Christopher Michael Fancher

Implications of gnomonic distortion on electron backscatter diffraction and transmission Kikuchi diffraction

Fancher, C. M., Burch, M. J., Patala, S., & Dickey, E. C. (2022, January 4). JOURNAL OF MICROSCOPY, Vol. 1.

Spatial Signal Detection Using Continuous Shrinkage Priors

TECHNOMETRICS, 61(4), 494–506.

Structure of HfO2 modified with Y, Gd, and Zr at ambient conditions and high pressures

JOURNAL OF APPLIED PHYSICS, 126(20).

The use of Bayesian inference in the characterization of materials and thin films

ACTA CRYSTALLOGRAPHICA A-FOUNDATION AND ADVANCES, Vol. 75, pp. A211–A211.

A Bayesian approach to modeling diffraction profiles and application to ferroelectric materials

Journal of Applied Crystallography, 50, 211–220.

Decoupling of superposed textures in an electrically biased piezoceramic with a 100 preferred orientation

Applied Physics Letters, 110(6).

Electric-field-induced structural changes in multilayer piezoelectric actuators during electrical and mechanical loading

ACTA MATERIALIA, 132, 96–105.

Formation of sodium bismuth titanatebarium titanate during solid-state synthesis

JOURNAL OF THE AMERICAN CERAMIC SOCIETY, 100(4), 1330–1338.

Low temperature dielectric relaxation in ordinary perovskite ferroelectrics: Enlightenment from high-energy x-ray diffraction

Journal of Physics. D, Applied Physics, 50(20).

Mapping 180° polar domains using electron backscatter diffraction and dynamical scattering simulations

Ultramicroscopy, 173, 47–51.

Si doped hafnium oxide-a "fragile" ferroelectric system

Advanced Electronic Materials, 3(10).

The contribution of 180 degrees domain wall motion to dielectric properties quantified from in situ X-ray diffraction

Acta Materialia, 126, 36–43.

Thickness-dependent domain wall reorientation in 70/30 lead magnesium niobate- lead titanate thin films

JOURNAL OF THE AMERICAN CERAMIC SOCIETY, 100(9), 3961–3972.

Anomalous reduction in domain wall displacement at the morphotropic phase boundary of the piezoelectric alloy system PbTiO3-BiScO3

PHYSICAL REVIEW B, 93(10).

Coupled domain wall motion, lattice strain and phase transformation in morphotropic phase boundary composition of PbTiO3-BiScO3 piezoelectric ceramic

Journal of Applied Physics, 120(15).

Domain wall and interphase boundary motion in (1-x)Bi(Mg0.5Ti0.5)O-3-xPbTiO(3) near the morphotropic phase boundary

Journal of Applied Physics, 120(4).

Effect of Mechanical Constraint on Domain Reorientation in Predominantly {111}-Textured Lead Zirconate Titanate Films

JOURNAL OF THE AMERICAN CERAMIC SOCIETY, 99(5), 1802–1807.

In situ X-ray diffraction of lead zirconate titanate piezoMEMS cantilever during actuation

MATERIALS & DESIGN, 111, 429–434.

Single- and Double-Site Substitutions in Mixed-Metal Oxides: Adjusting the Band Edges Toward the Water Redox Couples

Journal of Physical Chemistry C, 120(34), 19175–19188.

Use of Bayesian inference in crystallographic structure refinement via full diffraction profile analysis

Scientific Reports, 6.

Accurate Nanoscale Crystallography in Real-Space Using Scanning Transmission Electron Microscopy

MICROSCOPY AND MICROANALYSIS, 21(4), 946–952.

Breaking of macroscopic centric symmetry in paraelectric phases of ferroelectric materials and implications for flexoelectricity

NATURE MATERIALS, 14(2), 224–229.

Characterization of thick bismuth ferrite-lead titanate films processed by tape casting and templated grain growth

Journal of the European Ceramic Society, 35(16), 4453–4458.

Field induced domain switching as the origin of anomalous lattice strain along non-polar direction in rhombohedral BiScO3-PbTiO3 close to the morphotropic phase boundary

Applied Physics Letters, 107(5).

In situ characterization of polycrystalline ferroelectrics using x-ray and neutron diffraction

[Review of ]. JOURNAL OF MATERIALS RESEARCH, 30(3), 340–356.

In situ measurement of increased ferroelectric/ferroelastic domain wall motion in declamped tetragonal lead zirconate titanate thin films

Journal of Applied Physics, 117(5).

Pressure-induced structures of Si-doped HfO2

Journal of Applied Physics, 117(23).

Processing and crystallographic structure of non-equilibrium Si-doped HfO2

Journal of Applied Physics, 117(24).

Structure of 3 at.% and 9 at.% Si-doped HfO2 from combined refinement of X-ray and neutron diffraction patterns

JOURNAL OF ALLOYS AND COMPOUNDS, 646, 655–661.

Crystal structure of Si-doped HfO2

Journal of Applied Physics, 115(3).

Effect of texture on temperature-dependent properties of K0.5Na0.5NbO3 modified Bi1/2Na1/2TiO3-xBaTiO(3)

Journal of the American Ceramic Society, 97(8), 2557–2563.

Ferroelectric phenomena in Si-doped HfO2 thin films with TiN and Ir electrodes

Journal of Vacuum Science & Technology. B, Microelectronics and Nanometer Structures, 32(3).

Texture analysis of thick bismuth ferrite lead titanate layers

2014 Joint IEEE International Symposium on the Applications of Ferroelectrics, International Workshop on Acoustic Transduction Materials and Devices & Workshop on Piezoresponse Force Microscopy (ISAF/IWATMD/PFM), 166–168.

The effects of layering in ferroelectric Si-doped HfO2 thin films

Applied Physics Letters, 105(7).