Ted E. Cook

Fulton, C. C., Cook, T. E., Lucovsky, G., & Nemanich, R. J. (2004). Interface instabilities and electronic properties of ZrO2 on silicon (100). JOURNAL OF APPLIED PHYSICS, 96(5), 2665–2673. https://doi.org/10.1063/1.1776313

Cook, T. E., Fulton, C. C., Mecouch, W. J., Davis, R. F., Lucovsky, G., & Nemanich, R. J. (2003). Band offset measurements of the GaN (0001)/HfO2 interface. Journal of Applied Physics, 94(11), 7155–7158. https://doi.org/10.1063/1.1618374

Cook, T. E., Fulton, C. C., Mecouch, W. J., Davis, R. F., Lucovsky, G., & Nemanich, R. J. (2003). Band offset measurements of the Si3N4/GaN (0001) interface. JOURNAL OF APPLIED PHYSICS, 94(6), 3949–3954. https://doi.org/10.1063/1.1601314

Cook, T. E., Fulton, C. C., Mecouch, W. J., Tracy, K. M., Davis, R. F., Hurt, E. H., … Nemanich, R. J. (2003). Measurement of the band offsets of SiO2 on clean n- and p-type GaN(0001). JOURNAL OF APPLIED PHYSICS, 93(7), 3995–4004. https://doi.org/10.1063/1.1559424