2004 journal article

Modeling and characterization of atomically sharp "perfect" Ge/SiO2 interfaces

Materials Science & Engineering. B, Solid-State Materials for Advanced Technology, 114-15(Dec 15 2004), 156–161.

By: W. Windl, T. Liang, S. Lopatin & G. Duscher

Source: NC State University Libraries
Added: August 6, 2018

2002 journal article

Z-contrast imaging of dislocation cores at the GaAs/Si interface

APPLIED PHYSICS LETTERS, 81(15), 2728–2730.

By: S. Lopatin n, S. Pennycook*, J. Narayan n & G. Duscher n

UN Sustainable Development Goal Categories
Sources: Web Of Science, ORCID
Added: August 6, 2018

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