Dieter Griffis

Maheshwari, P., Stevie, F. A., Myneni, G. R., Ciovati, G., Rigsbee, J. M., Dhakal, P., & Griffis, D. P. (2014, November). SIMS analysis of high-performance accelerator niobium. SURFACE AND INTERFACE ANALYSIS, Vol. 46, pp. 288–290. https://doi.org/10.1002/sia.5461

Stevie, F. A., Maheshwari, P., Pierce, J. M., Adekore, B. T., & Griffis, D. P. (2013, January). SIMS analysis of zinc oxide LED structures: quantification and analysis issues. SURFACE AND INTERFACE ANALYSIS, Vol. 45, pp. 352–355. https://doi.org/10.1002/sia.4919

Penley, C., Stevie, F. A., & Griffis, D. P. (2012). Quantification of cesium surface contamination on silicon resulting from SIMS analysis. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 30(3). https://doi.org/10.1116/1.3698400

Zhou, C., Li, M., Garcia, R., Crawford, A., Beck, K., Hinks, D., & Griffis, D. P. (2012). Time-of-Flight-Secondary Ion Mass Spectrometry Method Development for High-Sensitivity Analysis of Acid Dyes in Nylon Fibers. ANALYTICAL CHEMISTRY, 84(22), 10085–10090. https://doi.org/10.1021/ac3025569

Maheshwari, P., Stevie, F. A., Myeneni, G., Ciovati, G., Rigsbee, J. M., & Griffis, D. P. (2011). Analysis of Interstitial Elements in Niobium with Secondary Ion Mass Spectrometry (SIMS). INTERNATIONAL SYMPOSIUM ON THE SUPERCONDUCTING SCIENCE & TECHNOLOGY OF INGOT NIOBIUM, Vol. 1352, pp. 151-+. https://doi.org/10.1063/1.3579233

Zhou, C., Li, Q., Chiang, V. L., Lucia, L. A., & Griffis, D. P. (2011). Chemical and Spatial Differentiation of Syringyl and Guaiacyl Lignins in Poplar Wood via Time-of-Flight Secondary Ion Mass Spectrometry. ANALYTICAL CHEMISTRY, 83(18), 7020–7026. https://doi.org/10.1021/ac200903y

Maheshwari, P., Tian, H., Reece, C. E., Kelley, M. J., Myneni, G. R., Stevie, F. A., … Griffis, D. P. (2011). Surface analysis of Nb materials for SRF cavities. SURFACE AND INTERFACE ANALYSIS, Vol. 43, pp. 151–153. https://doi.org/10.1002/sia.3513

Wong, K. C., Haslauer, C. M., Anantharamaiah, N., Pourdeyhimi, B., Batchelor, A. D., & Griffis, D. P. (2010). Focused Ion Beam Characterization of Bicomponent Polymer Fibers. MICROSCOPY AND MICROANALYSIS, 16(3), 282–290. https://doi.org/10.1017/s1431927610000115

Ciovati, G., Myneni, G., Stevie, F., Maheshwari, P., & Griffis, D. (2010). High field Q slope and the baking effect: Review of recent experimental results and new data on Nb heat treatments. PHYSICAL REVIEW SPECIAL TOPICS-ACCELERATORS AND BEAMS, 13(2). https://doi.org/10.1103/physrevstab.13.022002

Penley, C., Stevie, F. A., Griffis, D. P., Siebel, S., Kulig, L., & Lee, J. (2010). Secondary ion mass spectrometry characterization of anomalous behavior for low dose ion implanted phosphorus in silicon. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 28(3), 511–516. https://doi.org/10.1116/1.3406141

Zhu, Z. M., Stevie, F. A., & Griffis, D. P. (2008). Model study of electron beam charge compensation for positive secondary ion mass spectrometry using a positive primary ion beam. Applied Surface Science, 254(9), 2708–2711. https://doi.org/10.1016/j.apsusc.2007.10.008

Stevie, F. A., & Griffis, D. P. (2008). Quantification in dynamic SIMS: Current status and future needs. APPLIED SURFACE SCIENCE, 255(4), 1364–1367. https://doi.org/10.1016/j.apsusc.2008.05.041

Zhu, Z., Gu, C., Stevie, F. A., & Griffis, D. P. (2007). Improved understanding of an electron beam charge compensation method for magnetic sector secondary ion mass spectrometer analysis of insulators. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A, 25(4), 769–774. https://doi.org/10.1116/1.2746044

Harton, S. E., Zhu, Z., Stevie, F. A., Griffis, D. P., & Ade, H. (2007). Mass fractionation of carbon and hydrogen secondary ions upon Cs+ and O-2(+) bombardment of organic materials. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A, 25(3), 480–484. https://doi.org/10.1116/1.2718957

A.D. Garetto, R. R. G., A.D. Batchelor, C. L. P., Griffis, D. P., P.E., & Russell. (2007). Transferable Internal Reservoir Device for Electron and Ion Beam Induced Chemistry. Microscopy and Analysis, 86, 5–6.

Gu, C., Stevie, F. A., Bennett, J., Garcia, R., & GriffiS, D. P. (2006, July 30). Back side SIMS analysis of hafnium silicate. APPLIED SURFACE SCIENCE, Vol. 252, pp. 7179–7181. https://doi.org/10.1016/j.apsusc.2006.02.099

Harton, S. E., Stevie, F. A., Griffis, D. P., & Ade, H. (2006, July 30). SIMS depth profiling of deuterium labeled polymers in polymer multilayers. APPLIED SURFACE SCIENCE, Vol. 252, pp. 7224–7227. https://doi.org/10.1016/j.apsusc.2006.02.146

Gu, C. J., Stevie, F. A., Hitzman, C. J., Saripalli, Y. N., Johnson, M., & Griffis, D. P. (2006, July 30). SIMS quantification of matrix and impurity species in AlxGa1-xN. APPLIED SURFACE SCIENCE, Vol. 252, pp. 7228–7231. https://doi.org/10.1016/j.apsusc.2006.02.148

Sivasubramani, P., Lee, T. H., Kim, M. J., Kim, J., Gnade, B. E., Wallace, R. M., … Griffis, D. P. (2006). Thermal stability of lanthanum scandate dielectrics on Si(100). APPLIED PHYSICS LETTERS, 89(24). https://doi.org/10.1063/1.2405418

Mosselveld, F., Makarov, VV, Lundquist, T. R., Griffis, D. P., & Russell, P. E. (2004, June). Circuit editing of copper and low-k dielectrics in nanotechnology devices. JOURNAL OF MICROSCOPY, Vol. 214, pp. 246–251. https://doi.org/10.1111/j.0022-2720.2004.01337.x

Pivovarov, A. L., Stevie, F. A., & Griffis, D. P. (2004, June 15). Improved charge neutralization method for depth profiling of bulk insulators using O-2(+) primary beam on a magnetic sector SIMS instrument. APPLIED SURFACE SCIENCE, Vol. 231, pp. 786–790. https://doi.org/10.1016/j.apsusc.2004.03.070

Kachan, M., Hunter, J., Kouzminov, D., Pivovarov, A., Gu, J., Stevie, F., & Griffis, D. (2004, June 15). O-2(+) versus Cs+ for high depth resolution depth profiling of III-V nitride-based semiconductor devices. APPLIED SURFACE SCIENCE, Vol. 231, pp. 684–687. https://doi.org/10.1016/j.apsusc.2004.03.211

Gu, C., Pivovarov, A., Garcia, R., Stevie, F., Griffis, D., Moran, J., … Richards, J. F. (2004). Secondary ion mass spectrometry backside analysis of barrier layers for copper diffusion. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, Vol. 22, pp. 350–354. https://doi.org/10.1116/1.1617278

Gu, C., Garcia, R., Pivovarov, A., Stevie, F., & Griffis, D. (2004, June 15). Site-specific SIMS backside analysis. APPLIED SURFACE SCIENCE, Vol. 231, pp. 663–667. https://doi.org/10.1016/j.apsusc.2004.03.140

Pivovarov, A., Gu, C., Stevie, F., & Griffis, D. (2004, June 15). Utilization of electron impact ionization of gaseous and sputtered species in the secondary ion acceleration region of a magnetic sector SIMS instrument. APPLIED SURFACE SCIENCE, Vol. 231, pp. 781–785. https://doi.org/10.1016/j.apsusc.2004.03.069

Russell, P. E., Griffis, D. P., & Gonzales Perez, J. C. (2003). Chemically enhanced focused ion beam micro-machining of copper. Washington, DC: U.S. Patent and Trademark Office.

Wang, J. H., Griffis, D. P., Garcia, R., & Russell, P. E. (2003). Etching characteristics of chromium thin films by an electron beam induced surface reaction. SEMICONDUCTOR SCIENCE AND TECHNOLOGY, 18(4), 199–205. https://doi.org/10.1088/0268-1242/18/4/302

Pivovarov, A. L., Stevie, F. A., Griffis, D. P., & Guryanov, G. M. (2003). Optimization of secondary ion mass spectrometry detection limit for N in SiC. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A, 21(5), 1649–1654. https://doi.org/10.1116/1.1595108

Loesing, R., Guryanov, G. M., Phillips, M. S., & Griffis, D. P. (2002). Comparison of secondary ion mass spectroscopy analysis of ultrashallow phosphorus using Cs+, O-2(+), and CsC6- primary ion beams. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, Vol. 20, pp. 507–511. https://doi.org/10.1116/1.1450588

Gonzalez, J. C., Silva, M. I. N., Griffis, D. P., & Russell, P. E. (2002). Improvements in focused ion beam micromachining of interconnect materials. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, Vol. 20, pp. 2700–2704. https://doi.org/10.1116/1.1515310

Gonzalez, J. C., Griffis, D. P., Miau, T. T., & Russell, P. E. (2001). Chemically enhanced focused ion beam micromachining of copper. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, Vol. 19, pp. 2539–2542. https://doi.org/10.1116/1.1418406

Phillips, JR, Griffis, D. P., & Russell, P. E. (2000). Channeling effects during focused-ion-beam micromachining of copper. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, Vol. 18, pp. 1061–1065. https://doi.org/10.1116/1.582300

Russell, P. E., Griffis, D. P., Shedd, G. M., Stark, T. J., & Vitarelli, J. (2000). Method for water vapor enhanced charged-particle-beam machining. Washington, DC: U.S. Patent and Trademark Office.

Hunter, J. L., Bates, T. B., Patel, S. B., Loesing, R., Guraynov, G., & Griffis, D. P. (2000). Optimization of SIMS analysis conditions for ultra-shallow phosphorus and arsenic implants. In D. B. Williams & R. Shimizu (Eds.), Microbeam Analysis 2000: proceedings of the Second Conference of the International Union of Microbeam Analysis Societies held in Kailua-Kona, Hawaii, 9-14 July 2000 (Vol. 165, pp. 327–328). Bristol: Institute of Physics Publishing.

Loesing, R., Guryanov, G. M., Hunter, J. L., & Griffis, D. P. (2000). Secondary ion mass spectrometry depth profiling of ultrashallow phosphorous in silicon. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, Vol. 18, pp. 509–513. https://doi.org/10.1116/1.591222

Russell, P. E., Griffis, D. P., Shedd, G. M., Stark, T. J., & Vitarelli, J. (1999). Method for water vapor enhanced charged-particle-beam machining. Washington, DC: U.S. Patent and Trademark Office.

Bremser, M. D., Perry, W. G., Nam, O. H., Griffis, D. P., Loesing, R., Ricks, D. A., & Davis, R. F. (1998, April). Acceptor and donor doping of AlxGa1-xN thin film alloys grown on 6H-SiC(0001) substrates via metalorganic vapor phase epitaxy. JOURNAL OF ELECTRONIC MATERIALS, Vol. 27, pp. 229–232. https://doi.org/10.1007/s11664-998-0392-9

Russell, P. E., Stark, T. J., Griffis, D. P., Phillips, JR, & Jarausch, K. F. (1998). Chemically and geometrically enhanced focused ion beam micromachining. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, Vol. 16, pp. 2494–2498. https://doi.org/10.1116/1.590197