2001 journal article

Investigation and control of MOVPE growth by combined spectroscopic ellipsometry and reflectance-difference spectroscopy

PHYSICA STATUS SOLIDI A-APPLIED RESEARCH, 184(1), 79–87.

By: M. Ebert n, K. Bell, K. Flock & D. Aspnes

Sources: Web Of Science, ORCID
Added: August 6, 2018

2000 article

Coherence effects and time dependences of the optical response of surfaces and interfaces of optically absorbing materials

Aspnes, D. E., Mantese, L., Bell, K. A., & Rossow, U. (2000, July). PHYSICA STATUS SOLIDI B-BASIC SOLID STATE PHYSICS, Vol. 220, pp. 709–715.

By: D. Aspnes, L. Mantese, K. Bell & U. Rossow*

Sources: Web Of Science, ORCID
Added: August 6, 2018

2000 article

In situ monitoring of MOVPE growth by combined spectroscopic ellipsometry and reflectance-difference spectroscopy

Ebert, M., Bell, K. A., Yoo, S. D., Flock, K., & Aspnes, D. E. (2000, March 27). THIN SOLID FILMS, Vol. 364, pp. 22–27.

By: M. Ebert n, K. Bell, S. Yoo, K. Flock & D. Aspnes

author keywords: real-time monitoring; metalorganic vapor phase epitaxy; growth control; spectroscopic ellipsometry; reflectance-difference spectroscopy; silicon (Si); gallium phosphide (GaP)
Sources: Web Of Science, ORCID
Added: August 6, 2018

2000 article

Real-time optical characterization of heteroepitaxy by organometallic chemical vapor deposition

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A, Vol. 18, pp. 1184–1189.

By: K. Bell, M. Ebert, S. Yoo, K. Flock & D. Aspnes

Sources: Web Of Science, ORCID
Added: August 6, 2018

2000 article

Real-time optical techniques and QMS to characterize growth in a modified commercial OMVPE reactor

Bell, K. A., Ebert, M., Yoo, S. D., Flock, K., & Aspnes, D. E. (2000, January). JOURNAL OF ELECTRONIC MATERIALS, Vol. 29, pp. 106–111.

By: K. Bell, M. Ebert n, S. Yoo, K. Flock & D. Aspnes

author keywords: real-time monitoring; organometallic vapor phase epitaxy; quadrupole mass spectrometry; spectroscopic ellipsometry; reflectance-difference spectroscopy; silicon (Si); gallium phosphide (GaP)
Sources: Web Of Science, ORCID
Added: August 6, 2018

1999 journal article

Linear optical properties of Si surfaces and nanostructures

Physica Status Solidi. B, Basic Solid State Physics, 215(1), 725–729.

By: U. Rossow, L. Mantese, D. Aspnes, K. Bell & M. Ebert

Source: NC State University Libraries
Added: August 6, 2018

1999 journal article

Photon-induced localization in optically absorbing materials

PHYSICS LETTERS A, 253(1-2), 93–97.

By: L. Mantese, K. Bell, D. Aspnes & U. Rossow*

author keywords: localization; surface optical absorption
Sources: Web Of Science, ORCID
Added: August 6, 2018

1998 article

Interpretation of critical point energy shifts in crystalline Si by near-surface localization of excited electronic states

Mantese, L., Bell, K. A., Rossow, U., & Aspnes, D. E. (1998, February). THIN SOLID FILMS, Vol. 313, pp. 557–560.

By: L. Mantese, K. Bell, U. Rossow* & D. Aspnes

author keywords: localization; wave packet
Sources: Web Of Science, ORCID
Added: August 6, 2018

1998 journal article

Many-body and correlation effects in surface and interface spectra of optically absorbing materials

Physica Status Solidi. A, Applications and Materials Science, 170(2), 199–210.

By: D. Aspnes, L. Mantese, K. Bell & U. Rossow

Source: NC State University Libraries
Added: August 6, 2018

1998 article

Photon-induced localization and final-state correlation effects in optically absorbing materials

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, Vol. 16, pp. 2367–2372.

By: D. Aspnes, L. Mantese, K. Bell & U. Rossow

Sources: Web Of Science, ORCID
Added: August 6, 2018

1998 article

Systematic differences among nominal reference dielectric function spectra for crystalline Si as determined by spectroscopic ellipsometry

Bell, K. A., Mantese, L., Rossow, U., & Aspnes, D. E. (1998, February). THIN SOLID FILMS, Vol. 313, pp. 161–166.

By: K. Bell, L. Mantese, U. Rossow n & D. Aspnes

author keywords: ellipsometry; optical modeling; dielectric function; silicon
Sources: Web Of Science, ORCID
Added: August 6, 2018

1997 article

Evidence of near-surface localization of excited electronic states in crystalline Si

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, Vol. 15, pp. 1196–1200.

By: L. Mantese, K. Bell, U. Rossow & D. Aspnes

Sources: Web Of Science, ORCID
Added: August 6, 2018

1997 article

Surface and interface effects on ellipsometric spectra of crystalline Si

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, Vol. 15, pp. 1205–1211.

By: K. Bell, L. Mantese, U. Rossow & D. Aspnes

Sources: Web Of Science, ORCID
Added: August 6, 2018