1998 journal article

Combined MOS/EBIC and TEM study of electrically active defects in SOI wafers

Diffusion and Defect Data. [Pt. B], Solid State Phenomena, 63-4(1998), 61–67.

By: O. Kononchuk, I. Bondarenko & G. Rozgonyi

Source: NC State University Libraries
Added: August 6, 2018

1997 journal article

Gettering of iron in silicon-on-insulator wafers

APPLIED PHYSICS LETTERS, 71(8), 1107–1109.

By: K. Beaman n, A. Agarwal n, O. Kononchuk n, S. Koveshnikov n, I. Bondarenko n & G. Rozgonyi n

Source: Web Of Science
Added: August 6, 2018

1997 journal article

Metallic impurity gettering and secondary defect formation in megaelectron volt self-implanted Czochralski and float-zone silicon

JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 144(8), 2872–2881.

By: R. Brown n, O. Kononchuk n, I. Bondarenko n, A. Romanowski n, Z. Radzimski n, G. Rozgonyi n, F. Gonzalez n

Source: Web Of Science
Added: August 6, 2018

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