Works (1)

Updated: April 11th, 2023 10:13

2008 journal article

Analysis of V defects in GaN-based light emitting diodes by scanning transmission electron microscopy and electron beam induced current

Applied Physics Letters, 92(24).

By: C. Progl, C. Parish, J. Vitarelli & P. Russell

Source: NC State University Libraries
Added: August 6, 2018