Works (3)
1998 journal article
Combined MOS/EBIC and TEM study of electrically active defects in SOI wafers
Diffusion and Defect Data. [Pt. B], Solid State Phenomena, 63-4(1998), 61–67.
1997 article
Gettering of iron in silicon-on-insulator wafers
Beaman, K. L., Agarwal, A., Kononchuk, O., Koveshnikov, S., Bondarenko, I., & Rozgonyi, G. A. (1997, August 25). Applied Physics Letters.
1997 article
Metallic Impurity Gettering and Secondary Defect Formation in Megaelectron Volt Self‐Implanted Czochralski and Float‐Zone Silicon
Brown, R. A., Kononchuk, O., Bondarenko, I., Romanowski, A., Radzimski, Z., Rozgonyi, G. A., & Gonzalez, F. (1997, August 1). Journal of The Electrochemical Society.