@article{denis-rotella_esteves_walker_zhou_jones_trolier-mckinstry_2021, title={Residual Stress and Ferroelastic Domain Reorientation in Declamped {001} Pb(Zr0.3Ti0.7)O-3 Films}, volume={68}, ISSN={["1525-8955"]}, url={http://dx.doi.org/10.1109/tuffc.2020.2987438}, DOI={10.1109/TUFFC.2020.2987438}, abstractNote={Ferroelectric films are often constrained by their substrates and subject to scaling effects, including suppressed dielectric permittivity. In this work, the thickness dependence of intrinsic and extrinsic contributions to the dielectric properties was elucidated. A novel approach to quantitatively deconstruct the relative permittivity into three contributions (intrinsic, reversible extrinsic, and irreversible extrinsic) was developed using a combination of X-ray diffraction (XRD) and Rayleigh analysis. <italic>In situ</italic> synchrotron XRD was used to understand the influence of residual stress and substrate clamping on the domain state, ferroelastic domain reorientation, and electric field-induced strain. For tetragonal {001} textured Pb<sub>0.99</sub>(Zr<sub>0.3</sub>Ti<sub>0.7</sub>)<sub>0.98</sub>Nb<sub>0.02</sub>O<sub>3</sub> thin films clamped to an Si substrate, a thickness-dependent in-plane tensile stress developed during processing, which dictates the domain distribution over a thickness range of 0.27–<inline-formula> <tex-math notation="LaTeX">$1.11~\mu \text{m}$ </tex-math></inline-formula>. However, after the films were partially declamped from the substrate and annealed, the residual stress was alleviated. As a result, the thickness dependence of the volume fraction of <inline-formula> <tex-math notation="LaTeX">${c}$ </tex-math></inline-formula>-domains largely disappeared, and the out-of-plane lattice spacings (<inline-formula> <tex-math notation="LaTeX">${d}$ </tex-math></inline-formula>) for both <inline-formula> <tex-math notation="LaTeX">${a}$ </tex-math></inline-formula>- and <inline-formula> <tex-math notation="LaTeX">${c}$ </tex-math></inline-formula>-domains increased. The volume fraction of <inline-formula> <tex-math notation="LaTeX">${c}$ </tex-math></inline-formula>-domains was used to calculate the intrinsic relative permittivity. The reversible Rayleigh coefficient was then used to separate the intrinsic and reversible extrinsic contributions. The reversible extrinsic response accounted for ~50% of the overall relative permittivity (measured at 50 Hz and alternating current (ac) field of <inline-formula> <tex-math notation="LaTeX">$0.5\cdot {E}_{c}$ </tex-math></inline-formula>) and was thickness dependent even after poling and upon release.}, number={2}, journal={IEEE TRANSACTIONS ON ULTRASONICS FERROELECTRICS AND FREQUENCY CONTROL}, publisher={Institute of Electrical and Electronics Engineers (IEEE)}, author={Denis-Rotella, Lyndsey M. and Esteves, Giovanni and Walker, Julian and Zhou, Hanhan and Jones, Jacob L. and Trolier-McKinstry, Susan}, year={2021}, month={Feb}, pages={259–272} }
 @article{jhuang_fuentes_jones_esteves_fancher_furman_reich_2019, title={Spatial Signal Detection Using Continuous Shrinkage Priors}, volume={61}, ISSN={["1537-2723"]}, url={http://dx.doi.org/10.1080/00401706.2018.1546622}, DOI={10.1080/00401706.2018.1546622}, abstractNote={Abstract Motivated by the problem of detecting changes in two-dimensional X-ray diffraction data, we propose a Bayesian spatial model for sparse signal detection in image data. Our model places considerable mass near zero and has heavy tails to reflect the prior belief that the image signal is zero for most pixels and large for an important subset. We show that the spatial prior places mass on nearby locations simultaneously being zero, and also allows for nearby locations to simultaneously be large signals. The form of the prior also facilitates efficient computing for large images. We conduct a simulation study to evaluate the properties of the proposed prior and show that it outperforms other spatial models. We apply our method in the analysis of X-ray diffraction data from a two-dimensional area detector to detect changes in the pattern when the material is exposed to an electric field.}, number={4}, journal={TECHNOMETRICS}, publisher={Informa UK Limited}, author={Jhuang, An-Ting and Fuentes, Montserrat and Jones, Jacob L. and Esteves, Giovanni and Fancher, Chris M. and Furman, Marschall and Reich, Brian J.}, year={2019}, month={Oct}, pages={494–506} }
 @article{iamsasri_guerrier_esteves_fancher_wilson_smith_paisley_johnson-wilke_ihlefeld_bassiri-gharb_et al._2017, title={A Bayesian approach to modeling diffraction profiles and application to ferroelectric materials}, volume={50}, journal={Journal of Applied Crystallography}, author={Iamsasri, T. and Guerrier, J. and Esteves, G. and Fancher, C. M. and Wilson, A. G. and Smith, R. C. and Paisley, E. A. and Johnson-Wilke, R. and Ihlefeld, J. F. and Bassiri-Gharb, N. and et al.}, year={2017}, pages={211–220} }
 @article{keech_ye_bosse_esteves_guerrier_jones_kuroda_huey_trolier-mckinstry_2017, title={Declamped Piezoelectric Coefficients in patterned 70/30 lead magnesium niobate-lead titanate thin films}, volume={27}, number={9}, journal={Advanced Functional Materials}, author={Keech, R. and Ye, L. H. and Bosse, J. L. and Esteves, G. and Guerrier, J. and Jones, J. L. and Kuroda, M. A. and Huey, B. D. and Trolier-McKinstry, S.}, year={2017} }
 @article{esteves_fancher_roehrig_maier_jones_deluca_2017, title={Electric-field-induced structural changes in multilayer piezoelectric actuators during electrical and mechanical loading}, volume={132}, ISSN={["1873-2453"]}, url={http://dx.doi.org/10.1016/j.actamat.2017.04.014}, DOI={10.1016/j.actamat.2017.04.014}, abstractNote={The effects of electrical and mechanical loading on the behavior of domains and phases in Multilayer Piezoelectric Actuators (MAs) is studied using in situ high-energy X-ray diffraction (XRD) and macroscopic property measurements. Rietveld refinement is carried out on measured diffraction patterns using a two-phase tetragonal (P4mm) and rhombohedral (R3m) model. Applying an electric field promotes the rhombohedral phase, while increasing compressive uniaxial pre-stress prior to electric field application favors the tetragonal phase. The competition between electrical and mechanical energy leads to a maximal difference between electric-field-induced phase fractions at 70 MPa pre-stress. Additionally, the available volume fraction of non-180° domain reorientation that can be accessed during electric field application increases with compressive pre-stress up to 70 MPa. The origin for enhanced strain and polarization with applied pre-stress is attributed to a combination of enhanced non-180° domain reorientation and electric-field-induced phase transitions. The suppression of both the electric-field-induced phase transitions and domain reorientation at high pre-stresses (>70 MPa) is attributed to a large mechanical energy barrier, and alludes to the competition of the electrical and mechanical energy within the MA during applied stimuli.}, journal={ACTA MATERIALIA}, publisher={Elsevier BV}, author={Esteves, Giovanni and Fancher, Chris M. and Roehrig, Soeren and Maier, Guenther A. and Jones, Jacob L. and Deluca, Marco}, year={2017}, month={Jun}, pages={96–105} }
 @article{otonicar_park_logar_esteves_jones_jancar_2017, title={External-field-induced crystal structure and domain texture in (1-x) Na0.5Bi0.5TiO3-xK(0.5)Bi(0.5)TiO(3) piezoceramics}, volume={127}, ISSN={["1873-2453"]}, url={http://dx.doi.org/10.1016/j.actamat.2017.01.052}, DOI={10.1016/j.actamat.2017.01.052}, abstractNote={Lead-free perovskites based on Na0.5Bi0.5TiO3 (NBT) are being considered as viable alternatives to lead-containing piezoelectric materials. The piezoelectric response of morphotropic compositions of these bismuth-based piezoelectrics during the application of external stimuli are governed by an intrinsic local disorder, ferroelectric and antiferrodistortive instabilities, and domain texturing. Understanding the coupling between these mechanisms is of crucial importance for the development of new, environmentally friendly, piezoelectric materials. In this investigation we applied in-situ transmission electron microscopy and high-energy X-ray diffraction to study the changes in the crystal structure and domain texturing during the application of mechanical stresses and electric fields to the morphotropic composition of (1-x)Na0.5Bi0.5TiO3–xK0.5Bi0.5TiO3 (NBT-KBT) piezoceramics. It was found that the mechanisms involved largely depend on the materials' initial structural state and that phase transitions and domain texturing dominate the polarization- and strain-driven processes.}, journal={ACTA MATERIALIA}, publisher={Elsevier BV}, author={Otonicar, M. and Park, J. and Logar, M. and Esteves, G. and Jones, J. L. and Jancar, B.}, year={2017}, month={Apr}, pages={319–331} }
 @article{ochoa_levit_fancher_esteves_jones_garcia_2017, title={Low temperature dielectric relaxation in ordinary perovskite ferroelectrics: Enlightenment from high-energy x-ray diffraction}, volume={50}, number={20}, journal={Journal of Physics. D, Applied Physics}, author={Ochoa, D. A. and Levit, R. and Fancher, C. M. and Esteves, G. and Jones, J. L. and Garcia, J. E.}, year={2017} }
 @article{fancher_brewer_chung_rohrig_rojac_esteves_deluca_bassiri-gharb_jones_2017, title={The contribution of 180 degrees domain wall motion to dielectric properties quantified from in situ X-ray diffraction}, volume={126}, journal={Acta Materialia}, author={Fancher, C. M. and Brewer, S. and Chung, C. C. and Rohrig, S. and Rojac, T. and Esteves, G. and Deluca, M. and Bassiri-Gharb, N. and Jones, J. L.}, year={2017}, pages={36–43} }
 @article{keech_morandi_wallace_esteves_denis_guerrier_johnson-wilke_fancher_jones_trolier-mckinstry_2017, title={Thickness-dependent domain wall reorientation in 70/30 lead magnesium niobate- lead titanate thin films}, volume={100}, ISSN={["1551-2916"]}, url={http://dx.doi.org/10.1111/jace.14927}, DOI={10.1111/jace.14927}, abstractNote={AbstractContinued reduction in length scales associated with many ferroelectric film‐based technologies is contingent on retaining the functional properties as the film thickness is reduced. Epitaxial and polycrystalline lead magnesium niobate‐lead titanate (70PMN‐30PT) thin films were studied over the thickness range of 100‐350 nm for the relative contributions to property thickness dependence from interfacial and grain‐boundary low permittivity layers. Epitaxial PMN‐PT films were grown on SrRuO3/(001)SrTiO3, while polycrystalline films with {001}‐Lotgering factors >0.96 were grown on Pt/TiO2/SiO2/Si substrates via chemical solution deposition. Both film types exhibited similar relative permittivities of ~300 at high fields at all measured thicknesses with highly crystalline electrode/dielectric interfaces. These results, with the DC‐biased and temperature‐dependent dielectric characterization, suggest irreversible domain wall mobility is the major contributor to the overall dielectric response and its thickness dependence. In epitaxial films, the irreversible Rayleigh coefficients reduced 85% upon decreasing thickness from 350 to 100 nm. The temperature at which a peak in the relative permittivity is observed was the only measured small signal quantity which was more thickness‐dependent in polycrystalline than epitaxial films. This is attributed to the relaxor nature present in the films, potentially stabilized by defect concentrations, and/or chemical inhomogeneity. Finally, the effective interfacial layers are found to contribute to the measured thickness dependence in the longitudinal piezoelectric coefficient.}, number={9}, journal={JOURNAL OF THE AMERICAN CERAMIC SOCIETY}, publisher={Wiley}, author={Keech, Ryan and Morandi, Carl and Wallace, Margeaux and Esteves, Giovanni and Denis, Lyndsey and Guerrier, Jonathon and Johnson-Wilke, Raegan L. and Fancher, Chris M. and Jones, Jacob L. and Trolier-McKinstry, Susan}, year={2017}, month={Sep}, pages={3961–3972} }
 @article{iamsasri_esteves_choe_vogt_prasertpalichat_cann_gorfman_jones_2017, title={Time and frequency-dependence of the electric field-induced phase transition in BaTiO3-BiZn1/2Ti1/2O3}, volume={122}, number={6}, journal={Journal of Applied Physics}, author={Iamsasri, T. and Esteves, G. and Choe, H. and Vogt, M. and Prasertpalichat, S. and Cann, D. P. and Gorfman, S. and Jones, J. L.}, year={2017} }
 @article{esteves_wallace_johnson-wilke_fancher_wilke_trolier-mckinstry_jones_2016, title={Effect of Mechanical Constraint on Domain Reorientation in Predominantly {111}-Textured Lead Zirconate Titanate Films}, volume={99}, ISSN={["1551-2916"]}, url={http://dx.doi.org/10.1111/jace.14159}, DOI={10.1111/jace.14159}, abstractNote={Ferroelectric/ferroelastic domain reorientation was measured in 2.0 μm thick tetragonal {111}‐textured PbZr0.30Ti0.70O3 thin films using synchrotron X‐ray diffraction (XRD). Lattice strain from the peak shift in the 111 Bragg reflection and domain reorientation were quantified as a function of applied electric field amplitude. Domain reorientation was quantified through the intensity exchange between the 112 and 211 Bragg reflections. Results from three different film types are reported: dense films that are clamped to the substrate (as‐processed), dense films that are partially released from the substrate, and films with 3% volume porosity. The highest amount of domain reorientation is observed in grains that are misoriented with respect to the {111} preferred (domain engineered) orientation. Relative to the clamped films, films that were released from the substrate or had porosity exhibited neither significant enhancement in domain reorientation nor in 111 lattice strain. In contrast, similar experiments on {100}‐textured and randomly oriented films showed significant enhancement in domain reorientation in released and porous films. Therefore, {111}‐textured films are less susceptible to changes in properties due to mechanical constraints because there is overall less domain reorientation in {111} films than in {100} films.}, number={5}, journal={JOURNAL OF THE AMERICAN CERAMIC SOCIETY}, publisher={Wiley}, author={Esteves, Giovanni and Wallace, Margeaux and Johnson-Wilke, Raegan and Fancher, Chris M. and Wilke, Rudeger H. T. and Trolier-McKinstry, Susan and Jones, Jacob L.}, editor={Brennecka, G. L.Editor}, year={2016}, month={May}, pages={1802–1807} }
 @article{ochoa_esteves_iamsasri_rubio-marcos_fernandez_garcia_jones_2016, title={Extensive domain wall contribution to strain in a (K,Na)NbO3-based lead-free piezoceramics quantified from high energy X-ray diffraction}, volume={36}, ISSN={["1873-619X"]}, url={http://dx.doi.org/10.1016/j.jeurceramsoc.2016.03.022}, DOI={10.1016/j.jeurceramsoc.2016.03.022}, abstractNote={The origins of high piezoelectric properties in the lead-free (K,Na)NbO3-based tetragonal composition (K0.44Na0.52Li0.04)(Nb0.86Ta0.10Sb0.04)O3 (KNL-NTS) is investigated by quantifying the intrinsic and extrinsic contributions from high energy X-ray diffraction measurements. The applied methodology, which allows discerning between the intrinsic contribution, related to the field induced lattice distortion, and the extrinsic contributions, related to non-180° domain wall motion, is widely described in this work. The non-180° domain reorientation of the KNL-NTS piezoceramic is quantify from the integrated intensities of the 002 and 200 reflections obtained from line profile, while the shifts in peak position versus the applied electric field is used to obtain the lattice strain contribution. Large non-180° domain wall contribution to the electric field induced macroscopic strain (∼80% of the macroscopic strain) is verified in KNL-NTS.}, number={10}, journal={JOURNAL OF THE EUROPEAN CERAMIC SOCIETY}, publisher={Elsevier BV}, author={Ochoa, Diego A. and Esteves, Giovanni and Iamsasri, Thanakorn and Rubio-Marcos, Fernando and Fernandez, Jose F. and Garcia, Jose E. and Jones, Jacob L.}, year={2016}, month={Aug}, pages={2489–2494} }
 @article{ochoa_esteves_jones_rubio-marcos_fernandez_garcia_2016, title={Extrinsic response enhancement at the polymorphic phase boundary in piezoelectric materials}, volume={108}, number={14}, journal={Applied Physics Letters}, author={Ochoa, D. A. and Esteves, G. and Jones, J. L. and Rubio-Marcos, F. and Fernandez, J. F. and Garcia, J. E.}, year={2016} }
 @article{esteves_fancher_wallace_johnson-wilke_wilke_trolier-mckinstry_polcawichc_jones_2016, title={In situ X-ray diffraction of lead zirconate titanate piezoMEMS cantilever during actuation}, volume={111}, ISSN={["1873-4197"]}, url={http://dx.doi.org/10.1016/j.matdes.2016.09.011}, DOI={10.1016/j.matdes.2016.09.011}, abstractNote={Synchrotron X-ray diffraction (XRD) was used to probe the electric-field-induced response of a 500 nm lead zirconate titanate (52/48, Zr/Ti) (PZT) based piezoelectric microelectromechanical system (piezoMEMS) device. 90° ferroelectric/ferroelastic domain reorientation was observed in a cantilever comprised of a 500 nm thick PZT film on a 3 μm thick elastic layer composite of SiO2 and Si3N4. Diffraction data from sectors both parallel- and perpendicular-to-field showed the presence of ferroelastic texture, which is typically seen in in situ electric field diffraction studies of bulk tetragonal perovskite ferroelectrics. The fraction of domains reoriented into the field direction was quantified through the intensity changes of the 002 and 200 diffraction profiles. The maximum induced volume fraction calculated from the results was 20%, which is comparable to values seen in previous bulk and thin film ferroelectric diffraction studies. The novelty of the present work is that a fully released ferroelectric thin film device of micron scale dimensions (down to 60,000 μm3) was interrogated in situ with an applied electric field using synchrotron XRD. Furthermore, the experiment demonstrates that 90° ferroelectric/ferroelastic domain reorientation can be characterized in samples of such small dimensions.}, journal={MATERIALS & DESIGN}, publisher={Elsevier BV}, author={Esteves, Giovanni and Fancher, Chris M. and Wallace, Margeaux and Johnson-Wilke, Raegan and Wilke, Rudeger H. T. and Trolier-McKinstry, Susan and Polcawichc, Ronald G. and Jones, Jacob L.}, year={2016}, month={Dec}, pages={429–434} }
 @article{johnson-wilke_wilke_wallace_rajashekhar_esteves_merritt_jones_trolier-mckinstry_2015, title={Ferroelectric/Ferroelastic Domain Wall Motion in Dense and Porous Tetragonal Lead Zirconate Titanate Films}, volume={62}, ISSN={["1525-8955"]}, url={http://dx.doi.org/10.1109/tuffc.2014.006562}, DOI={10.1109/tuffc.2014.006562}, abstractNote={Direct evidence of ferroelectric/ferroelastic domain reorientation is shown in Pb(Zr0.30Ti0.70)O3 (PZT30/70) thin films clamped to a rigid silicon substrate using in situ synchrotron X-ray diffraction during application of electric fields. Both dense films and films with 3 to 4 vol% porosity were measured. On application of electric fields exceeding the coercive field, it is shown that the porous films exhibit a greater volume fraction of ferroelastic domain reorientation (approximately 12 vol% of domains reorient at 3 times the coercive field, Ec) relative to the dense films (~3.5 vol% at 3Ec). Furthermore, the volume fraction of domain reorientation significantly exceeded that predicted by linear mixing rules. The high response of domain reorientation in porous films is discussed in the context of two mechanisms: local enhancement of the electric field near the pores and a reduction of substrate clamping resulting from the lowering of the film stiffness as a result of the porosity. Similar measurements during weak-field (subcoercive) amplitudes showed 0.6% volume fraction of domains reoriented for the porous films, which demonstrates that extrinsic effects contribute to the dielectric and piezoelectric properties.}, number={1}, journal={IEEE TRANSACTIONS ON ULTRASONICS FERROELECTRICS AND FREQUENCY CONTROL}, publisher={Institute of Electrical and Electronics Engineers (IEEE)}, author={Johnson-Wilke, Raegan L. and Wilke, Rudeger H. T. and Wallace, Margeaux and Rajashekhar, Adarsh and Esteves, Giovanni and Merritt, Zachary and Jones, Jacob L. and Trolier-McKinstry, Susan}, year={2015}, month={Jan}, pages={46–55} }
 @article{wallace_johnson-wilke_esteves_fancher_wilke_jones_trolier-mckinstry_2015, title={In situ measurement of increased ferroelectric/ferroelastic domain wall motion in declamped tetragonal lead zirconate titanate thin films}, volume={117}, number={5}, journal={Journal of Applied Physics}, author={Wallace, M. and Johnson-Wilke, R. L. and Esteves, G. and Fancher, C. M. and Wilke, R. H. T. and Jones, J. L. and Trolier-McKinstry, S.}, year={2015} }
 @article{hou_fancher_zhao_esteves_jones_2015, title={Processing and crystallographic structure of non-equilibrium Si-doped HfO2}, volume={117}, number={24}, journal={Journal of Applied Physics}, author={Hou, D. and Fancher, C. M. and Zhao, L. L. and Esteves, G. and Jones, J. L.}, year={2015} }
 @article{ursic_bencan_drazic_esteves_jones_usher_rojac_drnovsek_deluca_jouin_et al._2015, title={Unusual structural-disorder stability of mechanochemically derived-Pb(Sc0.5Nb0.5)O-3}, volume={3}, ISSN={["2050-7534"]}, url={http://dx.doi.org/10.1039/c5tc02205c}, DOI={10.1039/c5tc02205c}, abstractNote={This study demonstrates the important effect of processing on the B-site ordering in Pb(Sc0.5Nb0.5)O3ceramics.}, number={39}, journal={JOURNAL OF MATERIALS CHEMISTRY C}, publisher={Royal Society of Chemistry (RSC)}, author={Ursic, Hana and Bencan, Andreja and Drazic, Goran and Esteves, Giovanni and Jones, Jacob L. and Usher, Tedi-Marie and Rojac, Tadej and Drnovsek, Silvo and Deluca, Marco and Jouin, Jenny and et al.}, year={2015}, pages={10309–10315} }
 @misc{esteves_fancher_jones_2015, title={In situ characterization of polycrystalline ferroelectrics using x-ray and neutron diffraction}, volume={30}, ISSN={["2044-5326"]}, url={http://dx.doi.org/10.1557/jmr.2014.302}, DOI={10.1557/jmr.2014.302}, abstractNote={Abstract}, number={3}, journal={JOURNAL OF MATERIALS RESEARCH}, publisher={Cambridge University Press (CUP)}, author={Esteves, Giovanni and Fancher, Chris M. and Jones, Jacob L.}, year={2015}, month={Feb}, pages={340–356} }