Trinity Leigh Biggerstaff

Dang, H., Gudipati, R., Liu, Y., Li, Y., Liu, Y., Peterson, H. L., … Wang, S. (2009). Carbon Clusters as Possible Defects in the SiC-SiO2 Interface. JOURNAL OF COMPUTATIONAL AND THEORETICAL NANOSCIENCE, 6(6), 1305–1310. https://doi.org/10.1166/jctn.2009.1179

Biggerstaff, T. L., Reynolds, C. L., Jr., Zheleva, T., Lelis, A., Habersat, D., Haney, S., … Duscher, G. (2009). Relationship between 4H-SiC/SiO2 transition layer thickness and mobility. APPLIED PHYSICS LETTERS, 95(3). https://doi.org/10.1063/1.3144272

Saripalli, Y. N., Pei, L., Biggerstaff, T., Ramachandran, S., Duscher, G. J., Johnson, M. A. L., … Barlage, D. W. (2007). Transmission electron microscopy studies of regrown GaN Ohmic contacts on patterned substrates for metal oxide semiconductor field effect transistor applications. APPLIED PHYSICS LETTERS, 90(20). https://doi.org/10.1063/1.2741123