1998 journal article

Combined MOS/EBIC and TEM study of electrically active defects in SOI wafers

Diffusion and Defect Data. [Pt. B], Solid State Phenomena, 63-4(1998), 61–67.

By: O. Kononchuk, I. Bondarenko & G. Rozgonyi

Source: NC State University Libraries
Added: August 6, 2018

1997 journal article

Gettering of iron in silicon on insulator wafers

Applied Physics Letters, 71(8), 1107–1109.

By: K. Beaman, A. Agarwal, O. Kononchuk, S. Koveshnikov, I. Bondarenko & G. Rozgonyi

Source: NC State University Libraries
Added: August 6, 2018

1997 journal article

Metallic impurity gettering and secondary defect formation in megaelectron volt self-implanted Czochralski and float-zone silicon

Journal of the Electrochemical Society, 144(8), 2872–2881.

By: R. Brown, O. Kononchuk, I. Bondarenko, A. Romanowski, Z. Radzimski, G. Rozgonyi, F. Gonzalez

Source: NC State University Libraries
Added: August 6, 2018