2001 journal article
Investigation and control of MOVPE growth by combined spectroscopic ellipsometry and reflectance-difference spectroscopy
PHYSICA STATUS SOLIDI A-APPLIED RESEARCH, 184(1), 79–87.
Coherence effects and time dependences of the optical response of surfaces and interfaces of optically absorbing materials
Aspnes, D. E., Mantese, L., Bell, K. A., & Rossow, U. (2000, July). PHYSICA STATUS SOLIDI B-BASIC SOLID STATE PHYSICS, Vol. 220, pp. 709–715.
In situ monitoring of MOVPE growth by combined spectroscopic ellipsometry and reflectance-difference spectroscopy
Ebert, M., Bell, K. A., Yoo, S. D., Flock, K., & Aspnes, D. E. (2000, March 27). THIN SOLID FILMS, Vol. 364, pp. 22–27.
Real-time optical techniques and QMS to characterize growth in a modified commercial OMVPE reactor
Bell, K. A., Ebert, M., Yoo, S. D., Flock, K., & Aspnes, D. E. (2000, January). JOURNAL OF ELECTRONIC MATERIALS, Vol. 29, pp. 106–111.
1999 journal article
Linear optical properties of Si surfaces and nanostructures
Physica Status Solidi. B, Basic Solid State Physics, 215(1), 725–729.
Interpretation of critical point energy shifts in crystalline Si by near-surface localization of excited electronic states
Mantese, L., Bell, K. A., Rossow, U., & Aspnes, D. E. (1998, February). THIN SOLID FILMS, Vol. 313, pp. 557–560.
1998 journal article
Many-body and correlation effects in surface and interface spectra of optically absorbing materials
Physica Status Solidi. A, Applications and Materials Science, 170(2), 199–210.
Systematic differences among nominal reference dielectric function spectra for crystalline Si as determined by spectroscopic ellipsometry
Bell, K. A., Mantese, L., Rossow, U., & Aspnes, D. E. (1998, February). THIN SOLID FILMS, Vol. 313, pp. 161–166.