Klaus Flock

Flock, K., Kim, S. J., Asar, M., Kim, I. K., & Aspnes, D. E. (2004, May 1). Integrated rotating-compensator polarimeter for real-time measurements and analysis of organometallic chemical vapor deposition. THIN SOLID FILMS, Vol. 455, pp. 639–644. https://doi.org/10.1016/j.tsf.2004.01.069

Kim, S., Flock, K. L., Asar, M., Kim, I. K., & Aspnes, D. E. (2004). Real-time characterization of GaSb homo- and heteroepitaxy. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, Vol. 22, pp. 2233–2239. https://doi.org/10.1116/1.1771669

Flock, K. (2004, May 1). The simultaneous determination of n, k, and t from polarimetric data. THIN SOLID FILMS, Vol. 455, pp. 349–355. https://doi.org/10.1016/j.tsf.2004.01.022

Blickle, V., Flock, K., Dietz, N., & Aspnes, D. E. (2002). Pseudodielectric function of ZnGeP2 from 1.5 to 6 eV. APPLIED PHYSICS LETTERS, 81(4), 628–630. https://doi.org/10.1063/1.1492022

Ebert, M., Bell, K. A., Flock, K., & Aspnes, D. E. (2001). Investigation and control of MOVPE growth by combined spectroscopic ellipsometry and reflectance-difference spectroscopy. PHYSICA STATUS SOLIDI A-APPLIED RESEARCH, 184(1), 79–87. https://doi.org/10.1002/1521-396x(200103)184:1<79::aid-pssa79>3.0.co;2-b

Ebert, M., Bell, K. A., Yoo, S. D., Flock, K., & Aspnes, D. E. (2000, March 27). In situ monitoring of MOVPE growth by combined spectroscopic ellipsometry and reflectance-difference spectroscopy. THIN SOLID FILMS, Vol. 364, pp. 22–27. https://doi.org/10.1016/S0040-6090(99)00920-7

Bell, K. A., Ebert, M., Yoo, S. D., Flock, K., & Aspnes, D. E. (2000). Real-time optical characterization of heteroepitaxy by organometallic chemical vapor deposition. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A, Vol. 18, pp. 1184–1189. https://doi.org/10.1116/1.582323

Bell, K. A., Ebert, M., Yoo, S. D., Flock, K., & Aspnes, D. E. (2000, January). Real-time optical techniques and QMS to characterize growth in a modified commercial OMVPE reactor. JOURNAL OF ELECTRONIC MATERIALS, Vol. 29, pp. 106–111. https://doi.org/10.1007/s11664-000-0104-6