2004 journal article
A spectroscopic phase separation study distinguishing between chemical with different degrees of crystallinity in Zr(Hf) silicate alloys
Surface Science, 566(Sep 20 2004), 772–776.
2004 journal article
A spectroscopic study distinguishing between chemical phase separation with different degrees of crystallinity in Hf(Zr) silicate alloys
Applied Surface Science, 234(37990), 429–433.
2004 journal article
Chemical phase separation in Zr silicate alloys: a spectroscopic study distinguishing between chemical phase separation with different degree of micro- and nano-crystallinity
Microelectronic Engineering, 72(04-Jan), 304–309.
2004 journal article
Chemical phase separation in Zr silicate alloys: a spectroscopic study distinguishing between chemical phase separation with different degrees of micro- and nano-crystallinity
Journal of Non-Crystalline Solids, 338-40(Jun 15 2004), 151–154.
2003 journal article
Band offset energies in zirconium silicate Si alloys
Applied Surface Science, 216(04-Jan), 215–222.
2003 journal article
Device-quality GaN-dielectric interfaces by 300 degrees C remote plasma processing
Applied Surface Science, 216(04-Jan), 119–123.
2002 journal article
Electronic structure of high-k transition metal oxides and their silicate and aluminate alloys
Journal of Vacuum Science & Technology. B, Microelectronics and Nanometer Structures, 20(4), 1739–1747.
2002 journal article
Nonlinear composition dependence of x-ray photoelectron spectroscopy and Auger electron spectroscopy features in plasma-deposited zirconium silicate alloy thin films
Journal of Vacuum Science & Technology. B, Microelectronics and Nanometer Structures, 20(4), 1748–1758.
2001 journal article
Chemical and physical limits on the performance of metal silicate high-k gate dielectrics
Microelectronics Reliability, 41(7), 937–945.
2001 journal article
Electronic structure of noncrystalline transition metal silicate and aluminate alloys
Applied Physics Letters, 79(12), 1775–1777.
2000 journal article
Microscopic model for enhanced dielectric constants in low concentration SiO2-rich noncrystalline Zr and Hf silicate alloys
Applied Physics Letters, 77(18), 2912–2914.