Harmony A. McLean

Works (2)

Updated: July 5th, 2023 15:59

2004 article

Homoepitaxial growth of (0001)- and -oriented ZnO thin films via metalorganic vapor-phase epitaxy and their characterization

Smith, T. P., McLean, H., Smith, D. J., & Davis, R. F. (2004, April 9). Journal of Crystal Growth.

By: T. Smith n, H. McLean n, D. Smith * & R. Davis n

author keywords: crystal morphology; dislocations; stacking faults; X-ray diffraction; organometallic vapor phase deposition; ZnO
topics (OpenAlex): ZnO doping and properties; Copper-based nanomaterials and applications; Ga2O3 and related materials
Source: Web Of Science
Added: August 6, 2018

2002 article

Application of Nomarski interference contrast microscopy as a thickness monitor in the preparation of transparent, SiC-based, cross-sectional TEM samples

Preble, E. A., McLean, H. A., Kiesel, S. M., Miraglia, P., Albrecht, M., & Davis, R. F. (2002, August 1). Ultramicroscopy.

By: E. Preble n, H. McLean n, S. Kiesel n, P. Miraglia n, M. Albrecht * & R. Davis n

author keywords: Nomarski; transmission electron microscopy; silicon carbide; transparent samples
topics (OpenAlex): Integrated Circuits and Semiconductor Failure Analysis; Advanced Electron Microscopy Techniques and Applications; Electron and X-Ray Spectroscopy Techniques
TL;DR: Reflected light optical microscopy using a Nomarski prism and a differential interference contrast filter have been employed in concert to achieve a technique that provides an accurate color reference for thickness during the dimpling and ion milling of transparent transmission electron microscopy samples of 6H-SiC(000 1) wafers. (via Semantic Scholar)
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Source: Web Of Science
Added: August 6, 2018

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