2004 journal article

Modeling and characterization of atomically sharp "perfect" Ge/SiO2 interfaces

Materials Science & Engineering. B, Solid-State Materials for Advanced Technology, 114-15(Dec 15 2004), 156–161.

By: W. Windl, T. Liang, S. Lopatin & G. Duscher

Source: NC State University Libraries
Added: August 6, 2018

2002 journal article

Z-contrast imaging of dislocation cores at the GaAs/Si interface

Applied Physics Letters, 81(15), 2728–2730.

By: S. Lopatin, S. Pennycook, J. Narayan & G. Duscher

Source: NC State University Libraries
Added: August 6, 2018