H. Kirk Ono, T., Sasaki, T., Kirk, H., & Rozgonyi, G. A. (2000). Electron beam induced current contrast of oxygen precipitation related defects in Czochralski silicon. Diffusion and Defect Data. [Pt. B], Solid State Phenomena, 78-79(2000), 237–252. Kirk, H. R., Radzimski, Z., Romanowski, A., & Rozgonyi, G. A. (1999). Bias dependent contrast mechanisms in EBIC images of MOS capacitors. JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 146(4), 1529–1535. https://doi.org/10.1149/1.1391799