Kona, Hawaii, 9-14 July 2000 (Vol. 165, pp. 367–368). Bristol: Institute of Physics Publishing.
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2000 personal communication
Thermal stability study of self-assembled monolayers on mica
1999 journal article
Comparative study of field emission-scanning electron microscopy and atomic force microscopy to assess self-assembled monolayer coverage on any type of substrate
MICROSCOPY AND MICROANALYSIS, 5(6), 413–419.