Works (10)

2012 conference paper

Many-electron multiplet theory applied to O-vacancies in (i) nanocrystalline HfO2 and (ii) nn-crystalline SiO2 and Si oxynitride alloys

Vibronic interactions and the jahn-teller effect: theory and applications, 23, 193–211.

By: G. Lucovsky, L. Miotti & K. Bastos

Source: NC State University Libraries
Added: August 6, 2018

2012 journal article

O-vacancies in (i) nano-crystalline HfO2 and (i) non-crystalline SiO2 and Si3N4 studied by X-ray absorption spectroscopy

Journal of Nanoscience and Nanotechnology, 12(6), 4811–4819.

By: G. Lucovsky, L. Miotti & K. Bastos

Source: NC State University Libraries
Added: August 6, 2018

2012 journal article

Spectroscopic detection of hopping induced mixed valence for Ti and Sc in GdSc1-xTixO3 for x > 0.165

Spectroscopic detection of hopping induced mixed valence for Ti and Sc in GdSc1-xTixO3 for x > 0.165. Journal of Nanoscience and Nanotechnology, 12(6), 4749–4756.

By: G. Lucovsky, L. Miotti, K. Bastos, C. Adamo & D. Schlom

Source: NC State University Libraries
Added: August 6, 2018

2012 conference paper

Spectroscopic detection of hopping induced mixed valence of Ti and Sc in GdSc1-xTixO3 for x greater than percolation threshold of 0.16

Vibronic interactions and the jahn-teller effect: theory and applications, 23, 361–376.

By: G. Lucovsky, L. Miotti & K. Bastos

Source: NC State University Libraries
Added: August 6, 2018

2011 journal article

Intermixing between HfO2 and GeO2 films deposited on Ge(001) and Si(001): Role of the substrate

Applied Physics Letters, 98(13).

By: G. Soares, C. Krug, L. Miotti, K. Bastos, G. Lucovsky, I. Baumvol, C. Radtke

Source: NC State University Libraries
Added: August 6, 2018

2011 journal article

Many-electron multiplet theory applied to o-atom vacancies in high-k dielectrics

Japanese Journal of Applied Physics. Part 1, Regular Papers, Short Notes & Review Papers, 50(4).

By: G. Lucovsky, L. Miotti & K. Bastos

Source: NC State University Libraries
Added: August 6, 2018

2011 journal article

O-vacancies in (i) nanocrystalline HfO2 and (i) noncrystalline SiO2 and Si3N4 studied by x-ray absorption spectroscopy

Journal of Vacuum Science & Technology. B, Microelectronics and Nanometer Structures, 29(1).

By: G. Lucovsky, L. Miotti & K. Bastos

Source: NC State University Libraries
Added: August 6, 2018

2010 conference paper

Ge doped HfO2 thin films investigated by x-ray absorption spectroscopy

Journal of Vacuum Science & Technology. A, Vacuum, Surfaces, and Films, 28(4), 693–696.

By: L. Miotti, K. Bastos, G. Lucovsky, C. Radtke & D. Nordlund

Source: NC State University Libraries
Added: August 6, 2018

2010 conference paper

Monoclinic textured HfO2 films on GeOxNy/Ge(100) stacks using interface reconstruction by controlled thermal processing

Journal of Vacuum Science & Technology. A, Vacuum, Surfaces, and Films, 28(4), 662–664.

By: K. Bastos, L. Miotti, G. Lucovsky, K. Chung & D. Nordlund

Source: NC State University Libraries
Added: August 6, 2018

2009 conference paper

Comparisons between intrinsic bonding defects in d(0) transition metal oxide such as HfO2, and impurity atom defects in d(0) complex oxides such as GdScO3

Solid-state Electronics, 53(12), 1273–1279.

By: G. Lucovsky, K. Chung, L. Miotti, K. Bastos, C. Amado & D. Schlom

Source: NC State University Libraries
Added: August 6, 2018