Boyan I. Boyanov

Porto, A. O., Boyanov, B. I., Sayers, D. E., & Nemanich, R. J. (1999, May 1). Cobalt suicide formation on 6H silicon carbide. JOURNAL OF SYNCHROTRON RADIATION, Vol. 6, pp. 188–189. https://doi.org/10.1107/S0909049599001326

Newville, M., Boyanov, B. I., & Sayers, D. E. (1999, May 1). Estimation of uncertainties in XAFS data. JOURNAL OF SYNCHROTRON RADIATION, Vol. 6, pp. 264–265. https://doi.org/10.1107/S0909049598018147

Goeller, P. T., Boyanov, B. I., Sayers, D. E., Nemanich, R. J., Myers, A. F., & Steel, E. B. (1999). Germanium segregation in the Co/SiGe/Si(001) thin film system. JOURNAL OF MATERIALS RESEARCH, 14(11), 4372–4384. https://doi.org/10.1557/JMR.1999.0592

Boyanov, B. I., Goeller, P. T., Sayers, D. E., & Nemanich, R. J. (1999). Growth of epitaxial CoSi2 on SiGe(001). JOURNAL OF APPLIED PHYSICS, 86(3), 1355–1362. https://doi.org/10.1063/1.370894

Maillard-Schaller, E., Boyanov, B. I., English, S., & Nemanich, R. J. (1999). Role of the substrate strain in the sheet resistance stability of NiSi deposited on Si (100). JOURNAL OF APPLIED PHYSICS, 85(7), 3614–3618. https://doi.org/10.1063/1.369774

Boyanov, B. I., Goeller, P. T., Sayers, D. E., & Nemanich, R. J. (1999, May 1). The effect of germanium on the Co-SiGe thin-film reaction. JOURNAL OF SYNCHROTRON RADIATION, Vol. 6, pp. 521–523. https://doi.org/10.1107/S0909049599000060

Goeller, P. T., Boyanov, B. I., Sayers, D. E., & Nemanich, R. J. (1998). Co-deposition of cobalt disilicide on silicon-germanium thin films. THIN SOLID FILMS, 320(2), 206–210. https://doi.org/10.1016/S0040-6090(97)00941-3

Boyanov, B. I., Goeller, P. T., Sayers, D. E., & Nemanich, R. J. (1998). Film thickness effects in the Co-Si1-xGex solid phase reaction. JOURNAL OF APPLIED PHYSICS, 84(8), 4285–4291. https://doi.org/10.1063/1.368872

Sayers, D. E., Goeller, P. T., Boyanov, B. I., & Nemanich, R. J. (1998, May 1). In situ studies of metal-semiconductor interactions with synchrotron radiation. JOURNAL OF SYNCHROTRON RADIATION, Vol. 5, pp. 1050–1051. https://doi.org/10.1107/S0909049597015240

Strashilov, V. L., Djordjev, K. D., Boyanov, B. I., & Avramov, I. D. (1997). A coupling-of-modes approach to the analysis of STW devices. IEEE TRANSACTIONS ON ULTRASONICS FERROELECTRICS AND FREQUENCY CONTROL, 44(3), 652–657. https://doi.org/10.1109/58.658322

Boyanov, B. I., Goeller, P. T., Sayers, D. E., & Nemanich, R. J. (1997). Preferential Co-SI bonding at the Co/SiGe(100) interface. Applied Physics Letters, 71(21), 3060–3062. https://doi.org/10.1063/1.119436

Goeller, P. T., Boyanov, B. I., Sayers, D. E., & Nemanich, R. J. (1997, December). Structure and stability of cobalt-silicon-germanium thin films. NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, Vol. 133, pp. 84–89. https://doi.org/10.1016/S0168-583X(97)00458-8