Chuanzhen Zhou

Ramesh, S., Davis, J., Roros, A., Zhou, C., He, N., Gao, W., … Genzer, J. (2022, September 9). Nonwoven Membranes with Infrared Light-Controlled Permeability. ACS APPLIED MATERIALS & INTERFACES, Vol. 9. https://doi.org/10.1021/acsami.2c13280

Alcala, R., Richter, C., Materano, M., Lomenzo, P. D., Zhou, C., Jones, J. L., … Schroeder, U. (2021). Influence of oxygen source on the ferroelectric properties of ALD grown Hf1-xZrxO2 films. JOURNAL OF PHYSICS D-APPLIED PHYSICS, 54(3). https://doi.org/10.1088/1361-6463/abbc98

Zhou, C., Stevie, F., & Garcia, R. (2020). Analysis of permethrin treated fabric using ToF-SIMS. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 38(3). https://doi.org/10.1116/1.5141467

Materano, M., Mittmann, T., Lomenzo, P. D., Zhou, C., Jones, J. L., Falkowski, M., … Schroeder, U. (2020). Influence of Oxygen Content on the Structure and Reliability of Ferroelectric HfxZr1-xO2 Layers. ACS APPLIED ELECTRONIC MATERIALS, 2(11), 3618–3626. https://doi.org/10.1021/acsaelm.0c00680

Hany, I., Yang, G., Zhou, C. E., Sun, C., Gundogdu, K., Seyitliyev, D., … al. (2019). Low temperature cathodoluminescence study of Fe-doped β-Ga2O3. Materials Letters, 257, 126744. https://doi.org/10.1016/j.matlet.2019.126744

Zhang, Z., Yang, G., Zhou, C., Chung, C.-C., & Hany, I. (2019). Optical and electrical properties of all-inorganic Cs2AgBiBr6 double perovskite single crystals. RSC ADVANCES, 9(41), 23459–23464. https://doi.org/10.1039/c9ra04045e

Mittmann, T., Materano, M., Lomenzo, P. D., Park, M. H., Stolichnov, I., Cavalieri, M., … Schroeder, U. (2019). Origin of Ferroelectric Phase in Undoped HfO2 Films Deposited by Sputtering. Advanced Materials Interfaces, 6(11), 1900042. https://doi.org/10.1002/admi.201900042

Malur, A., Mohan, A., Barrington, R. A., Leffler, N., Malur, A., Muller-Borer, B., … Thomassen, M. J. (2019). Peroxisome Proliferator-activated Receptor-gamma Deficiency Exacerbates Fibrotic Response to Mycobacteria Peptide in Murine Sarcoidosis Model. AMERICAN JOURNAL OF RESPIRATORY CELL AND MOLECULAR BIOLOGY, 61(2), 198–208. https://doi.org/10.1165/rcmb.2018-0346OC

Zhou, C., Sun, D., Garcia, R., & Stevie, F. A. (2018). Determination of chemical composition in multilayer polymer film using ToF-SIMS. ANALYTICAL METHODS, 10(21), 2444–2449. https://doi.org/10.1039/c8ay00344k

Smith, S. C., Zhou, C., Stevie, F. A., & Garcia, R. (2018). Imaging and quantitative analysis of insecticide in mosquito net fibers using Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS). PLOS ONE, 13(12). https://doi.org/10.1371/journal.pone.0209119

Klump, A., Zhou, C., Stevie, F. A., Collazo, R., & Sitar, Z. (2018). Improvement in detection limit for time-of-flight SIMS analysis of dopants in GaN structures. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 36(3). https://doi.org/10.1116/1.5013001

Schroeder, U., Richter, C., Park, M. H., Schenk, T., Pesic, M., Hoffmann, M., … Mikolajick, T. (2018). Lanthanum-Doped Hafnium Oxide: A Robust Ferroelectric Material. INORGANIC CHEMISTRY, 57(5), 2752–2765. https://doi.org/10.1021/acs.inorgchem.7b03149

Zhou, C., Stevie, F. A., & Smith, S. C. (2018). Quantification of organic materials by ion implantation. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 36(3). https://doi.org/10.1116/1.5011735

Zhou, C., Stevie, F. A., Smith, S. C., Rading, D., & Zakel, J. (2018). ToF-SIMS analysis of ion implanted standard to quantify insecticide in mosquito netting with cesium and argon gas cluster sputtering beams. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 36(3). https://doi.org/10.1116/1.5011751

Park, M. H., Schenk, T., Fancher, C. M., Grimley, E. D., Zhou, C., Richter, C., … Schroeder, U. (2017). A comprehensive study on the structural evolution of HfO2 thin films doped with various dopants. JOURNAL OF MATERIALS CHEMISTRY C, 5(19), 4677–4690. https://doi.org/10.1039/c7tc01200d

Lomenzo, P. D., Chung, C. C., Zhou, C. Z., Jones, J. L., & Nishida, T. (2017). Doped Hf0.5Zr0.5O2 for high efficiency integrated supercapacitors. Applied Physics Letters, 110(23).

Mangum, J. S., Podowitz-Thomas, S., Nikkel, J., Zhou, C., & Jones, J. L. (2017). Investigating Pb diffusion across buried interfaces in Pb(Zr0.2Ti0.8)O-3 thin films via time-of-flight secondary ion mass spectrometry depth profiling. SURFACE AND INTERFACE ANALYSIS, 49(10), 973–977. https://doi.org/10.1002/sia.6255

Richter, C., Schenk, T., Park, M. H., Tscharntke, F. A., Grimley, E. D., LeBeau, J. M., … Schroeder, U. (2017). Si doped hafnium oxide-a "fragile" ferroelectric system. Advanced Electronic Materials, 3(10).

Zhou, C., Beck, K. R., Hinks, D., Crawford, A., & Blake, S. (2016). Advancing the Forensic Analysis of Dyed Fibers by Time-of-Flight Mass Spectrometry. AATCC JOURNAL OF RESEARCH, 3(2), 25–32. https://doi.org/10.14504/ajr.3.2.4

Zhou, C., Stevie, F. A., & Smith, S. C. (2016). Method for quantification of insecticide in mosquito netting using ion implantation and ToF-SIMS analysis. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 34(3). https://doi.org/10.1116/1.4940394

Stevie, F. A., Zhou, C., Hopstaken, M., Saccomanno, M., Zhang, Z., & Turansky, A. (2016). SIMS measurement of hydrogen and deuterium detection limits in silicon: Comparison of different SIMS instrumentation. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 34(3). https://doi.org/10.1116/1.4940151

Scott, J. I., Xue, X., Wang, M., Kline, R. J., Hoffman, B. C., Dougherty, D., … Brendan T. O'Connor. (2016). Significantly Increasing the Ductility of High Performance Polymer Semiconductors through Polymer Blending. ACS APPLIED MATERIALS & INTERFACES, 8(22), 14037–14045. https://doi.org/10.1021/acsami.6b01852

Lomenzo, P. D., Takmeel, Q., Zhou, C. Z., Chung, C. C., Moghaddam, S., Jones, J. L., & Nishida, T. (2015). Mixed Al and Si doping in ferroelectric HfO2 thin films. Applied Physics Letters, 107(24).

Lomenzo, P. D., Takmeel, Q., Zhou, C., Fancher, C. M., Lambers, E., Rudawski, N. G., … Nishida, T. (2015). TaN interface properties and electric field cycling effects on ferroelectric Si-doped HfO2 thin films. Journal of Applied Physics, 117(13), 134105. https://doi.org/10.1063/1.4916715

Stevie, F. A., Garcia, R., Richardson, C., & Zhou, C. (2014, November). Back side SIMS analysis. SURFACE AND INTERFACE ANALYSIS, Vol. 46, pp. 241–243. https://doi.org/10.1002/sia.5470

ChiuHuang, C. K., Zhou, C. Z., & Huang, H. Y. S. (2014). Exploring lithium-ion intensity and distribution via a time-of-flight secondary ion mass spectroscopy. Proceedings of the ASME International Mechanical Engineering Congress and Exposition, 2013, vol 10.

ChiuHuang, C.-K., Zhou, C., & Huang, H.-Y. S. (2014). In-situ imaging of lithium-ion batteries via the secondary ion mass spectrometry. Journal of Nanotechnology in Engineering and Medicine, Vol. 5.

Lomenzo, P. D., Takmeel, Q., Zhou, C. Z., Liu, Y., Fancher, C. M., Jones, J. L., … Nishida, T. (2014). The effects of layering in ferroelectric Si-doped HfO2 thin films. Applied Physics Letters, 105(7).

ChiuHuang, C.-K., Zhou, C., & Huang, H.-Y. S. (2013). Exploring lithium-ion intensity and distribution via a Time-of-Flight Secondary Ion Mass Spectroscopy. ASME 2013 International Mechanical Engineering Congress & Exposition. https://doi.org/10.1115/imece2013-63013

Santeufemio, C., Gorman, B. P., Zhou, C., Giannuzzi, L. A., & Stevie, F. A. (2013). TOF SIMS analyses of stray Ga during FIB milling. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A, 31(6). https://doi.org/10.1116/1.4825403

Zhou, C., Li, M., Garcia, R., Crawford, A., Beck, K., Hinks, D., & Griffis, D. P. (2012). Time-of-Flight-Secondary Ion Mass Spectrometry Method Development for High-Sensitivity Analysis of Acid Dyes in Nylon Fibers. ANALYTICAL CHEMISTRY, 84(22), 10085–10090. https://doi.org/10.1021/ac3025569