2004 journal article
Modeling and characterization of atomically sharp "perfect" Ge/SiO2 interfaces
Materials Science & Engineering. B, Solid-State Materials for Advanced Technology, 114-15(Dec 15 2004), 156–161.
2002 journal article
Z-contrast imaging of dislocation cores at the GaAs/Si interface
APPLIED PHYSICS LETTERS, 81(15), 2728–2730.
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