1998 journal article

Combined MOS/EBIC and TEM study of electrically active defects in SOI wafers

Diffusion and Defect Data. [Pt. B], Solid State Phenomena, 63-4(1998), 61–67.

By: O. Kononchuk, I. Bondarenko & G. Rozgonyi

Source: NC State University Libraries
Added: August 6, 2018

1997 article

Gettering of iron in silicon-on-insulator wafers

Beaman, K. L., Agarwal, A., Kononchuk, O., Koveshnikov, S., Bondarenko, I., & Rozgonyi, G. A. (1997, August 25). Applied Physics Letters.

By: K. Beaman n, A. Agarwal n, O. Kononchuk n, S. Koveshnikov n, I. Bondarenko n & G. Rozgonyi n

topics (OpenAlex): Silicon and Solar Cell Technologies; Integrated Circuits and Semiconductor Failure Analysis; Advancements in Semiconductor Devices and Circuit Design
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Source: Web Of Science
Added: August 6, 2018

1997 article

Metallic Impurity Gettering and Secondary Defect Formation in Megaelectron Volt Self‐Implanted Czochralski and Float‐Zone Silicon

Brown, R. A., Kononchuk, O., Bondarenko, I., Romanowski, A., Radzimski, Z., Rozgonyi, G. A., & Gonzalez, F. (1997, August 1). Journal of The Electrochemical Society.

topics (OpenAlex): Silicon and Solar Cell Technologies; Integrated Circuits and Semiconductor Failure Analysis; Semiconductor materials and devices
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Source: Web Of Science
Added: August 6, 2018

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