Alexei Gruverman

Gruverman, A., Wu, D., Fan, H. J., Vrejoiu, I., Alexe, M., Harrison, R. J., & Scott, J. F. (2008). Vortex ferroelectric domains. Journal of Physics. Condensed Matter, 20(34).

Yang, Z., Lichtenwalner, D., Morris, A., Menzel, S., Nauenheim, C., Gruverman, A., … Kingon, A. I. (2007). A new test facility for efficient evaluation of MEMS contact materials. JOURNAL OF MICROMECHANICS AND MICROENGINEERING, 17(9), 1788–1795. https://doi.org/10.1088/0960-1317/17/9/006

Gruverman, A., Wu, D., Rodriguez, B. J., Kalinin, S. V., & Habelitz, S. (2007). High-resolution imaging of proteins in human teeth by scanning probe microscopy. BIOCHEMICAL AND BIOPHYSICAL RESEARCH COMMUNICATIONS, 352(1), 142–146. https://doi.org/10.1016/j.bbrc.2006.10.182

Habelitz, S., Rodriguez, B. J., Marshall, S. J., Marshall, G. W., Kalinin, S. V., & Gruverman, A. (2007). Peritubular dentin lacks piezoelectricity. JOURNAL OF DENTAL RESEARCH, 86(9), 908–911. https://doi.org/10.1177/154405910708600920

Watanabe, T., Funakubo, H., Osada, M., Uchida, H., Okada, I., Rodriguez, B. J., & Gruverman, A. (2007). Probing intrinsic polarization properties in bismuth-layered ferroelectric films. Applied Physics Letters, 90(11).

Cross, J. S., Tsukada, M., Horii, Y., Gruverman, A., & Kingon, A. (2007). Semiconductor device and its manufacture method, and measurement fixture for the semiconductor device. Washington, DC: U.S. Patent and Trademark Office.

Cross, J. S., Tsukada, M., Horii, Y., Gruverman, A., & Kingon, A. (2007). Semiconductor device having die attachment and die pad for applying tensile or compressive stress to the IC chip. Washington, DC: U.S. Patent and Trademark Office.

Kalinin, S. V., Baddorf, A. P., Lee, H. N., Shin, J., Gruverman, A. L., Karapetian, E., & Kachanov, M. (2007). Ultrahigh density ferroelectric storage and lithography by high order ferroic switching. Washington, DC: U.S. Patent and Trademark Office.

Kalinin, S. V., Rodriguez, B. J., Shin, J., Jesse, S., Grichko, V., Thundat, T., … Gruverman, A. (2006). Bioelectromechanical imaging by scanning probe microscopy: Galvani's experiment at the nanoscale. ULTRAMICROSCOPY, 106(4-5), 334–340. https://doi.org/10.1016/j.ultramic.2005.10.005

Rodriguez, B. J., Kalinin, S. V., Shin, J., Jesse, S., Grichko, V., Thundat, T., … Gruverman, A. (2006). Electromechanical imaging of biomaterials by scanning probe microscopy. JOURNAL OF STRUCTURAL BIOLOGY, 153(2), 151–159. https://doi.org/10.1016/j.jsb.2005.10.008

Hanson, J. N., Rodriguez, B. J., Nemanich, R. J., & Gruverman, A. (2006). Fabrication of metallic nanowires on a ferroelectric template via photochemical reaction. NANOTECHNOLOGY, 17(19), 4946–4949. https://doi.org/10.1088/0957-4484/17/19/028

Kim, T., Hanson, J. N., Gruverman, A., Kingon, A. I., & Streiffer, S. K. (2006). Ferroelectric behavior in nominally relaxor lead lanthanum zirconate titanate thin films prepared by chemical solution deposition on copper foil. Applied Physics Letters, 88(26).

Gruverman, A., & Kholkin, A. (2006). Introduction to the special issue on nanoscale ferroelectrics. IEEE Transactions on Ultrasonics Ferroelectrics and Frequency Control, 53(12), 2206–2207.

Gruverman, A., & Kholkin, A. (2006). [Review of Nanoscale ferroelectrics: processing, characterization and future trends]. Reports on Progress in Physics, 69(8), 2443–2474.

Gruverman, A., & Kalinin, S. V. (2006). Piezoresponse force microscopy and recent advances in nanoscale studies of ferroelectrics. JOURNAL OF MATERIALS SCIENCE, 41(1), 107–116. https://doi.org/10.1007/s10853-005-5946-0

Cross, J. S., Tsukada, M., Horii, Y., Gruverman, A., & Kingon, A. (2006). Semiconductor device having a stress layer for applying tensile of compressive stress to the ferroelectric film. Washington, DC: U.S. Patent and Trademark Office.

Dawber, M., Gruverman, A., & Scott, J. F. (2006). Skyrmion model of nano-domain nucleation in ferroelectrics and ferromagnets. JOURNAL OF PHYSICS-CONDENSED MATTER, 18(5), L71–L79. https://doi.org/10.1088/0953-8984/18/5/L03

Balke, N., Lupascu, D. C., Blair, T., & Gruverman, A. (2006). Thickness profiles through fatigued bulk ceramic lead zirconate titanate. Journal of Applied Physics, 100(11).

Kalinin, S. V., Rodriguez, B. J., Jesse, S., Shin, J., Baddorf, A. P., Gupta, P., … Gruverman, A. (2006). Vector piezoresponse force microscopy. MICROSCOPY AND MICROANALYSIS, 12(3), 206–220. https://doi.org/10.1017/S1431927606060156

Dehoff, C., Rodriguez, B. J., Kingon, A. I., Nemanich, R. J., Gruverman, A., & Cross, J. S. (2005). Atomic force microscopy-based experimental setup for studying domain switching dynamics in ferroelectric capacitors. REVIEW OF SCIENTIFIC INSTRUMENTS, 76(2). https://doi.org/10.1063/1.1850652

Gruverman, A., Rodriguez, B. J., Dehoff, C., Waldrep, J. D., Kingon, A. I., Nemanich, R. J., & Cross, J. S. (2005). Direct studies of domain switching dynamics in thin film ferroelectric capacitors. APPLIED PHYSICS LETTERS, 87(8). https://doi.org/10.1063/1.2010605

Rodriguez, B. J., Nemanich, R. J., Kingon, A., Gruverman, A., Kalinin, S. V., Terabe, K., … Kitamura, K. (2005). Domain growth kinetics in lithium niobate single crystals studied by piezoresponse force microscopy. APPLIED PHYSICS LETTERS, 86(1). https://doi.org/10.1063/1.1845594

Kalinin, S. V., Rodriguez, B. J., Jesse, S., Thundat, T., & Gruverman, A. (2005). Electromechanical imaging of biological systems with sub-10 nm resolution. Applied Physics Letters, 87(5).

Rodriguez, B. J., Gruverman, A., Kingon, A. I., Nemanich, R. J., & Cross, J. S. (2005). Investigation of the mechanism of polarization switching in ferroelectric capacitors by three- dimensional piezoresponse force microscopy. APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING, 80(1), 99–103. https://doi.org/10.1007/s00339-004-2925-2

Kalinin, S. V., Gruverman, A., Rodriguez, B. J., Shin, J., Baddorf, A. P., Karapetian, E., & Kachanov, M. (2005). Nanoelectromechanics of polarization switching in piezoresponse force microscopy. Journal of Applied Physics, 97(7).

Nagarajan, V., Aggarwal, S., Gruverman, A., Ramesh, R., & Waser, R. (2005). Nanoscale polarization relaxation in a polycrystalline ferroelectric thin film: Role of local environments. Applied Physics Letters, 86(26).

Yang, W. C., Rodriguez, B. J., Gruverman, A., & Nemanich, R. J. (2005, April 27). Photo electron emission microscopy of polarity-patterned materials. JOURNAL OF PHYSICS-CONDENSED MATTER, Vol. 17, pp. S1415–S1426. https://doi.org/10.1088/0953-8984/17/16/012

Rodriguez, B. J., Yang, W. C., Nemanich, R. J., & Gruverman, A. (2005). Scanning probe investigation of surface charge and surface potential of GaN-based heterostructures. APPLIED PHYSICS LETTERS, 86(11). https://doi.org/10.1063/1.1869535

Shin, J., Rodriguez, B. J., Baddorf, A. P., Thundat, T., Karapetian, E., Kachanov, M., … Kalinin, S. V. (2005). Simultaneous elastic and electromechanical imaging by scanning probe microscopy: Theory and applications to ferroelectric and biological materials. Journal of Vacuum Science & Technology. B, Microelectronics and Nanometer Structures, 23(5), 2102–2108.

Gruverman, A., Cao, W., Bhaskar, S., & Dey, S. K. (2004). Investigation of Pb(Zr,Ti)O-3/GaN heterostructures by scanning probe microscopy. APPLIED PHYSICS LETTERS, 84(25), 5153–5155. https://doi.org/10.1063/1.1765740

Yang, W. C., Rodriguez, B. J., Gruverman, A., & Nemanich, R. J. (2004). Polarization-dependent electron affinity of LiNbO3 surfaces. APPLIED PHYSICS LETTERS, 85(12), 2316–2318. https://doi.org/10.1063/1.1790604

Kalinin, S. V., Gruverman, A., & Bonnell, D. A. (2004). Quantitative analysis of nanoscale switching in SrBi2Ta2O9 thin films by piezoresponse force microscopy. APPLIED PHYSICS LETTERS, 85(5), 795–797. https://doi.org/10.1063/1.1775881

Rodriguez, B. J., Gruverman, A., Kingon, A. I., Nemanich, R. J., & Cross, J. S. (2004). Three-dimensional high-resolution reconstruction of polarization in ferroelectric capacitors by piezoresponse force microscopy. JOURNAL OF APPLIED PHYSICS, 95(4), 1958–1962. https://doi.org/10.1063/1.1638889

Gruverman, A., Rodriguez, B. J., Kingon, A. I., Nemanich, R. J., Tagantsev, A. K., Cross, J. S., & Tsukada, M. (2003). Mechanical stress effect on imprint behavior of integrated ferroelectric capacitors. APPLIED PHYSICS LETTERS, 83(4), 728–730. https://doi.org/10.1063/1.1593830

Kelman, M. B., McIntyre, P. C., Gruverman, A., Hendrix, B. C., Bilodeau, S. M., & Roeder, J. F. (2003). Origin and implications of the observed rhombohedral phase in nominally tetragonal Pb(Zr0.35Ti0.65)O-3 thin films. JOURNAL OF APPLIED PHYSICS, 94(8), 5210–5219. https://doi.org/10.1063/1.1610773

Gruverman, A., Rodriguez, B. J., Kingon, A. I., Nemanich, R. J., Cross, J. S., & Tsukada, M. (2003). Spatial inhomogeneity of imprint and switching behavior in ferroelectric capacitors. APPLIED PHYSICS LETTERS, 82(18), 3071–3073. https://doi.org/10.1063/1.1570942

Kim, S., Gopalan, V., & Gruverman, A. (2002). Coercive fields in ferroelectrics: A case study in lithium niobate and lithium tantalate. APPLIED PHYSICS LETTERS, 80(15), 2740–2742. https://doi.org/10.1063/1.1470247

Gruverman, A. (2002). Ferroelectric film property measuring device, measuring method therefor and measuring method for semiconductor memory units. Washington, DC: U.S. Patent and Trademark Office.

Terabe, K., Takekawa, S., Nakamura, M., Kitamura, K., Higuchi, S., Gotoh, Y., & Gruverman, A. (2002). Imaging and engineering the nanoscale-domain structure of a Sr0.61Ba0.39Nb2O6 crystal using a scanning force microscope. APPLIED PHYSICS LETTERS, 81(11), 2044–2046. https://doi.org/10.1063/1.1506945

Gruverman, A., Rodriguez, B. J., Nemanich, R. J., & Kingon, A. I. (2002). Nanoscale observation of photoinduced domain pinning and investigation of imprint behavior in ferroelectric thin films. JOURNAL OF APPLIED PHYSICS, 92(5), 2734–2739. https://doi.org/10.1063/1.1497698

Rodriguez, B. J., Gruverman, A., Kingon, A. I., & Nemanich, R. J. (2002, December). Piezoresponse force microscopy for piezoelectric measurements of III-nitride materials. JOURNAL OF CRYSTAL GROWTH, Vol. 246, pp. 252–258. https://doi.org/10.1016/S0022-0248(02)01749-9

Rodriguez, B. J., Gruverman, A., Kingon, A. I., Nemanich, R. J., & Ambacher, O. (2002). Piezoresponse force microscopy for polarity imaging of GaN. APPLIED PHYSICS LETTERS, 80(22), 4166–4168. https://doi.org/10.1063/1.1483117

Gruverman, A., Kholkin, A., Kingon, A., & Tokumoto, H. (2001). Asymmetric nanoscale switching in ferroelectric thin films by scanning force microscopy. APPLIED PHYSICS LETTERS, 78(18), 2751–2753. https://doi.org/10.1063/1.1366644

Gruverman, A., & Tokumoto, H. (2001). On the imaging mechanism of ferroelectric domains in scanning force microscopy. NANO LETTERS, 1(2), 93–95. https://doi.org/10.1021/nl005522r

Gruverman, A., & Tanaka, M. (2001). Polarization retention in SrBi2Ta2O9 thin films investigated at nanoscale. Journal of Applied Physics, 89(3), 1836–1843.

Kholkin, A. L., Gruverman, A., Wu, A., Avdeev, M., Vilarinho, P. M., Salvado, I. M. M., & Baptista, J. L. (2001). Seeding effect on micro- and domain structure of sol-gel-derived PZT thin films. MATERIALS LETTERS, 50(4), 219–224. https://doi.org/10.1016/S0167-577X(01)00228-2

Auciello, O., Gruverman, A., Tokumoto, H., Prakash, S. A., Aggarwal, S., & Ramesh, R. (1998). Nanoscale scanning force imaging of polarization phenomena in ferroelectric thin films. MRS Bulletin, 23(1), 33–42.