2007 journal article

Analysis of interface states in LaSixOy metal-insulator-semiconductor structures

Japanese Journal of Applied Physics. Part 1, Regular Papers, Short Notes & Review Papers, 46(10A), 6480–6488.

By: N. Inoue, D. Lichtenwalner, J. Jur & A. Kingon

Source: NC State University Libraries
Added: August 6, 2018

2006 journal article

High-temperature stability of lanthanum silicate gate dielectric MIS devices with Ta and TaN electrodes

Journal of the Electrochemical Society, 153(9), F210–214.

Sources: NC State University Libraries, ORCID
Added: August 6, 2018