Improving Behavioral IO Buffer Modeling Based on IBIS
Varma, A. K., Steer, M., & Franzon, P. D. (2008, November 1). IEEE Transactions on Advanced Packaging, Vol. 31, pp. 711–721.
author keywords: Behavioral modeling; gate modulation effect; input output buffer information specification (IBIS); input/output (IO) buffer modeling; simultaneous switching noise (SSN)
topics (OpenAlex): VLSI and Analog Circuit Testing; Electrostatic Discharge in Electronics; Real-time simulation and control systems
TL;DR:
A method is presented for compensating for the missing information in IBIS by complimenting the IBIS model with a black box that is simulator independent, without compromising with the speed that IBIS enjoys over the transistor models.
(via
Semantic Scholar)
Sources: Web Of Science, NC State University Libraries