Works (26)

2008 journal article

Low energy electron-excited nanoscale luminescence spectroscopy studies of intrinsic defects in HfO2 and SiO2-HfO2-SiO2-Si stacks

Journal of Vacuum Science & Technology. B, Microelectronics and Nanometer Structures, 26(1), 232–243.

By: Y. Strzhemechny, M. Bataiev, S. Tumakha, S. Goss, C. Hinkle, C. Fulton, G. Lucovsky, L. Brillson

Source: NC State University Libraries
Added: August 6, 2018

2007 journal article

Local bonding analysis of the valence and conduction band features of TiO2

Journal of Applied Physics, 102(3).

By: L. Fleming, C. Fulton, G. Lucovsky, J. Rowe, M. Ulrich & J. Luning

Source: NC State University Libraries
Added: August 6, 2018

2007 article

Suppression of Jahn-Teller term-split band edge states in the X-ray absorption spectra of non-crystalline Zr silicates and Si oxynitride alloys, and alloys of ZrO2 with Y2O3 (vol 75, pg 1591, 2006)

Radiation Physics and Chemistry, Vol. 76, p. 907.

By: G. Lucovsky, C. Fulton, B. Ju, N. Stoute, H. Seo, D. Aspnes, J. Luning

Source: NC State University Libraries
Added: August 6, 2018

2006 journal article

Electronic properties of the Zr-ZrO2-SiO2-Si(100) gate stack structure

Journal of Applied Physics, 99(6).

By: C. Fulton, G. Lucovsky & R. Nemanich

Source: NC State University Libraries
Added: August 6, 2018

2006 journal article

Intrinsic nanocrystalline grain-boundary and oxygen atom vacancy defects in ZrO2 and HfO2

Radiation Physics and Chemistry, 75(11), 2097–2101.

By: G. Lucovsky, C. Hinkle, C. Fulton, N. Stoute, H. Seo & J. Luning

Source: NC State University Libraries
Added: August 6, 2018

2006 journal article

Thermal stability of TiO2, ZrO2, or HfO2 on Si(100) by photoelectron emission microscopy

Journal of Applied Physics, 99(2).

By: M. Zeman, C. Fulton, G. Lucovsky, R. Nemanich & W. Yang

Source: NC State University Libraries
Added: August 6, 2018

2006 article

Thermal stability of TiO2, ZrO2, or HfO2 on Si(100) by photoelectron emission microscopy (vol 99, pg 023519, 2006)

Journal of Applied Physics, Vol. 99.

By: M. Zeman, C. Fulton, G. Lucovsky, R. Nemanich & W. Yang

Source: NC State University Libraries
Added: August 6, 2018

2005 journal article

Conduction band states of transition metal (TM) high-k gate dielectrics as determined from X-ray absorption spectra

Microelectronics Reliability, 45(06-May), 827–830.

By: G. Lucovsky, J. Hong, C. Fulton, N. Stoute, Y. Zou, R. Nemanich, D. Aspnes, H. Ade, D. Schlom

Source: NC State University Libraries
Added: August 6, 2018

2005 journal article

Conduction band-edge d-states in high-k dielectrics due to Jahn-Teller term splittings

Thin Solid Films, 486(02-Jan), 129–135.

By: G. Lucovsky, C. Fulton, Y. Zhang, J. Luning, L. Edge, J. Whitten, R. Nemanich, D. Schlom, V. Afanase'v

Source: NC State University Libraries
Added: August 6, 2018

2005 journal article

Conduction band-edge states associated with the removal of d-state degeneracies by the Jahn-Teller effect

IEEE Transactions on Device and Materials Reliability, 5(1), 65–83.

By: G. Lucovsky, C. Fulton, Y. Zhang, Y. Zou, J. Luning, L. Edge, J. Whitten, R. Nemanich ...

Source: NC State University Libraries
Added: August 6, 2018

2005 journal article

Final state effects in VUV and soft X-ray absorption spectra of transition metal oxides and silicate alloys: comparisons between experiment and ab initio calculations

Journal of Electron Spectroscopy and Related Phenomena, 144, 917–919.

Source: NC State University Libraries
Added: August 6, 2018

2005 journal article

Structural, microstructural, and electrical properties of gold films and Schottky contacts on remote plasma-cleaned, n-type ZnO{0001} surfaces

Journal of Applied Physics, 97(10).

Source: NC State University Libraries
Added: August 6, 2018

2005 journal article

Studies of the coupling of final d*-states in mixed Hf and Ti oxides (HfO2)(x)(TiOx)(1-x) and other complex oxides

Journal of Electron Spectroscopy and Related Phenomena, 144, 913–916.

Source: NC State University Libraries
Added: August 6, 2018

2004 journal article

A novel approach for determining the effective tunneling mass of electrons in HfO2 and other high-K alternative gate dielectrics for advanced CMOS devices

Microelectronic Engineering, 72(04-Jan), 257–262.

By: C. Hinkle, C. Fulton, R. Nemanich & G. Lucovsky

Source: NC State University Libraries
Added: August 6, 2018

2004 journal article

Enhanced tunneling in stacked gate dielectrics with ultra-thin HfO2 (ZrO2) layers sandwiched between thicker SiO2 layers

Surface Science, 566(Sep 20 2004), 1185–1189.

By: C. Hinkle, C. Fulton, R. Nemanich & G. Lucovsky

Source: NC State University Libraries
Added: August 6, 2018

2004 journal article

Enhanced tunneling in stacked gate dielectrics with ultra-thin HfO2 layers sandwiched between thicker SiO2 layers

Applied Surface Science, 234(37990), 240–245.

By: C. Hinkle, C. Fulton, R. Nemanich & G. Lucovsky

Source: NC State University Libraries
Added: August 6, 2018

2004 journal article

In situ cleaning and characterization of oxygen- and zinc-terminated, n-type, ZnO{0001} surfaces

Journal of Applied Physics, 95(10), 5856–5864.

By: B. Coppa, C. Fulton, P. Hartlieb, R. Davis, B. Rodriguez, B. Shields, R. Nemanich

Source: NC State University Libraries
Added: August 6, 2018

2004 journal article

Interface instabilities and electronic properties of ZrO2 on silicon (100)

Journal of Applied Physics, 96(5), 2665–2673.

By: C. Fulton, T. Cook, G. Lucovsky & R. Nemanich

Source: NC State University Libraries
Added: August 6, 2018

2004 journal article

Process-dependent band structure changes of transition-metal (Ti,Zr,Hf) oxides on Si (100)

Applied Physics Letters, 84(4), 580–582.

By: C. Fulton, G. Lucovsky & R. Nemanich

Source: NC State University Libraries
Added: August 6, 2018

2004 journal article

Spectroscopic studies of metal high-k dielectrics: transition metal oxides and silicates, and complex rare earth/transition metal oxides

Physica Status Solidi. B, Basic Solid State Physics, 241(10), 2221–2235.

By: G. Lucovsky, J. Hong, C. Fulton, Y. Zou, R. Nemanich, H. Ade, D. Scholm, J. Freeouf

Source: NC State University Libraries
Added: August 6, 2018

2004 journal article

X-ray absorption spectra for transition metal high-kappa dielectrics: Final state differences for intra- and inter-atomic transitions

Journal of Vacuum Science & Technology. B, Microelectronics and Nanometer Structures, 22(4), 2132–2138.

By: G. Lucovsky, J. Hong, C. Fulton, Y. Zou, R. Nemanich & H. Ade

Source: NC State University Libraries
Added: August 6, 2018

2003 journal article

Band offset measurements of the GaN (0001)/HfO2 interface

Journal of Applied Physics, 94(11), 7155–7158.

Source: NC State University Libraries
Added: August 6, 2018

2003 journal article

Band offset measurements of the Si3N4/GaN (0001) interface

Journal of Applied Physics, 94(6), 3949–3954.

Source: NC State University Libraries
Added: August 6, 2018

2003 journal article

Electronic structure of transition metal high-k dielectrics: interfacial band offset energies for microelectronic devices

Applied Surface Science, 212(2003 May 15), 563–569.

By: G. Lucovsky, G. Raynor, Y. Zhang, C. Fulton, R. Nemanich, G. Appel, H. Ade, J. Whitten

Source: NC State University Libraries
Added: August 6, 2018

2003 journal article

Measurement of the band offsets of SiO2 on clean n- and p-type GaN(0001)

Journal of Applied Physics, 93(7), 3995–4004.

Source: NC State University Libraries
Added: August 6, 2018

2002 journal article

Electronic states at the interface of Ti-Si oxide on Si(100)

Journal of Vacuum Science & Technology. B, Microelectronics and Nanometer Structures, 20(4), 1726–1731.

By: C. Fulton, G. Lucovsky & R. Nemanich

Source: NC State University Libraries
Added: August 6, 2018