Capacitance and conductance characterization of ferrocene-containing self-assembled monolayers on silicon surfaces for memory applications
APPLIED PHYSICS LETTERS, 81(8), 1494–1496.
By: Q. Li, G. Mathur, M. Homsi, S. Surthi, V. Misra , V. Malinovskii, K. Schweikart, L. Yu n ..., J. Lindsey , Z. Liu*, R. Dabke*, A. Yasseri*, D. Bocian* & W. Kuhr*
Sources: Web Of Science, ORCID
Added: August 6, 2018
