Kimberly Anne Bell

Ebert, M., Bell, K. A., Flock, K., & Aspnes, D. E. (2001). Investigation and control of MOVPE growth by combined spectroscopic ellipsometry and reflectance-difference spectroscopy. PHYSICA STATUS SOLIDI A-APPLIED RESEARCH, 184(1), 79–87. https://doi.org/10.1002/1521-396x(200103)184:1<79::aid-pssa79>3.0.co;2-b

Aspnes, D. E., Mantese, L., Bell, K. A., & Rossow, U. (2000, July). Coherence effects and time dependences of the optical response of surfaces and interfaces of optically absorbing materials. PHYSICA STATUS SOLIDI B-BASIC SOLID STATE PHYSICS, Vol. 220, pp. 709–715. https://doi.org/10.1002/1521-3951(200007)220:1<709::aid-pssb709>3.0.co;2-d

Ebert, M., Bell, K. A., Yoo, S. D., Flock, K., & Aspnes, D. E. (2000, March 27). In situ monitoring of MOVPE growth by combined spectroscopic ellipsometry and reflectance-difference spectroscopy. THIN SOLID FILMS, Vol. 364, pp. 22–27. https://doi.org/10.1016/S0040-6090(99)00920-7

Bell, K. A., Ebert, M., Yoo, S. D., Flock, K., & Aspnes, D. E. (2000). Real-time optical characterization of heteroepitaxy by organometallic chemical vapor deposition. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A, Vol. 18, pp. 1184–1189. https://doi.org/10.1116/1.582323

Bell, K. A., Ebert, M., Yoo, S. D., Flock, K., & Aspnes, D. E. (2000, January). Real-time optical techniques and QMS to characterize growth in a modified commercial OMVPE reactor. JOURNAL OF ELECTRONIC MATERIALS, Vol. 29, pp. 106–111. https://doi.org/10.1007/s11664-000-0104-6

Rossow, U., Mantese, L., Aspnes, D. E., Bell, K. A., & Ebert, M. (1999). Linear optical properties of Si surfaces and nanostructures. Physica Status Solidi. B, Basic Solid State Physics, 215(1), 725–729.

Mantese, L., Bell, K. A., Aspnes, D. E., & Rossow, U. (1999). Photon-induced localization in optically absorbing materials. PHYSICS LETTERS A, 253(1-2), 93–97. https://doi.org/10.1016/S0375-9601(98)00953-0

Mantese, L., Bell, K. A., Rossow, U., & Aspnes, D. E. (1998, February). Interpretation of critical point energy shifts in crystalline Si by near-surface localization of excited electronic states. THIN SOLID FILMS, Vol. 313, pp. 557–560. https://doi.org/10.1016/S0040-6090(97)00883-3

Aspnes, D. E., Mantese, L., Bell, K. A., & Rossow, U. (1998). Many-body and correlation effects in surface and interface spectra of optically absorbing materials. Physica Status Solidi. A, Applications and Materials Science, 170(2), 199–210.

Aspnes, D. E., Mantese, L., Bell, K. A., & Rossow, U. (1998). Photon-induced localization and final-state correlation effects in optically absorbing materials. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, Vol. 16, pp. 2367–2372. https://doi.org/10.1116/1.590176

Bell, K. A., Mantese, L., Rossow, U., & Aspnes, D. E. (1998, February). Systematic differences among nominal reference dielectric function spectra for crystalline Si as determined by spectroscopic ellipsometry. THIN SOLID FILMS, Vol. 313, pp. 161–166. https://doi.org/10.1016/S0040-6090(97)00804-3

Mantese, L., Bell, K. A., Rossow, U., & Aspnes, D. E. (1997). Evidence of near-surface localization of excited electronic states in crystalline Si. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, Vol. 15, pp. 1196–1200. https://doi.org/10.1116/1.589438

Bell, K. A., Mantese, L., Rossow, U., & Aspnes, D. E. (1997). Surface and interface effects on ellipsometric spectra of crystalline Si. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, Vol. 15, pp. 1205–1211. https://doi.org/10.1116/1.589440