Works (11)

2000 journal article

Ensemble Monte Carlo study of channel quantization in a 25-nm n-MOSFET

IEEE Transactions on Electron Devices, 47(10), 1864–1872.

By: S. Williams, K. Kim & W. Holton

author keywords: MOSFETs; simulation; quantization
Sources: Web Of Science, Crossref
Added: August 6, 2018

2000 journal article

NMR quantum computation with indirectly coupled gates

Physical Review A, 62(2).

Sources: Web Of Science, Crossref
Added: August 6, 2018

2000 chapter

Overview of semiconductor devices

In Y. Nishi & R. Doering (Eds.), Handbook of semiconductor manufacturing technology. New York: Marcel Dekker.

By: W. Holten, J. Hauser, K. Kim & W. Lynch

Ed(s): . Y. Nishi & R. Doering

Source: NC State University Libraries
Added: August 6, 2018

2000 journal article

Scalable solid-state quantum computer based on quantum dot pillar structures

Physical Review B, 61(11), 7526–7535.

By: G. Sanders n, K. Kim & W. Holton

Sources: Web Of Science, Crossref
Added: August 6, 2018

1999 journal article

Analysis of hot-electron reliability and device performance in 80-nm double-gate SOI n-MOSFET's

IEEE Transactions on Electron Devices, 46(8), 1760–1767.

By: S. Williams, K. Kim, M. Littlejohn & W. Holton

Sources: Web Of Science, Crossref
Added: August 6, 2018

1999 journal article

Optically driven quantum-dot quantum computer

Physical Review A, 60(5), 4146–4149.

By: G. Sanders n, K. Kim & W. Holton

Sources: Web Of Science, Crossref
Added: August 6, 2018

1999 journal article

Quantum computing with complex instruction sets

Physical Review A, 59(2), 1098–1101.

By: G. Sanders n, K. Kim & W. Holton

Sources: Web Of Science, Crossref
Added: August 6, 2018

1998 journal article

A new device design methodology for manufacturability

IEEE Transactions on Electron Devices, 45(3), 634–642.

By: J. Lu, W. Holton, J. Fenner, S. Williams, K. Kim, A. Hartford, D. Chen, K. Roze, M. Littlejohn

Sources: Web Of Science, Crossref
Added: August 6, 2018

1998 journal article

Deutsch-Jozsa algorithm as a test of quantum computation

Physical Review A, 58(3), R1633–R1636.

By: D. Collins n, K. Kim & W. Holton

Sources: Web Of Science, Crossref
Added: August 6, 2018

1998 journal article

Scaling trends for device performance and reliability in channel-engineered n-MOSFETs

IEEE Transactions on Electron Devices, 45(1), 254–260.

By: S. Williams n, R. Hulfachor, K. Kim, M. Littlejohn & W. Holton

Sources: Web Of Science, Crossref
Added: August 6, 2018

1998 journal article

Temperature dependence of impact ionization coefficients in p-Si

Journal of Applied Physics, 83(9), 4988–4990.

By: K. Roze, N. Bannov, K. Kim, W. Holton & M. Littlejohn

Sources: Web Of Science, Crossref
Added: August 6, 2018