2007 journal article
Analysis of interface states in LaSixOy metal-insulator-semiconductor structures
Japanese Journal of Applied Physics. Part 1, Regular Papers, Short Notes & Review Papers, 46(10A), 6480–6488.
2006 journal article
High-temperature stability of lanthanum silicate gate dielectric MIS devices with Ta and TaN electrodes
Journal of the Electrochemical Society, 153(9), F210–214.
