2004 journal article
Effect of post-metallization annealing for alternative gate stack devices
Journal of the Electrochemical Society, 151(2), F29–35.
By: I. Kim, S. Han & C. Osburn
Stability of advanced gate stack devices
Journal of the Electrochemical Society, 151(2), F22–28.
2002 journal article
Vertically scaled MOSFET gate stacks and junctions: How far are we likely to go?
IBM Journal of Research and Development, 46(2-3), 299–315.
By: C. Osburn, I. Kim, S. Han, I. De, K. Yee, S. Gannavaram, S. Lee, C. Lee ...and 7 other authors, including 3 NC State authors, Z. Luo, W. Zhu, J. Hauser, D. Kwong, G. Lucovsky, T. Ma, M. Ozturk
2000 journal article
Fabrication and testing of a microstrip particle detector based on highly oriented diamond films
Diamond and Related Materials, 9(3-6), 1008–1012.
By: S. Han, M. McClure, C. Wolden, B. Vlahovic, A. Soldi & S. Sitar
1997 journal article
Highly oriented diamond deposited using a low pressure flat flame
Materials Letters, 32(1), 9–12.
By: C. Wolden, S. Han, M. McClure, Z. Sitar & J. Prater
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