@article{huerth_hallen_2003, title={Quantitative method of image analysis when drift is present in a scanning probe microscope}, volume={21}, number={2}, journal={Journal of Vacuum Science & Technology. B, Microelectronics and Nanometer Structures}, author={Huerth, S. H. and Hallen, H. D.}, year={2003}, pages={714–718} }
 @article{huerth_hallen_moeckly_2003, title={Spectroscopy of voltage dependence of oxygen movement in YBa2Cu3O7-delta}, volume={67}, number={18}, journal={Physical Review. B, Condensed Matter and Materials Physics}, author={Huerth, S. H. and Hallen, H. D. and Moeckly, B.}, year={2003}, pages={180506–1} }
 @article{jahncke_huerth_clark_hallen_2002, title={Dynamics of the tip-sample interaction in near-field scanning optical microscopy and the implications for shear force as an accurate distance measure}, volume={81}, ISSN={["1077-3118"]}, url={http://dx.doi.org/10.1063/1.1520711}, DOI={10.1063/1.1520711}, abstractNote={Near-field scanning optical microscopy uses shear-force feedback as the primary method to control the probe–sample distance. We describe the nonlinear interaction between the tip and sample with a simple truncated driven harmonic oscillator model. The model accurately describes the measured dynamics of this system. Insights are gained into the mechanism behind this interaction, and we give strong evidence that the probe taps on sample surface adlayers in normal operation, but will tap the underlying sample surface when the oscillation is nearly quenched.}, note={Also appeared in the Virtual Journal of Nanoscience and Technology 6 (22), (2002).}, number={21}, journal={APPLIED PHYSICS LETTERS}, author={Jahncke, CL and Huerth, SH and Clark, B and Hallen, HD}, year={2002}, month={Nov}, pages={4055–4057} }
 @article{huerth_taylor_hallen_moeckly_2000, title={Electromigration in YBa2Cu3O7-delta using a metal clad near-field scanning optical microscope probe}, volume={77}, ISSN={["0003-6951"]}, url={http://dx.doi.org/10.1063/1.1314296}, DOI={10.1063/1.1314296}, abstractNote={Electromigration or electron-induced-migration (EIM) of oxygen in the hightemperature superconductor YBa2Cu3O7−δ alters the superconducting properties through variations in the oxygen concentration. We study this process with unprecedented spatial resolution and find that the transport of oxygen through a grain boundary into a neighboring grain is unlikely, and that hot electron effects dominate the mechanism for EIM in this system. The extent of the EIM effects implies that grain boundary scattering is strong for these electrons. EIM is induced with the tunnel current from the metal cladding on a near-field optical microscope (NSOM). Variations in the oxygen concentration due to fabrication, aging, and electromigration are imaged optically and corroborated to the grain structure.}, number={14}, journal={APPLIED PHYSICS LETTERS}, author={Huerth, SH and Taylor, MP and Hallen, HD and Moeckly, BH}, year={2000}, month={Oct}, pages={2127–2129} }